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BSI BS EN 60749-15:2010

Current Revision

Semiconductor devices. Mechanical and climatic test methods. Resistance to soldering temperature for through-hole mounted devices

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Semiconductor devices. Mechanical and climatic test methods. Resistance to soldering temperature for through-hole mounted devices

SDO BSI: British Standards Institution
Document Number BS EN 60749-15
Publication Date Feb. 28, 2011
Language en - English
Page Count 10
Revision Level
Supercedes
Committee
Publish Date Document Id Type View
Feb. 28, 2011 BS EN 60749-15:2010 Revision
June 19, 2003 BS EN 60749-15:2003 Revision