BSI |
BS EN 60512-4-2 |
Connectors for electronic equipment. Tests and measurements. Voltage stress tests. Test 4b. Partial discharge |
|
IEC |
IEC 60512-4-2 |
Connectors for electronic equipment - Tests and measurements - Part 4-2: Voltage stress tests - Test 4b: Partial discharge |
|
JIS |
JIS C 5402-4-2 |
Connectors for electronic equipment -- Tests and measurements -- Part 4-2: Voltage stress tests -- Test 4b: Partial discharge |
|
IEC |
IEC 60512-4-1 |
Connectors for electronic equipment - Tests and measurements - Part 4-1: Voltage stress tests - Test 4a: Voltage proof |
|
BSI |
BS EN 60512-4-1 |
Connectors for electronic equipment. Tests and measurements. Voltage stress tests. Test 4a. Voltage proof |
|
JIS |
JIS C 5402-6-3 |
Connectors for electronic equipment -- Tests and measurements -- Part 6-3: Dynamic stress tests -- Test 6c: Shock |
|
IEC |
IEC 60512-6-3 |
Connectors for electronic equipment - Tests and measurements - Part 6-3: Dynamic stress tests - Test 6c: Shock |
|
IEC |
IEC 60512-6-2 |
Connectors for electronic equipment - Tests and measurements - Part 6-2: Dynamic stress tests - Test 6b: Bump |
|
JIS |
JIS C 5402-6-2 |
Connectors for electronic equipment -- Tests and measurements -- Part 6-2: Dynamic stress tests -- Test 6b: Bump |
|
BSI |
BS EN 60512-6-2 |
Connectors for electronic equipment. Tests and measurements. Dynamic stress tests. Test 6b. Bump |
|
BSI |
BS EN 60512-6-3 |
Connectors for electronic equipment. Tests and measurements. Dynamic stress tests. Test 6c. Shock |
|
JIS |
JIS C 5402-4-3 |
Connectors for electronic equipment -- Tests and measurements -- Part 4-3: Voltage stress tests -- Test 4c: Voltage proof of pre-insulated crimp barrels |
|
IEC |
IEC 60512-4-3 |
Connectors for electronic equipment - Tests and measurements - Part 4-3: Voltage stress tests - Test 4c: Voltage proof of pre-insulated crimp barrels |
|
JIS |
JIS C 5402-6-4 |
Connectors for electronic equipment -- Tests and measurements -- Part 6-4: Dynamic stress tests -- Test 6d: Vibration (sinusoidal) |
|
IEC |
IEC 60512-6-4 |
Connectors for electronic equipment - Tests and measurements - Part 6-4: Dynamic stress tests - Test 6d: Vibration (sinusoidal) |
|
BSI |
BS EN 60512-4-3 |
Connectors for electronic equipment. Tests and measurements. Voltage stress tests. Test 4c. Voltage proof of pre-insulated crimp barrels |
|
BSI |
BS EN 60512-14-5 |
Connectors for electronic equipment. Tests and measurements. Sealing tests |
|
BSI |
BS EN 60512-14-4 |
Connectors for electronic equipment. Tests and measurements. Sealing tests |
|
BSI |
BS EN 60512-14-6 |
Connectors for electronic equipment. Tests and measurements. Sealing tests |
|
BSI |
BS EN 60512-14-2 |
Connectors for electronic equipment. Tests and measurements. Sealing tests |
|
BSI |
BS EN 60512-12-3 |
Connectors for electronic equipment. Tests and measurements. Soldering tests |
|
BSI |
BS EN 60512-12-1 |
Connectors for electronic equipment. Tests and measurements. Soldering tests |
|
BSI |
BS EN 60512-6-4 |
Connectors for electronic equipment. Tests and measurements. Dynamic stress tests. Test 6d. Vibration (sinusoidal) |
|
IEC |
IEC 60512-8-2 |
Connectors for electronic equipment - Tests and measurements - Part 8-2: Static load tests (fixed connectors) - Test 8b: Static load, axial |
|
IEC |
IEC 60512-25-5 |
Connectors for electronic equipment - Tests and measurements - Part 25-5: Test 25e - Return loss |
|
IEC |
IEC 60512-11-10 |
Connectors for electronic equipment - Tests and measurements - Part 11-10: Climatic tests - Test 11j: Cold |
|
JIS |
JIS C 5402-11-10 |
Connectors for electronic equipment -- Tests and measurements -- Part 11-10: Climatic tests -- Test 11j: Cold |
|
IEC |
IEC 60512-6-1 |
Connectors for electronic equipment - Tests and measurements - Part 6-1: Dynamic stress tests - Test 6a: Acceleration, steady state |
|
JIS |
JIS C 5402-6-1 |
Connectors for electronic equipment -- Tests and measurements -- Part 6-1: Dynamic stress tests -- Test 6a: Acceleration, steady state |
|
BSI |
BS EN 60512-2-5 |
Connectors for electronic equipment. Tests and measurements. Test 2e. Contact disturbance |
|
IEC |
IEC 60512-22-1 |
Connectors for electronic equipment - Tests and measurements - Part 22-1: Capacitance tests - Test 22a: Capacitance |
|
IEC |
IEC 60512-25-4 |
Connectors for electronic equipment - Tests and measurements - Part 25-4: Test 25d - Propagation delay |
|
IEC |
IEC 60512-14-6 |
Connectors for electronic equipment - Tests and measurements - Part 14-6: Sealing tests - Test 14f: Interfacial sealing |
|
IEC |
IEC 60512-14-2 |
Connectors for electronic equipment - Tests and measurements - Part 14-2: Sealing tests - Test 14b: Sealing - Fine air leakage |
|
BSI |
BS EN 60512-8-2 |
Connectors for electronic equipment. Tests and measurements. Static load tests (fixed connectors). Test 8b. Static load, axial |
|
IEC |
IEC 60512-11-11 |
Connectors for electronic equipment - Tests and measurements - Part 11-11: Climatic tests - Test 11k: Low air pressure |
|
JIS |
JIS C 5402-11-11 |
Connectors for electronic equipment -- Tests and measurements -- Part 11-11: Climatic tests -- Test 11k: Low air pressure |
|
IEC |
IEC 60512-21-1 |
Connectors for electronic equipment - Tests and measurements - Part 21-1: RF resistance tests - Test 21a: RF shunt resistance |
|
BSI |
BS EN 60512-25-5 |
Connectors for electronic equipment. Tests and measurements. Test 25e. Return loss |
|
JIS |
JIS C 5402-11-9 |
Connectors for electronic equipment -- Tests and measurements -- Part 11-9: Climatic tests -- Test 11i: Dry heat |
|
IEC |
IEC 60512-11-9 |
Connectors for electronic equipment - Tests and measurements - Part 11-9: Climatic tests - Test 11i: Dry heat |
|
IEC |
IEC 60512-11-1 |
Connectors for electrical and electronic equipment - Tests and measurements - Part 11-1: Climatic tests - Test 11a - Climatic sequence |
|
BSI |
BS EN 60512-7-2 |
Connectors for electronic equipment. Tests and measurements. Impact tests (free connectors). Test 7b. Mechanical strength impact |
|
BSI |
BS EN 60512-6-1 |
Connectors for electronic equipment. Tests and measurements. Dynamic stress tests. Test 6a. Acceleration, steady state |
|
BSI |
BS EN 60512-11-10 |
Connectors for electronic equipment. Tests and measurements. Climatic tests. Test 11j. Cold |
|
BSI |
BS EN 60512-25-6 |
Connectors for electronic equipment. Tests and measurements. Test 25f. Eye pattern and jitter |
|
IEC |
IEC 60512-25-6 |
Connectors for electronic equipment - Tests and measurements - Part 25-6: Test 25f: Eye pattern and jitter |
|
BSI |
BS EN 60512-22-1 |
Connectors for electronic equipment. Tests and measurements. Capacitance tests. Test 22a. Capacitance |
|
BSI |
BS EN 60512-10-4 |
Connectors for electronic equipment. Tests and measurements. Test 10d. Electrical overload (connectors) |
|
IEC |
IEC 60512-25-1 |
Connectors for electronic equipment - Tests and measurements - Part 25-1: Test 25a - Crosstalk ratio |
|
IEC |
IEC 60512-1 |
Connectors for electrical and electronic equipment - Tests and measurements - Part 1: Generic specification |
|
IEC |
IEC 60512-7-2 |
Connectors for electronic equipment - Tests and measurements - Part 7-2: Impact tests (free components) - Test 7b: Mechanical strength impact |
|
BSI |
BS EN 60512-23-4 |
Connectors for electronic equipment. Tests and measurements. Screening and filtering tests |
|
BSI |
BS EN 60512-21-1 |
Connectors for electronic equipment. Tests and measurements. R.F. resistance tests. Test 21a. R.F. shunt resistance |
|
BSI |
BS EN 60512-11-11 |
Connectors for electronic equipment. Tests and measurements. Climatic tests. Test 11k. Low air pressure |
|
IEC |
IEC 60512-1-1 |
Connectors for electronic equipment - Tests and measurements - Part 1-1: General examination - Test 1a: Visual examination |
|
IEC |
IEC 60512-25-2 |
Connectors for electronic equipment - Tests and measurements - Part 25-2: Test 25b - Attenuation (insertion loss) |
|
JIS |
JIS C 5402-1-1 |
Connectors for electronic equipment -- Tests and measurements -- Part 1-1: General examination -- Test 1a: Visual examination |
|
BSI |
BS EN 60512-11-9 |
Connectors for electronic equipment. Tests and measurements. Climatic tests. Test 11i. Dry heat |
|
BSI |
BS EN 60512-25-4 |
Connectors for electronic equipment. Test and measurements. Test 25d. Propagation delay |
|
IEC |
IEC 60512-25-3 |
Connectors for electronic equipment - Tests and measurements - Part 25-3: Test 25c - Rise time degradation |
|
JIS |
JIS C 5402-3-1 |
Connectors for electronic equipment -- Tests and measurements -- Part 3-1: Insulation tests -- Test 3a: Insulation resistance |
|
IEC |
IEC 60512-11-12 |
Connectors for electronic equipment - Tests and measurements - Part 11-12: Climatic tests - Test 11m: Damp heat, cyclic |
|
IEC |
IEC 60512-3-1 |
Connectors for electronic equipment - Tests and measurements - Part 3-1: Insulation tests - Test 3a: Insulation resistance |
|
JIS |
JIS C 5402-11-12 |
Connectors for electronic equipment -- Tests and measurements -- Part 11-12: Climatic tests -- Test 11m: Damp heat, cyclic |
|
IEC |
IEC 60512-17-1 |
Connectors for electronic equipment - Tests and measurements - Part 17-1: Cable clamping tests - Test 17a: Cable clamp robustness |
|
IEC |
IEC 60512-11-5 |
Connectors for electronic equipment - Tests and measurements - Part 11-5: Climatic tests - Test 11e: Mould growth |
|
JIS |
JIS C 5402-11-5 |
Connectors for electronic equipment -- Tests and measurements -- Part 11-5: Climatic tests -- Test 11e: Mould growth |
|
IEC |
IEC 60512-8-1 |
Connectors for electronic equipment - Tests and measurements - Part 8-1: Static load tests (fixed connectors) - Test 8a: Static load, transverse |
|
JIS |
JIS C 5402-11-3 |
Connectors for electronic equipment -- Tests and measurements -- Part 11-3: Climatic tests -- Test 11c: Damp heat, steady state |
|
IEC |
IEC 60512-11-3 |
Connectors for electronic equipment - Tests and measurements - Part 11-3: Climatic tests - Test 11c: Damp heat, steady state |
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