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BSI BS EN IEC 60749-28:2022

Current Revision

Semiconductor devices. Mechanical and climatic test methods. Electrostatic discharge (ESD) sensitivity testing. Charged device model (CDM). device level.

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Electrostatic discharge (ESD) sensitivity testing. Charged device model (CDM). device level.

SDO BSI: British Standards Institution
Document Number BS EN IEC 60749
Publication Date Sept. 6, 2022
Language en - English
Page Count 54
Revision Level
Supercedes
Committee
Publish Date Document Id Type View
Sept. 6, 2022 BS EN IEC 60749-28:2022 Revision