BSI |
BS EN 140203 |
Harmonized system of quality assessment for electronic components. Blank detail specification: fixed power resistors (Assessment level H) |
|
BSI |
BS EN 140201 |
Harmonized system of quality assessment for electronic components. Blank detail specification: fixed power resistors (Assessment level S) |
|
BSI |
BS EN 140202 |
Harmonized system of quality assessment for electronic components. Blank detail specification: fixed power resistors (Assessment level M) |
|
BSI |
BS CECC 40302 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: fixed precision resistors (Assessment level F) |
|
BSI |
BS QC 400202 |
Specification for harmonized system of quality assessment for electronic components. Fixed resistors for use in electronic equipment. Blank detail specification. Fixed power resistors. Assessment level F |
|
BSI |
BS QC 400201 |
Specification for harmonized system of quality assessment for electronic components. Fixed resistors for use in electronic equipment. Blank detail specification: fixed power resistors. Assessment level E |
|
BSI |
BS EN 140103 |
Harmonized system of quality assessment for electronic components. Blank detail specification. Fixed low power non-wirewound resistors (Assessment level P) |
|
BSI |
BS EN 140102 |
Harmonized system of quality assessment for electronic components. Blank detail specification: fixed low power non-wirewound resistors (assessment level M) |
|
BSI |
BS CECC 40301 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Fixed precision resistors |
|
BSI |
BS EN 140211 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: fixed power resistors. Capability approval |
|
BSI |
BS EN 140104 |
Harmonized system of quality assessment for electronic components. Blank detail specification: fixed low power non-wirewound resistors (Assessment levels SB and SC) |
|
BSI |
BS QC 400302 |
Specification for harmonized system of quality assessment for electronic components. Fixed resistors for use in electronic equipment. Blank detail specification. Fixed precision resistors. Assessment level F |
|
BSI |
BS 9940-03.01 |
Harmonized system of quality assessment for electronic components. Fixed resistors for use in electronic equipment. Blank detail specification: fixed precision resistors. Assessment level E |
|
BSI |
BS CECC 41201 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: power potentiometers (assessment level S) |
|
BSI |
BS CECC 41202 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: power potentiometers (assessment level M) |
|
BSI |
BS QC 400102 |
Specification for harmonized system of quality assessment for electronic components. Fixed resistors for use in electronic equipment. Blank detail specification. Fixed low-power non-wirewound resistors. Assessment level F |
|
BSI |
BS 9940-01.01 |
Harmonized system of quality assessment for electronic components. Fixed resistors for use in electronic equipment. Blank detail specification: fixed low power non-wirewound resistors. Assessment level E |
|
BSI |
BS EN 140200 |
Harmonized system of quality assessment for electronic components. Sectional specification: fixed power resistors |
|
BSI |
BS CECC 41101 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: preset potentiometers (assessment level S) |
|
BSI |
BS EN 140402 |
Harmonized system of quality assessment for electronic components. Blank detail specification: fixed low power wire wound surface mounting (SMD) resistors |
|
BSI |
BS CECC 41102 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: preset potentiometers (assessment level M) |
|
BSI |
BS CECC 40000 |
Harmonized system of quality assessment for electronic components. Generic specification: fixed resistors |
|
BSI |
BS EN 140000 |
Harmonized system of quality assessment for electronic components. Generic specification: fixed resistors |
|
BSI |
BS EN 150011 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: case-rated thyristors |
|
BSI |
BS CECC 45004 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: disc seal power tubes |
|
BSI |
BS EN 180101 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: fixed fibre optic attenuators |
|
BSI |
BS EN 150010 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: ambient rated thyristors |
|
BSI |
BS CECC 42201 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Surge suppression varistors |
|
BSI |
BS EN 147101 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: relay sockets of assessed quality |
|
BSI |
BS QC 400200 |
Harmonized system of quality assessment for electronic components. Fixed resistors for use in electronic equipment. Sectional specification: fixed power resistors |
|
BSI |
BS CECC 40300 |
Harmonized system of quality assessment for electronic components: sectional specification: fixed precision resistors |
|
BSI |
BS EN 140210 |
Harmonized system of quality assessment for electronic components. Sectional specification: fixed power resistors. Capability approval |
|
BSI |
BS CECC 41301 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: low power single turn rotary potentiometers (assessment level S) |
|
BSI |
BS CECC 41302 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: low power single turn rotary potentiometers (assessment level M) |
|
BSI |
BS EN 113001 |
Harmonized system of quality assessment for electronic components. Blank detail specification: camera tubes |
|
BSI |
BS EN 196403 |
Harmonized systems of quality assessment for electronic components. Blank detail specification: push button switches. Assessment level Y |
|
BSI |
BS EN 140400 |
Harmonized system of quality assessment for electronic components. Sectional specification. Fixed low power surface mount (SMD) resistors |
|
BSI |
BS EN 169201 |
Harmonized System of Quality Assessment for Electronic Components. Blank Detail Specif |
|
BSI |
BS EN 138101 |
Harmonized System of Quality Assessment for Electronic Components. Blank Detail Specif |
|
BSI |
BS 166101 |
Harmonized System of Quality Assessment for Electronic Components. Blank Detail Specif |
|
BSI |
BS EN 167101 |
Harmonized System of Quality Assessment for Electronic Components. Blank Detail Specif |
|
BSI |
BS EN 130301 |
Harmonized System of Quality Assessment for Electronic Components, Blank Detail Specif |
|
BSI |
BS EN 133221 |
Harmonized System of Quality Assessment for Electronic Components. Blank Detail Specif |
|
BSI |
BS EN 111001 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: cathode ray tubes |
|
BSI |
BS EN 196103 |
Harmonized System of Quality Assessment for Electronic Components - Blank Detail Speci |
|
BSI |
BS CECC 50009 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: case-rated rectifier diodes |
|
BSI |
BS EN 150009 |
Harmonized system of quality assessment for electronic components. Blank detail specification: case-rated rectifier diodes |
|
BSI |
BS EN 111101 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Display storage tubes |
|
BSI |
BS EN 150008 |
Harmonized system of quality assessment for electronic components. Blank detail specification: ambient-rated rectifier diodes |
|
BSI |
BS CECC 50008 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: ambient-rated rectifier diodes |
|
BSI |
BS CECC 41401 |
Specification for harmonized system of quality assessment for electronic conponents. Blank detail specification: rotary precision potentiometers (assessment level S) |
|
BSI |
BS EN 150012 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: single gate field-effect transistors |
|
BSI |
BS EN 131802 |
Harmonized system of quality assessment for electronic components. Blank detail specification: fixed polypropylene film dielectric metal foil d.c. capacitors. Assessment level EZ |
|
BSI |
BS CECC 90201 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: integrated voltage regulators |
|
BSI |
BS EN 114001 |
Harmonized system of quality assessment for electronic components. Blank detail specification: photomultiplier tubes |
|
BSI |
BS CECC 90302 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: integrated voltage comparators |
|
BSI |
BS CECC 96200 |
Harmonized system of quality assessment for electronic components. Sectional specification including blank detail specification: lever switches |
|
BSI |
BS EN 120003 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Phototransistors, photodarlington transistors, phototransistor arrays |
|
BSI |
BS QC 400000 |
Harmonized System of Quality Assessment for Electronic Components. Fixed Resistors For |
|
BSI |
BS EN 129102 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: wirewound surface mounting inductors of assessed quality. Assessment level P |
|
BSI |
BS EN 122002 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: radio frequency coaxial connectors |
|
BSI |
BS CECC 30101 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS EN 132401 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 31101 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 30901 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 30801 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 30701 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 30301 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 30202 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 30201 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 25401 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 35001 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 30302 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 31201 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 31301 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS QC 300301 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 18001 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 40201 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 31401 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 31501 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 31801 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 32201 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 30501 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS EN 144001 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 64201 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 64101 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 13001 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 30601 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 40202 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 40203 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 12001 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 40104 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 40103 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS EN 144004 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 40102 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 40101 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS EN 144003 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS EN 144002 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 31701 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 14001 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 46001 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: cold cathode indicator tubes |
|
BSI |
BS QC 410204 |
Specification for harmonized system of quality assessment for electronic components. Potentiometers for use in electronic equipment. Blank detail specification: single-turn rotary power potentiometers. Assessment level F |
|
BSI |
BS QC 410203 |
Specification for harmonized system of quality assessment for electronic components. Potentiometers for use in electronic equipment. Blank detail specification: single-turn rotary power potentiometers. Assessment level E |
|
BSI |
BS QC 301901 |
Specification for harmonized system of quality assessment for electronic components. Fixed capacitors for use in electronic equipment. Blank detail specification. Fixed multilayer ceramic chip capacitors. Assessment level E |
|
BSI |
BS EN 150004 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: bipolar transistors for switching applications |
|
BSI |
BS EN 129101 |
Harmonized system of quality assessment for electronic components. Blank detail specification: wirewound surface mounting inductors of assessed quality. Assessment level E |
|
BSI |
BS QC 410402 |
Specification for harmonized system of quality assessment for electronic components. Potentiometers for use in electronic equipment. Blank detail specification: rotary precision potentiometers. Assessment level E |
|
BSI |
BS EN 123300-800 |
Specification for Harmonized System of Quality Assessment for Electronic Components. C |
|
BSI |
BS CECC 31601 |
Specification for Harmonized System of Quality Assessment for Electronic Components. F |
|
BSI |
BS QC 301201 |
Specification for Harmonized System of Quality Assessment for Electronic Components. F |
|
BSI |
BS QC 300401 |
Specification for Harmonized System of Quality Assessment for Electronic Components. F |
|
BSI |
BS CECC 23300-003-91 |
Specification for Harmonized System of Quality Assessment for Electronic Components. C |
|
BSI |
BS EN 130501 |
Harmonized system of quality assessment for electronic components. Blank detail specification: fixed metallized polycarbonate film dielectric capacitors for direct current. Assessment level E |
|
BSI |
BS CECC 42101 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: low voltage varistors primarily for telephony applications (assessment level P) |
|
BSI |
BS EN 130502 |
Harmonized system of quality assessment for electronic components. Blank detail specification: fixed metallized polycarbonate film dielectric capacitors for direct current. Assessment level EZ |
|
BSI |
BS 9940-03.0 |
Harmonized system of quality assessment for electronic components. Fixed resistors for use in electronic equipment. Sectional specification: fixed precision resistors |
|
BSI |
BS CECC 90114 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: programmable logic arrays (PLA) |
|
BSI |
BS QC 410302 |
Specification for harmonized system of quality assessment for electronic components. Potentiometers for use in electronic equipment. Blank detail specification: single-turn rotary low-power potentiometers. Assessment level F |
|
BSI |
BS QC 410301 |
Specification for harmonized system of quality assessment for electronic components. Potentiometers for use in electronic equipment. Blank detail specification: single-turn rotary low-power potentiometers. Assessment level E |
|
BSI |
BS EN 150013 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: current regulator and current reference diodes |
|
BSI |
BS EN 129202 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: wirebound inductors with ceramic or ferrite core. Assessment level P |
|
BSI |
BS 9940-01.0 |
Harmonized system of quality assessment for electronic components. Fixed resistors for use in electronic equipment. Sectional specification: fixed low power non-wirewound resistors |
|
BSI |
BS CECC 00012 |
Harmonized System of Quality Assessment for Electronic Components: Basic Specification |
|
BSI |
BS CECC 00013 |
Harmonized System of Quality Assessment for Electronic Components: Basic Specification |
|
BSI |
BS CECC 00017 |
Harmonized System of Quality Assessment for Electronic Components. Basic Specification |
|
BSI |
BS EN 168201 |
Harmonized system of quality assessment for electronic components. Blank detail specification. Quartz crystal units. (Qualification approval) |
|
BSI |
BS EN 134104 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: compression type trimmer capacitors (qualification approval) |
|
BSI |
BS CECC 90202 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: integrated operational amplifiers |
|
BSI |
BS QC 300901 |
Harmonized system of quality assessment for electronic components. Fixed capacitors for use in electronic equipment. Blank detail specification. Fixed polystyrene film dielectric metal foil d.c. capacitors. Assessment level E |
|
BSI |
BS EN 129201 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: wirewound inductors with ceramic or ferrite core. Assessment level E |
|
BSI |
BS QC 420101 |
SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS. VARISTORS FOR USE IN ELECTRONIC EQUIPMENT BLANK DETAIL SPECIFICATION SILICON CARBIDE SURGE SUPPRESSION VARISTORS ASSESSMENT LEVEL E |
|
BSI |
BS EN 167100 |
Harmonized System of Quality Assessment for Electronic Components. Section Specificati |
|
BSI |
BS CECC 30702 |
Specification for Harmonized System for Quality Assessment for Electronic Components. |
|
BSI |
BS EN 150003 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: case-rated bipolar transistors for low frequency amplification |
|
BSI |
BS EN 120006 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: pin-photodiodes for fibre optic applications |
|
BSI |
BS EN 150006 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Variable capacitance diode(s) |
|
BSI |
BS QC 300501 |
Specification for harmonized system of quality assessment for electronic components. Fixed capacitors for use in electronic equipment. Blank detail specification: fixed metallized polycarbonate film dielectric d.c. capacitors. Assessment level E |
|
BSI |
BS QC 301701 |
Harmonized system of quality assessment for electronic components. Fixed capacitors for use in electronic equipment. Blank detail specification. Fixed polycarbonate film dielectric metal foil d.c. capacitors. Assessment level E |
|
BSI |
BS 9940-05.01 |
Harmonized system of quality assessment for electronic components. Fixed resistors for use in electronic equipment. Blank detail specification: fixed resistor networks in which not all resistors are individually measurable. Assessment level E |
|
BSI |
BS EN 120004 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Ambient rated photocouplers with phototransistor output |
|
BSI |
BS EN 150014 |
Harmonized system of quality assessment for electronic components. Blank detail specification: Thyristor diodes, transient overvoltage suppressors |
|
BSI |
BS EN 136002 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: CW magnetrons for RF heating or cooking applications |
|
BSI |
BS CECC 63101 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: film and hybrid integrated circuits |
|
BSI |
BS CECC 22121 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: radio frequency coaxial connectors, series BNC |
|
BSI |
BS EN 122001 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: radio frequency connectors (Type MIL-C-39012) |
|
BSI |
BS EN 150007 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: case-rated bipolar transistors for high frequency amplification |
|
BSI |
BS EN 141101 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Lead-screw actuated and rotary preset potentiometers |
|
BSI |
BS CECC 96100 |
Harmonized system of quality assessment for electronic components. Sectional specification including blank detail specification: rotary switches |
|
BSI |
BS CECC 90301 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: integrated line transmitters and receivers |
|
BSI |
BS EN 135001 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: CW power amplifier travelling wave tubes up to 500 watts |
|
BSI |
BS EN 116501 |
Harmonized system of quality assessment for electronic components. Blank detail specification. Electromechanical all-or-nothing TELECOM relays of assessed quality |
|
BSI |
BS EN 150001 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: general purpose semiconductor diodes |
|
BSI |
BS EN 120002 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: infrared emitting diodes, infrared emitting diode arrays |
|
BSI |
BS CECC 68101 |
HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS. BLANK DETAIL SPECIFICATION: QUARTZ CRYSTAL UNITS (CAPABILITY APPROVAL) |
|
BSI |
BS EN 168101 |
Harmonized system of quality assessment for electronic components. Blank detail specification: quartz crystal units (capability approval) |
|
BSI |
BS EN 134103 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: vane type air dielectric capacitors (qualification approval) |
|
BSI |
BS EN 134102 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: multi turn concentric capacitors (qualification approval) |
|
BSI |
BS EN 112001 |
Harmonized system of quality assessment for electronic components. Blank detail specification: image converter and image intensifier tubes |
|
BSI |
BS QC 960201 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: electromechanical switches for use in electronic equipment. Blank detail specification for lever (toggle) switches |
|
BSI |
BS EN 129000 |
Harmonized system of quality assessment for electronic components. Generic specification. Fixed RF wound inductors |
|
BSI |
BS EN 170101 |
Harmonized system of quality assessment for electronic components. Blank detail specification. Waveguide type dielectric resonators. Capability approval |
|
BSI |
BS EN 134101 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: single turn disc trimmer capacitors (qualification approval) |
|
BSI |
BS CECC 96400 |
Harmonized system of quality assessment for electronic components. Sectional specification including blank detail specification: push-button switches |
|
BSI |
BS EN 186001 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Connectors for optical fibres and cables. Environmental category I |
|
BSI |
BS EN 187104 |
Harmonized System of Quality Assessment for Electronic Components, Family Specificatio |
|
BSI |
BS EN 187102 |
Harmonized System of Quality Assessment for Electronic Components. Family Specificatio |
|
BSI |
BS CECC 96300 |
Harmonized system of quality assessment for electronic components. Sectional specification including blank detail specification: sensitive switches |
|
BSI |
BS QC 300201 |
Specification for harmonized system of quality assessment for electronic components. Fixed capacitors for use in electronic equipment. Blank detail specification: fixed tantalum capacitors with solid electrolyte and porous anode. Assessment level E |
|
BSI |
BS 9925-03.01 |
Harmonized system of quality assessment for electronic components. Inductor and transformer cores for telecommunications. Blank detail specification: magnetic oxide cores for transformers and chokes for power applications. Assessment level A |
|
BSI |
BS EN 100012 |
Harmonized system of quality assessment for electronic components. Basic specification. X-ray inspection of electronic components |
|
BSI |
BS CECC 23300-801 |
Harmonized system of quality assessment for electronic components. Capability detail specification: multi-layer printed boards |
|
BSI |
BS CECC 90115 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: digital gate array integrated circuits |
|
BSI |
BS QC 390000 |
Harmonized system of quality assessment for electronic components. Fixed film resistor networks for use in electronic equipment. Generic specification |
|
BSI |
BS CECC 42200 |
Harmonized system of quality assessment for electronic components. Sectional specification: surge suppression varistors |
|
BSI |
BS CECC 30500 |
Harmonized System of Quality Assessment for Electronic Components. Sectional Specifica |
|
BSI |
BS CECC 30600 |
Harmonized System of Quality Assessment for Electronic Components: Sectional Specifica |
|
BSI |
BS CECC 31200 |
Harmonized System of Quality Assessment for Electronic Components: Sectional Specifica |
|
BSI |
BS CECC 31300 |
Harmonized System of Quality Assessment for Electronic Components: Sectional Specifica |
|
BSI |
BS CECC 31400 |
Harmonized System of Quality Assessment for Electronic Components: Sectional Specifica |
|
BSI |
BS EN 186210 |
Harmonized System of Quality Assessment for Electronic Components. Sectional Specifica |
|
BSI |
BS EN 186100 |
Harmonized System of Quality Assessment for Electronic Components. Sectional Specifica |
|
BSI |
BS EN 186180 |
Harmonized System of Quality Assessment for Electronic Components. Sectional Specifica |
|
BSI |
BS EN 196500 |
Harmonized System of Quality Assessment for Electronic Components. Sectional Specifica |
|
BSI |
BS EN 186170 |
Harmonized System of Quality Assessment for Electronic Components, Sectional Specifica |
|
BSI |
BS EN 169200 |
Harmonized System of Quality Assessment for Electronic Components. Sectional Specifica |
|
BSI |
BS EN 138100 |
Harmonized System of Quality Assessment for Electronic Components, Sectional Specifica |
|
BSI |
BS EN 130800 |
Harmonized System of Quality Assessment for Electronic Components. Sectional Specifica |
|
BSI |
BS CECC 40400 |
Harmonized System of Quality Assessment for Electronic Components: Sectional Specifica |
|
BSI |
BS CECC 40200 |
Harmonized System of Quality Assessment for Electronic Components: Sectional Specifica |
|
BSI |
BS EN 187200 |
Harmonized System of Quality Assessment for Electronic Components. Sectional Specifica |
|
BSI |
BS CECC 64200 |
Harmonized System of Quality Assessment for Electronic Components: Sectional Specifica |
|
BSI |
BS CECC 64100 |
Harmonized System of Quality Assessment for Electronic Components: Sectional Specifica |
|
BSI |
BS CECC 40100 |
Harmonized System of Quality Assessment for Electronic Components: Sectional Specifica |
|
BSI |
BS EN 133200 |
Harmonized System of Quality Assessment for Electronic Components. Sectional Specifica |
|
BSI |
BS CECC 30100 |
Harmonized System of Quality Assessment for Electronic Components. Sectional Specifica |
|
BSI |
BS EN 132400 |
Harmonized System of Quality Assessment for Electronic Components. Sectional Specifica |
|
BSI |
BS CECC 30200 |
Harmonized System of Quality Assessment for Electronic Components. Sectional Specifica |
|
BSI |
BS CECC 30300 |
Harmonized System of Quality Assessment for Electronic Components. Sectional Specifica |
|
BSI |
BS CECC 30700 |
Harmonized System of Quality Assessment for Electronic Components. Sectional Specifica |
|
BSI |
BS CECC 30800 |
Harmonized System of Quality Assessment for Electronic Components. Sectional Specifica |
|
BSI |
BS CECC 30900 |
Harmonized System of Quality Assessment for Electronic Components. Sectional Specifica |
|
BSI |
BS CECC 31100 |
Harmonized System of Quality Assessment for Electronic Components: Sectional Specifica |
|
BSI |
BS CECC 30401 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: fixed metallized polyethylene terephthalate film dielectric d.c. capacitors |
|
BSI |
BS EN 169101 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: quartz crystal controlled oscillators (capability approval) |
|
BSI |
BS CECC 90203 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: integrated analogue switching circuits |
|
BSI |
BS CECC 23300-003 |
Harmonized system of quality assessment for electronic components. Capability detail specification: multilayer printed boards |
|
BSI |
BS QC 300203 |
Specification for harmonized system of quality assessment for electronic components. Fixed capacitors for use in electronic equipment. Blank detail specification: fixed tantalum capacitors with non-solid electrolyte and foil electrode. Assessment level E |
|
BSI |
BS QC 960101 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: electromechanical switches for use in electronic equipment. Blank detail specification for rotary switches |
|
BSI |
BS CECC 22111 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: radio frequency coaxial connections, series SMA |
|
BSI |
BS 9940-04.01 |
Harmonized system of quality assessment for electronic components. Fixed resistors for use in electronic equipment. Blank detail specification: fixed resistor networks with individually measurable resistors all of equal value and equal dissipation. Assessment level E |
|
BSI |
BS QC 410102 |
Specification for harmonized system of quality assessment for electronic components. Potentiometers for use in electronic equipment. Blank detail specification: lead-screw actuated and rotary preset potentiometers. Assessment level F |
|
BSI |
BS EN 131200 |
Harmonized System of Quality Assessment for Electronic Components - Sectional Specific |
|
BSI |
BS QC 300202 |
Specification for harmonized system of quality assessment for electronic components. Fixed capacitors for use in electronic equipment. Blank detail specification: fixed tantalum capacitors with non-solid electrolyte and porous anode. Assessment level E |
|
BSI |
BS EN 186005 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Connector for optical fibres and cables. Environmental category V |
|
BSI |
BS CECC 52000 |
Harmonized System of Quality Assessment for Electronic Components. Generic Specificati |
|
BSI |
BS EN 167000 |
Harmonized System of Quality Assessment for Electronic Components. Generic Specificati |
|
BSI |
BS CECC 30000 |
Harmonized System of Quality Assessment for Electronic Components. Generic Specificati |
|
BSI |
BS EN 171000 |
Harmonized System of Quality Assessment for Electronic Components. Generic Specificati |
|
BSI |
BS CECC 42000 |
Harmonized System of Quality Assessment for Electronic Components: Generic Specificati |
|
BSI |
BS EN 196000 |
Harmonized System of Quality Assessment for Electronic Components. Generic Specificati |
|
BSI |
BS EN 138000 |
Harmonized System of Quality Assessment for Electronic Components. Generic Specificati |
|
BSI |
BS EN 130000 |
Harmonized System of Quality Assessment for Electronic Components. Generic Specificati |
|
BSI |
BS EN 133000 |
Harmonized System of Quality Assessment for Electronic Components, Generic Specificati |
|
BSI |
BS EN 116000-2 |
Harmonized System of Quality Assessment for Electronic Components. Generic Specificati |
|
BSI |
BS EN 143000 |
Harmonized System of Quality Assessment for Electronic Components: Generic Specificati |
|
BSI |
BS EN 119000 |
Harmonized System of Quality Assessment for Electronic Components. Generic Specificati |
|
BSI |
BS CECC 18000 |
Harmonized System of Quality Assessment for Electronic Components: Generic Specificati |
|
BSI |
BS CECC 19000 |
Harmonized System of Quality Assessment for Electronic Components: Generic Specificati |
|
BSI |
BS CECC 41000 |
Harmonized System of Quality Assessment for Electronic Components: Generic Specificati |
|
BSI |
BS CECC 12000 |
Harmonized System of Quality Assessment for Electronic Components. Generic Specificati |
|
BSI |
BS QC 700000 |
Harmonized System of Quality Assessment for Electric Components. Generic Specification |
|
BSI |
BS CECC 64000 |
Harmonized System of Quality Assessment for Electronic Components: Generic Specificati |
|
BSI |
BS EN 144000 |
Harmonized System of Quality Assessment for Electronic Components. Generic Specificati |
|
BSI |
BS EN 168000 |
Harmonized System of Quality Assessment for Electronic Components. Generic Specificati |
|
BSI |
BS CECC 51000 |
Harmonized System of Quality Assessment for Electronic Components. Generic Specificati |
|
BSI |
BS EN 136001 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: pulsed magnetrons (excluding frequency agile magnetrons) |
|
BSI |
BS EN 147100 |
Harmonized system of quality assessment for electronic components. Sectional specification: relay sockets of assessed quality |
|
BSI |
BS EN 186004 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Connector for optical fibres and cables. Environmental category IV |
|
BSI |
BS EN 186002 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Connector for optical fibres and cables. Environmental category II |
|
BSI |
BS EN 175200 |
Harmonized system of quality assessment for electronic components. Sectional specification: circular connectors |
|
BSI |
BS QC 750106 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Field-effect transistors for case-rated power amplifier applications |
|
BSI |
BS EN 130201 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: fixed tantalum capacitors with solid electrolyte, porous anode (sub-family 3) |
|
BSI |
BS EN 186003 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Connector for optical fibres and cables. Environmental category III |
|
BSI |
BS EN 190110 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: digital microprocessor integrated circuits |
|
JIS |
JIS C 5201-4-1 |
Fixed resistors for use in electronic equipment. Part 4: Blank detail specification: Fixed power resistors. Assessment level E |
|
IEC |
IEC 60115-4-1 |
Fixed resistors for use in electronic equipment. Part 4: Blank detail specification: Fixed power resistors. Assessment level E |
|
BSI |
BS QC 400600 |
Harmonized system of quality assessment for electronic components. Fixed resistors for use in electronic equipment. Sectional specification: fixed surface mounting (chip) resistors |
|
BSI |
BS QC 960401 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: electromechanical switches for use in electronic equipment. Blank detail specification for pushbutton switches |
|
BSI |
BS CECC 16101 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Electromechanical all-or-nothing relays. Test schedule 3 |
|
BSI |
BS QC 960501 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: electromechanical switches for use in electronic equipment. Blank detail specification for in-line package switches |
|
BSI |
BS EN 123000 |
Harmonized system of quality assessment for electronic components. Generic specification: printed boards |
|
BSI |
BS EN 160201 |
Harmonized system of quality assessment for electronic components. Blank detail specification. Microwave modular electronic units of assessed quality. Capability approval |
|
BSI |
BS EN 131701 |
Harmonized system of quality assessment for electronic components. Blank detail specification: fixed capacitors for direct current with electrodes of thin metal foils and a polycarbonate film dielectric. Assessment level E |
|
BSI |
BS EN 136000 |
Harmonized system of quality assessment for electronic components: generic specification: magnetrons |
|
BSI |
BS EN 166101 |
Harmonized system of quality assessment for electronic components. Blank detail specification: surface acoustic wave (SAW) filters. Capability approval |
|
BSI |
BS EN 120008 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: light emitting diodes and infrared emitting diodes for fibre optic system or sub-system |
|
BSI |
BS EN 180000 |
Harmonized system of quality assessment for electronic components. Generic specification: Fibre optic attenuators |
|
BSI |
BS QC 960301 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: electromechanical switches for use in electronic equipment. Blank detail specification for sensitive switches |
|
BSI |
BS EN 131702 |
Harmonized system of quality assessment for electronic components. Blank detail specification: fixed capacitors for direct current with electrodes of thin metal foils and a polycarbonate film dielectric. Assessment level EZ |
|
BSI |
BS EN 130202 |
Harmonized system of quality assessment for electronic components. Blank detail specification: fixed tantalum capacitors with non-solid electrolyte, porous anode (sub-family 2) |
|
BSI |
BS EN 120001 |
Harmonized system of quality assessment for electronic components. Blank detail specification. Light emitting diodes, light emitting diode arrays, light emitting diode displays without internal logic and resistor |
|
BSI |
BS CECC 25300 |
Harmonized system of quality assessment for electronic components: sectional specification: magnetic oxide cores for power applications |
|
BSI |
BS QC 400203 |
Specification for fixed resistors for use in electronic equipment. Blank detail specification. Fixed power resistors, heat-sink types. Assessment level H |
|
BSI |
BS CECC 31500 |
Harmonized System of Quality Assessment of Electronic Components. Sectional Specificat |
|
BSI |
BS EN 143004 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: directly heated negative temperature coefficient thermistors (rod type) |
|
BSI |
BS EN 170100 |
Harmonized system of quality assessment for electronic components. Sectional specification: Waveguide type dielectric resonators |
|
BSI |
BS CECC 90111 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. MOS read/write static memories silicon monolithic circuits |
|
BSI |
BS QC 301200 |
Harmonized System of Quality Assessment for Electronic Components. Fixed Capacitors Fo |
|
BSI |
BS CESS 23100-801 |
Harmonized System of Quality Assessment for Electronic Components, Capability Detail S |
|
BSI |
BS EN 123100-800 |
Harmonized System of Quality Assessment for Electronic Components. Capability Detail S |
|
BSI |
BS QC 300101 |
Harmonized System of Quality Assessment for Electronic Components, Fixed Capacitors Fo |
|
BSI |
BS QC 301300 |
Harmonized System of Quality Assessment for Electronic Components. Fixed Capacitors Fo |
|
BSI |
BS QC 300900 |
Harmonized System of Quality Assessment for Electronic Components. Fixed Capacitors Fo |
|
BSI |
BS QC 301301 |
Harmonized System of Quality Assessment for Electronic Components. Fixed Capacitors Fo |
|
BSI |
BS EN 123200-800 |
Harmonized System of Quality Assessment for Electronic Components: Capability Detail S |
|
BSI |
BS QC 300000 |
Harmonized System of Quality Assessment for Electronic Components. Fixed Capacitors Fo |
|
BSI |
BS QC 301801 |
Harmonized System of Quality Assessment for Electronic Components. Fixed Capacitors Fo |
|
BSI |
BS QC 300100 |
Harmonized System of Quality Assessment for Electronic Components. Fixed Capacitors Fo |
|
BSI |
BS QC 300801 |
Harmonized System of Quality Assessment for Electronic Components. Fixed Capacitors Fo |
|
BSI |
BS QC 300601 |
Harmonized System of Quality Assessment for Electronic Components. Fixed Capacitors Fo |
|
BSI |
BS QC 300800 |
Harmonized System of Quality Assessment for Electronic Components. Fixed Capacitors Fo |
|
BSI |
BS QC 300701 |
Harmonized System of Quality Assessment for Electronic Components. Fixed Capacitors Fo |
|
BSI |
BS EN 120005 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Photodiodes, photodiode-arrays (not intended for fibre optic applications) |
|
BSI |
BS EN 111100 |
Harmonized system of quality assessment for electronic components: sectional specification: display storage tubes |
|
BSI |
BS CECC 75101 |
Specification for harmonized system of quality assessment for electronic components. Example detail specification/blank detail specification. Two-part and edge socket connectors for printed board application |
|
BSI |
BS EN 113000 |
Harmonized system of quality assessment for electronic components. Generic specification: camera tubes |
|
BSI |
BS CECC 17001 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Mercury wetted make contact units for general application |
|
BSI |
BS QC 750113 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: reverse blocking triode thyristors, ambient and case-rated, for currents greater than 100 A |
|
BSI |
BS EN 143003 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: directly heated negative temperature coefficient thermistors (disc type) |
|
BSI |
BS CECC 75301 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Interim Example. Detail specification/blank detail specification: rectangular connectors for frequencies below 3 MHz |
|
BSI |
BS EN 150015 |
Harmonized system of quality assessment for electronic components. Blank detail specification: unidirectional transient overvoltage suppressor diodes |
|
BSI |
BS CECC 63201 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: film and hybrid integrated circuits (capability approval) |
|
BSI |
BS CECC 90112 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. MOS read/write dynamic memories silicon monolithic circuits |
|
BSI |
BS EN 131800 |
Harmonized system of quality assessment for electronic components. Sectional specification: fixed polypropylene film dielectric metal foil d.c. capacitors |
|
BSI |
BS CECC 31800 |
Harmonized system of quality assessment for electronic components. Sectional specification: fixed polypropylene film dielectric metal foil d.c. capacitors |
|
BSI |
BS EN 186006-1 |
Harmonized system of quality assessment for electronic components. Blank detail specification. Connectors for optical fibres and cables for military use. Environmental category VI |
|
BSI |
BS CECC 41300 |
Harmonized system of quality assessment for electronic components. Sectional specification: low power single-turn rotary potentiometers |
|
BSI |
BS EN 160000 |
Harmonized system of quality assessment for electronic components. Generic specification: modular electronic units |
|
BSI |
BS QC 790110 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits.Blank detail specification. Microprocessor integrated circuits |
|
BSI |
BS EN 160101 |
Harmonized system of quality assessment for electronic components. Blank detail specification: printed board assembly modular electronic units of assessed quality. Capability approval |
|
BSI |
BS QC 750104 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Bipolar transistors for switching applications |
|
BSI |
BS CECC 31600 |
Harmonized system of quality assessment for electronic components: sectional specification. Fixed capacitors with paper and paper/plastics dielectrics |
|
BSI |
BS EN 111000 |
Harmonized system of quality assessment for electronic components. Generic specification: cathode ray tubes |
|
BSI |
BS EN 116203 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Electromechanical all-or-nothing relays for enhanced industrial application |
|
BSI |
BS EN 170000 |
Harmonized System of Quality Assessment for Eletronic Components - Generic Specificati |
|
BSI |
BS CECC 41400 |
Harmonized system of quality assessment for electronic components: sectional specification: rotary precision potentiometers |
|
BSI |
BS CECC 75201 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Interim example. Detail specification/blank detail specification. Circular connectors for frequencies below 3 MHz |
|
BSI |
BS QC 720100 |
Harmonized system of quality assessment for electronic components. Semiconductor devices. Sectional specification for optoelectronic devices |
|
BSI |
BS EN 132421 |
Harmonized system of quality assessment for electronic components. Blank detail specification: fixed capacitors for electromagnetic interference suppression. Capacitors for which safety tests are required (safety tests only) |
|
BSI |
BS EN 123300 |
Specification for harmonized system of quality assessment for electronic components. Sectional specification. Multilayer printed boards |
|
BSI |
BS EN 181000 |
Harmonized system of quality assessment for electronic components. Generic specification. Fibre optic branching devices |
|
BSI |
BS CECC 41200 |
Harmonized system of quality assurance for electronic components: sectional specification: power potentiometers |
|
BSI |
BS 9940-04.02 |
Harmonized system of quality assessment for electronic components. Fixed resistors for use in electronic equipment. Blank detail specification: fixed resistor networks with individually measurable resistors of either different resistance values or different rated dissipations. Assessment level E |
|
BSI |
BS EN 114000 |
Harmonized system of quality assessment for electronic components: generic specification: photomultiplier tubes |
|
BSI |
BS EN 120007 |
Harmonized system of quality assessment for electronic components. Blank detail specification. Liquid crystal displays. Monochrome LCDs without electronic circuit |
|
BSI |
BS QC 160101 |
Specification for harmonized system of quality assessment for electronic components. Electrical relays. Blank detail specification. Electromechanical all-or-nothing relays. Test schedules 1, 2 and 3 |
|
BSI |
BS EN 137101 |
Harmonized system of quality assessment for electronic components. Blank detail specification. Fixed aluminium electrolytic a.c. capacitors with non-solid electrolyte for motor starter applications (Qualification approval) |
|
BSI |
BS EN 131801 |
Harmonized System of Quality Assessment for Electronic Components |
|
BSI |
BS EN 130901 |
Harmonized System of Quality Assessment for Electronic Components |
|
BSI |
BS EN 130100 |
Harmonized System of Quality Assessment for Electronic Components. |
|
BSI |
BS EN 130101 |
Harmonized System of Quality Assessment for Electronic Components |
|
BSI |
BS EN 130102 |
Harmonized System of Quality Assessment for Electronic Components |
|
BSI |
BS EN 130902 |
Harmonized System of Quality Assessment for Electronic Components. |
|
BSI |
BS EN 130900 |
Harmonized System of Quality Assessment for Electronic Components. |
|
BSI |
BS CECC 96000 |
Harmonized system of quality assessment for electronic components. Generic specification: electromechanical switches |
|
BSI |
BS CECC 51001 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: mercury wetted change-over contact units, magnetically biased |
|
BSI |
BS QC 750103 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Case-rated bipolar transistors for low-frequency amplification |
|
BSI |
BS EN 134100 |
Harmonized system of quality assessment for electronic components. Sectional specification: variable capacitors (Qualification approval) |
|
BSI |
BS EN 116204 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Electromechanical all-or-nothing sealed relays for aggressive industrial application |
|
BSI |
BS QC 300300 |
Harmonized System of Quality Assessment Fr Electronic Components - Fixed Capacitors Fo |
|
BSI |
BS EN 143002 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: directly heated negative temperature coefficient thermistors (beads in envelopes) |
|
BSI |
BS QC 750114 |
Harmonized system of quality assessment for electronic components. Semiconductor devices. Discrete devices. Field-effect transistors. Blank detail specification for case-rated field-effect transistors for switching applications |
|
BSI |
BS QC 420000 |
Harmonized System of Quality Assessment for Electronic Components. Varistors for Use I |
|
BSI |
BS EN 132100 |
Harmonized system of quality assessment for electronic components. Sectional specification: fixed mulitlayer ceramic surface mounting capacitors. Assessment levels EZ and DZ |
|
BSI |
BS CECC 46000 |
Harmonized system of quality assessment for electronic components: generic specification: cold cathode indicator tubes |
|
BSI |
BS EN 188100 |
Harmonized system of quality assessment for electronic components. Sectional specification: single-mode (SM) optical fibre |
|
BSI |
BS QC 790111 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification: integrated circuit static read/write memories |
|
BSI |
BS EN 169000 |
Harmonized system of quality assessment for electronic components. Generic specification. Quartz crystal controlled oscillators |
|
BSI |
BS CECC 50000 |
Harmonized system of quality assessment for electronic components. Generic specification: discrete semiconductor devices |
|
BSI |
BS QC 410000 |
Harmonized System of Quality Assessment for Electronic Components: Potentiometers For |
|
BSI |
BS EN 125000 |
Harmonized system of quality assessment for electronic components. Generic specification: cores made of ferrite materials |
|
BSI |
BS EN 147000 |
Harmonized system of quality assessment for electronic components. Generic specification. Sockets for use with electrical relays of assessed quality |
|
BSI |
BS CECC 16200 |
HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - SECTIONAL SPECIFICATION: ELECTROMECHANICAL ALL-OR-NOTHING RELAYS |
|
BSI |
BS CECC 16100 |
Harmonized system of quality assessment for electronic components. Sectional specification: electromechanical all-or-nothing relays |
|
BSI |
BS EN 130500 |
Harmonized system of quality assessment for electronic components. Sectional specification: fixed metallized polycarbonate film dielectric capacitors for direct current |
|
BSI |
BS EN 181102 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: fibre optic branching devices. Type: wavelength selective transmission star |
|
BSI |
BS CECC 200000 |
Harmonized System of Quality Assessment for Electronic Components. Requirements for Pr |
|
BSI |
BS QC 010000 |
Harmonized System of Quality Assessment for Electronic Components. Connectors for Freq |
|
BSI |
BS EN 130200 |
Harmonized system of quality assessment for electronic components. Sectional specification: fixed tantalum capacitors with non-solid or solid electrolyte |
|
BSI |
BS EN 116303 |
Harmonized system of quality assessment for electronic components. Blank detail specification: electromechanical all-or-nothing heavy load relays of assessed quality (hermetically sealed, 5A to 25A) |
|
BSI |
BS QC 300700 |
Harmonized system of quality assessment for electronic components. Fixed capacitors for use in electronic equipment. Sectional specification for fixed capacitors of ceramic dielectric, class 2 |
|
BSI |
BS QC 300600 |
Harmonized system of quality assessment for electronic components. Fixed capacitors for use in electronic equipment. Sectional specification for fixed capacitors of ceramic dielectric, class 1 |
|
BSI |
BS EN 168200 |
Harmonized system of quality assessment for electronic components. Sectional specification: quartz crystal units (qualification approval) |
|
BSI |
BS QC 750107 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Case-rated bipolar transistors for high-frequency amplifications |
|
BSI |
BS EN 122120 |
Harmonized system of quality assessment for electronic components. Sectional specification: radio frequency coaxial connectors. Series BNC |
|
BSI |
BS QC 790202 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Monolithic integrated operational amplifiers |
|
BSI |
BS CECC 45000 |
Specification for harmonized system of quality assessment for electronic components: generic specification: space-charge controlled tubes |
|
BSI |
BS QC 750112 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Semiconductor devices. Discrete devices. Field-effect transistors. Blank detail specification for single-gate field-effect transistors, up to 5 W and 1 GHz |
|
BSI |
BS CECC 16000 |
Harmonized system of quality assessment for electronic components. Generic specification: electromechanical all-or-nothing relays |
|
BSI |
BS QC 160100 |
Harmonized system of quality assessment for electronic components. Electrical relays. Sectional specification: electromechanical all-or-nothing relays |
|
BSI |
BS EN 135000 |
Harmonized system of quality assessment for electronic components. Generic specification: travelling wave amplifier tubes |
|
BSI |
BS EN 166100 |
Harmonized system of quality assessment for electronic components. Sectional specification:surface acoustic wave (SAW) filters |
|
IEC |
IEC 61253-2-1 |
Piezoelectric ceramic resonators - A specification in the IEC quality assessment system for electronic components (IECQ) - Part 2: Sectional specification - Qualification approval - Section 1: Blank detail specification - Assessment level E |
|
BSI |
BS QC 720105 |
Harmonized system of quality assessment for electronic components. Semiconductor devices. Optoelectronic devices. Blank detail specification for pin-photodiodes with/without pigtail, for fibre optic systems or subsystems |
|
BSI |
BS EN 116502 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: electromechanical all-or-nothing TELECOM relays of assessed quality, dual-in-line, with 20mm x 10mm base |
|
BSI |
BS EN 116503 |
Harmonized system of quality assessment for electronic components. Blank detail specification: electromechanical all-or-nothing TELECOM relays of assessed quality, dual-in-line, with 14mm x 9mm base |
|
BSI |
BS QC 720104 |
Harmonized system of quality assessment for electronic components. Semiconductor devices. Optoelectronic devices. Blank detail specification for pin-FET modules with/without pigtail, for fibre optic systems or subsystems |
|
JIS |
JIS C 5201-5-1 |
Fixed resistors for use in electronic equipment. Part 5: Blank detail specification: Fixed precision resistors. Assessment level E |
|
BSI |
BS EN 123500-800 |
Harmonized system of quality assessment for electronic components. Capability detail specification: flexible printed boards with through-connections |
|
BSI |
BS CECC 123500-003 |
Specification for harmonized system of quality assessment for electronic components. Capability detail specification: flexible printed boards with through-connections |
|
BSI |
BS QC 750102 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Ambient-rated bipolar transistors for low and high-frequency amplification |
|
BSI |
BS QC 301700 |
Harmonized system of quality assessment for electronic components. Fixed capacitors for use in electronic equipment. Sectional specification for fixed polycarbonate film dielectric metal foil d.c. capacitors |
|
BSI |
BS EN 166000 |
Harmonized system of quality assessment for electronic components. Generic specification. Surface acoustic wave (SAW) filters |
|
JIS |
JIS C 5201-2-1 |
Fixed resistors for use in electronic equipment. Part 2: Blank detail specification: Fixed low-power non-wirewound resistors. Assessment level E |
|
BSI |
BS EN 181101 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: fibre optic branching devices. Type: non wavelength selective transmissive star |
|
BSI |
BS EN 122130 |
Harmonized system of quality assessment for electronic components. Sectional specification: radio frequency coaxial connectors. Series SMB |
|
BSI |
BS EN 122140 |
Harmonized system of quality assessment for electronic components. Sectional specification: radio frequency coaxial connectors. Series SMC |
|
BSI |
BS EN 122110 |
Harmonized system of quality assessment for electronic components. Sectional specification: radio frequency coaxial connectors. Series SMA |
|
BSI |
BS EN 186230 |
Harmonized system of quality assessment for electronic components. Sectional specification: connector sets for optical fibres and cables. Type LSF |
|
BSI |
BS EN 186270 |
Harmonized system of quality assessment for electronic components. Sectional specification: connector sets for optical fibres and cables. Type LSH |
|
BSI |
BS EN 186130 |
Harmonized system of quality assessment for electronic components. Sectional specification. Connector sets for optical fibres and cables. Type LSA |
|
BSI |
BS EN 186220 |
Harmonized system of quality assessment for electronic components. Sectional specification: Connector sets for optical fibres and cables. Type LSC |
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BSI |
BS EN 122160 |
Harmonized system of quality assessment for electronic components. Sectional specification: radio frequency coaxial connectors. Series SSMA |
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BSI |
BS EN 122170 |
Harmonized system of quality assessment for electronic components. Sectional specification: radio frequency coaxial connectors. Series SSMB |
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BSI |
BS EN 122180 |
Harmonized system of quality assessment for electronic components. Sectional specification. Radio frequency coaxial connectors. Series SSMC |
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BSI |
BS CECC 22110 |
Harmonized system of quality assessment for electronic components: sectional specification: radio frequency coaxial connectors, series SMA |
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BSI |
BS EN 175300 |
Harmonized system of quality assessment for electronic components. Sectional specification:rectangular connectors for frequencies below 3 MHz |
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BSI |
BS QC 301900 |
Harmonized system of quality assessment for electronic components. Fixed capacitors for use in electronic equipment. Sectional specification for fixed multilayer ceramic chip capacitors |
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BSI |
BS QC 410200 |
Harmonized system of quality assessment for electronic components. Potentiometers for use in electronic equipment. Sectional specification for single-turn rotary power potentiometers |
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BSI |
BS QC 301800 |
Harmonized system of quality assessment for electronic components. Fixed capacitors for use in electronic equipment. Sectional specification for fixed polypropylene film dielectric metal foil d.c. capacitors |
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BSI |
BS CECC 16000-1 |
Harmonized system of quality assessment for electronic components. Generic specification: electromechanical all-or-nothing relays. General |
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BSI |
BS EN 116000-1 |
Harmonized system of quality assessment for electronic components. Generic specification: electromechanical all-or-nothing relays. General |
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BSI |
BS CECC 210000 |
Harmonized System of Quality Assessment for Electronic Components. Requirements for Te |
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BSI |
BS EN 122003 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification for the preparation of customer detail specifications (CDS) and detail specifications for standard production items with capability approval |
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BSI |
BS EN 186260 |
Harmonized system of quality assessment for electronic components. Sectional specification: connector sets for optical fibres and cables. Type SC |
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BSI |
BS EN 186110 |
Harmonized system of quality assessment for electronic components. Sectional specification: connector sets for optical fibres and cables. Type FC |
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BSI |
BS EN 122200 |
Harmonized system of quality assessment for electronic components. Sectional specification. Radio frequency coaxial connectors. Series TNC |
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BSI |
BS CECC 42100 |
Harmonized system of quality assessment for electronic components: sectional specification: low voltage varistors primarily for telephony applications |
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BSI |
BS CECC 41100 |
Harmonized system of quality assessment for electronic components: sectional specification: lead screw actuated and rotary preset potentiometers |
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BSI |
BS EN 175201-804 |
Harmonized system of quality assessment for electronic components. Detail specification. Circular connectors. Round contacts, size diameter 1,6 mm, threaded coupling |
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BSI |
BS CECC 90000 |
Harmonized system of quality assessment for electronic components. Generic specification: monolithic integrated circuits |
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BSI |
BS EN 190000 |
Harmonized system of quality assessment for electronic components. Generic specification: monolithic integrated circuits |
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BSI |
BS EN 125401 |
Harmonized system of quality assessment for electronic components. Blank detail specification. Adjusters used with magnetic oxide (ferrite) cores for use in inductors and tuned transformers |
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BSI |
BS EN 125100 |
Harmonized system of quality assessment for electronic components: sectional specification: magnetic oxide cores for inductor applications |
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BSI |
BS EN 186310 |
Harmonized system of quality assessment for electronic components. Sectional specification: connector sets for optical fibres and cables. Type MF |
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BSI |
BS EN 129100 |
Harmonized system of quality assessment for electronic components. Sectional specification: wirewound surface mounting inductors |
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BSI |
BS EN 186240 |
Harmonized system of quality assessment for electronic components. Sectional specification: connector sets for optical fibres and cables. Type MT |
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BSI |
BS EN 122340 |
Harmonized system of quality assessment for electronic components. Sectional specification. Radio frequency coaxial connectors. Series MMCX |
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BSI |
BS EN 122190 |
Harmonized system of quality assessment for electronic components. Sectional specification: radio frequency coaxial connectors. Series 7-16 |
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BSI |
BS CECC 123400-003 |
Specification for harmonized system of quality assessment for electronic components. Capability detail specification: flexible printed boards without through-connections |
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BSI |
BS EN 123400-800 |
Harmonized system of quality assessment for electronic components. Capability detail specification: flexible printed boards without through-connections |
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BSI |
BS EN 153000 |
Harmonized system of quality assessment for electronic components. Generic specification: discrete pressure contact power semiconductor devices (qualification approval) |
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BSI |
BS QC 300500 |
Harmonized system of quality assessment for electronic components. Fixed capacitors for use in electronic equipment. Sectional specification: fixed metallized polycarbonate film dielectric d.c. capacitors |
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BSI |
BS QC 790107 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Digital integrated circuits. Blank detail specification. Integrated circuit dynamic read/write memories |
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BSI |
BS CECC 63100 |
Harmonized system of quality assessment for electronic components: sectional specification: film and hybrid integrated circuits |
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BSI |
BS EN 187103 |
Harmonized system of quality assessment for electronic components. Family specification. Optical fibre cables for indoor applications |
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BSI |
BS QC 750110 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Reverse blocking triode thyristors, ambient and case-rated, up to 100 A |
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BSI |
BS EN 116500 |
Harmonized system of quality assessment for electronic components. Sectional specification: electromechanical all-or-nothing TELECOM relays of assessed quality |
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BSI |
BS EN 186300 |
Harmonized system of quality assessment for electronic components. Sectional specification: connector sets for optical fibres and cables type MSC |
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BSI |
BS EN 134000 |
Harmonized system of quality assessment for electronic components. Generic specification: variable capacitors. (Qualification approval and capability approval) |
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BSI |
BS 9925-0 |
Harmonized system of quality assessment for electronic components. Inductor and transformer cores for telecommunications. Generic specification |
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BSI |
BS EN 125200 |
Harmonized system of quality assessment for electronic components: sectional specification: magnetic oxide cores for linear transformers |
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BSI |
BS QC 410400 |
Harmonized system of quality assessment for electronic components. Potentiometers for use in electronic equipment. Sectional specification for rotary precision potentiometers |
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BSI |
BS QC 960200 |
Harmonized system of quality assessment for electronic components. Electromechanical switches for use in electronic equipment. Sectional specification for lever (toggle) switches |
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BSI |
BS EN 122150 |
Harmonized system of quality assessment for electronic components. Sectional specification: radio frequency coaxial connectors. Series EIA Flange |
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BSI |
BS EN 100015-1 |
Basic specification. Protection of electrostatic sensitive devices. Harmonized system of quality assessment for electronic components. Basic specification: protection of electrostatic sensitive devices. General requirements |
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BSI |
BS CECC 23100-801 |
Harmonized system of quality assessment for electronic components. Capability detail specification: single and double-sided printed boards with plain holes |
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BSI |
BS CECC 23100-003 |
Harmonized system of quality assessment for electronic components. Capability detail specification: single and double sided printed boards with plain holes |
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BSI |
BS QC 960000 |
Harmonized System of Quality Assessment for Electronic Components. Electromechanical S |
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BSI |
BS QC 790130 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. HCMOS digital integrated circuits (series 54/74 HC, 54/74 HCT, 54/74 HCU) |
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BSI |
BS QC 750001 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Signal diodes, switching diodes and controlled avalanche diodes |
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BSI |
BS EN 168100 |
Harmonized system of quality assessment for electronic components. Sectional specification: quartz crystal units (capability approval) |
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BSI |
BS CECC 68100 |
Harmonized system of quality assessment for electronic components. Sectional specification: quartz crystal units (capability approval) |
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BSI |
BS CECC 63000 |
Harmonized system of quality assessment for electronic components. Generic specification: film and hybrid integrated circuits |
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BSI |
BS QC 760000 |
Harmonized system of quality assessment for electronic components. Film and hybrid film integrated circuits. Generic specification |
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BSI |
BS EN 190116 |
Harmonized system of quality assessment for electronic components. Family specification: AC MOS digital integrated circuits |
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BSI |
BS CECC 22000 |
Harmonized system of quality assessment for electronic components. Generic specification. Radio frequency coaxial connectors (Parts I, II and III) |
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BSI |
BS QC 750109 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Rectifier diodes (including avalanche rectifier diodes), ambient and case-rated, for currents greater than 100 A |
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BSI |
BS EN 190100 |
Harmonized system of quality assessment for electronic components: sectional specification: digital monolithic integrated circuits |
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BSI |
BS QC 160000-2 |
Harmonized system of quality assessment for electronic components. Electrical relays. Generic specification: electromechanical all-or-nothing relays. Quality assessment procedures |
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BSI |
BS QC 390100 |
Harmonized system of quality assessment for electronic components. Fixed film resistor networks for use in electronic equipment. Sectional specification for film resistor networks of assessed quality on the basis of the capability approval procedure |
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BSI |
BS 9940-05.00 |
Harmonized system of quality assessment for electronic components. Fixed resistors for use in electronic equipment. Sectional specification: fixed resistor networks in which not all resistors are individually measurable |
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BSI |
BS QC 760101 |
Harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification for film integrated circuits and hybrid film integrated circuits on the basis of qualification approval procedures |
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BSI |
BS CECC 00800 |
Harmonized System of Quality Assessment for Electronic Components. Code of Practice Fo |
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BSI |
BS QC 420100 |
Harmonized System of Quality Assessment for Electric Components. Varistors for Use In |
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BSI |
BS EN 112000 |
Harmonized system of quality assessment for electronic components. Generic specification: image converter and image intensifier tubes |
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BSI |
BS EN 188102 |
Harmonized system of quality assessment for electronic components. Family specification: single-mode dispersion shifted (B2) optical fibre |
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BSI |
BS CECC 20000 |
Harmonized system of quality assessment for electronic components: generic specification: semiconductor optoelectronic and liquid crystal devices |
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BSI |
BS EN 120000 |
Harmonized system of quality assessment for electronic components. General specification: semiconductor optoelectronic and liquid crystal devices |
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BSI |
BS CECC 23600-801 |
Harmonized system of quality assessment for electronic components. Capability detail specification: flex-rigid multilayer printed boards with through connections |
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BSI |
BS QC 790303 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Linear digital-to-analogue converters (DAC) |
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BSI |
BS QC 790304 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Linear analogue-to-digital converters (ADC) |
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