Logo

BSI BS EN 62374:2007

Current Revision

Semiconductor devices. Time dependent dielectric breakdown (TDDB) test for gate dielectric films

$309.40

$309.40

$556.92


Sub Total (1 Item(s))

$ 0.00

Estimated Shipping

$ 0.00

Total (Pre-Tax)

$ 0.00


Document Preview Not Available...

DIELECTRIC FILMS

SDO BSI: British Standards Institution
Document Number BS EN 62374
Publication Date Oct. 31, 2008
Language en - English
Page Count 24
Revision Level
Supercedes
Committee
Publish Date Document Id Type View
Oct. 31, 2008 BS EN 62374:2007 Revision