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BSI BS IEC 62047-35:2019

Current Revision

Semiconductor devices. Micro-electromechanical devices. Test method of electrical characteristics under bending deformation for flexible electromechanical devices.

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Electrical characteristics under bending deformation for flexible electromechanical devices.

SDO BSI: British Standards Institution
Document Number BS IEC 62047-35
Publication Date April 20, 2021
Language en - English
Page Count 24
Revision Level
Supercedes
Committee
Publish Date Document Id Type View
April 20, 2021 BS IEC 62047-35:2019 Revision