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BSI BS EN IEC 63364-1:2022

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Semiconductor devices. Semiconductor devices for IoT system.Test method of sound variation detection.

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Semiconductor devices. Semiconductor devices for IoT system.Test method of sound variation detection.

SDO BSI: British Standards Institution
Document Number BS EN IEC 63364
Publication Date Feb. 2, 2023
Language en - English
Page Count 18
Revision Level
Supercedes
Committee
Publish Date Document Id Type View
Feb. 2, 2023 BS EN IEC 63364-1:2022 Revision