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BSI BS EN 60749-28:2017

Current Revision

Semiconductor devices. Mechanical and climatic test methods. Electrostatic discharge (ESD) sensitivity testing. Charged device model (CDM). Device level

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Semiconductor devices. Mechanical and climatic test methods. Electrostatic discharge (ESD) sensitivity testing. Charged device model (CDM). Device level

SDO BSI: British Standards Institution
Document Number BS EN 60749-28
Publication Date July 10, 2017
Language en - English
Page Count 48
Revision Level
Supercedes
Committee
Publish Date Document Id Type View
July 10, 2017 BS EN 60749-28:2017 Revision