Logo

BSI BS IEC 62047-27:2017

Current Revision

Semiconductor devices. Micro-electromechanical devices

$169.00

$169.00

$304.20


Sub Total (1 Item(s))

$ 0.00

Estimated Shipping

$ 0.00

Total (Pre-Tax)

$ 0.00


Stay effortlessly up-to-date with the latest standard revisions. When new versions are released, they're automatically charged and delivered to you, ensuring seamless compliance.

Document Preview Not Available...

Bond strength test for glass frit bonded structures using micro-chevron-tests (MCT).

SDO BSI: British Standards Institution
Document Number BS IEC 62047-27
Publication Date July 22, 2020
Language en - English
Page Count 20
Revision Level
Supercedes
Committee
Publish Date Document Id Type View
July 22, 2020 BS IEC 62047-27:2017 Revision