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BSI BS EN 60749-20:2009

Current Revision

Semiconductor devices. Mechanical and climatic test methods. Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat

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Semiconductor devices. Mechanical and climatic test methods. Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat

SDO BSI: British Standards Institution
Document Number BS EN 60749-20
Publication Date Jan. 31, 2010
Language en - English
Page Count 32
Revision Level
Supercedes
Committee
Publish Date Document Id Type View
Jan. 31, 2010 BS EN 60749-20:2009 Revision
July 7, 2003 BS EN 60749-20:2003 Revision