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BSI BS EN 60749-38:2008

Current Revision

Semiconductor devices. Mechanical and climatic test methods. Soft error test method for semiconductor devices with memory

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SEMICONDUCTOR DEVICES WITH MEMORY

SDO BSI: British Standards Institution
Document Number BS EN 60749-38
Publication Date June 30, 2008
Language en - English
Page Count 16
Revision Level
Supercedes
Committee
Publish Date Document Id Type View
June 30, 2008 BS EN 60749-38:2008 Revision