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BSI BS EN IEC 60749-15:2020

Current Revision

Semiconductor devices. Mechanical and climatic test methods. Resistance to soldering temperature for through-hole mounted devices.

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Resistance to soldering temperature for through-hole mounted devices.

SDO BSI: British Standards Institution
Document Number BS EN IEC 60749
Publication Date Oct. 1, 2020
Language en - English
Page Count 16
Revision Level
Supercedes
Committee
Publish Date Document Id Type View
Oct. 1, 2020 BS EN IEC 60749-15:2020 Revision