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BSI BS IEC 62047-29:2017

Current Revision

Semiconductor devices. Micro-electromechanical devices. Electromechanical relaxation test method for freestanding conductive thin-films under room temperature

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Electromechanical relaxation test method for freestanding conductive thin-films under room temperature

SDO BSI: British Standards Institution
Document Number BS IEC 62047-29
Publication Date March 15, 2018
Language en - English
Page Count 14
Revision Level
Supercedes
Committee
Publish Date Document Id Type View
March 15, 2018 BS IEC 62047-29:2017 Revision