BSI |
BS EN 136001 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: pulsed magnetrons (excluding frequency agile magnetrons) |
|
BSI |
BS EN 136002 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: CW magnetrons for RF heating or cooking applications |
|
BSI |
BS EN 122002 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: radio frequency coaxial connectors |
|
BSI |
BS CECC 22111 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: radio frequency coaxial connections, series SMA |
|
BSI |
BS EN 147101 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: relay sockets of assessed quality |
|
BSI |
BS EN 113001 |
Harmonized system of quality assessment for electronic components. Blank detail specification: camera tubes |
|
BSI |
BS EN 122001 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: radio frequency connectors (Type MIL-C-39012) |
|
BSI |
BS EN 136000 |
Harmonized system of quality assessment for electronic components: generic specification: magnetrons |
|
BSI |
BS CECC 96400 |
Harmonized system of quality assessment for electronic components. Sectional specification including blank detail specification: push-button switches |
|
BSI |
BS EN 130301 |
Harmonized System of Quality Assessment for Electronic Components, Blank Detail Specif |
|
BSI |
BS EN 138101 |
Harmonized System of Quality Assessment for Electronic Components. Blank Detail Specif |
|
BSI |
BS EN 169201 |
Harmonized System of Quality Assessment for Electronic Components. Blank Detail Specif |
|
BSI |
BS EN 133221 |
Harmonized System of Quality Assessment for Electronic Components. Blank Detail Specif |
|
BSI |
BS EN 167101 |
Harmonized System of Quality Assessment for Electronic Components. Blank Detail Specif |
|
BSI |
BS 166101 |
Harmonized System of Quality Assessment for Electronic Components. Blank Detail Specif |
|
BSI |
BS CECC 96200 |
Harmonized system of quality assessment for electronic components. Sectional specification including blank detail specification: lever switches |
|
BSI |
BS CECC 22121 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: radio frequency coaxial connectors, series BNC |
|
BSI |
BS EN 196103 |
Harmonized System of Quality Assessment for Electronic Components - Blank Detail Speci |
|
BSI |
BS CECC 96100 |
Harmonized system of quality assessment for electronic components. Sectional specification including blank detail specification: rotary switches |
|
BSI |
BS EN 111001 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: cathode ray tubes |
|
BSI |
BS CECC 96300 |
Harmonized system of quality assessment for electronic components. Sectional specification including blank detail specification: sensitive switches |
|
BSI |
BS CECC 45004 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: disc seal power tubes |
|
BSI |
BS CECC 40301 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Fixed precision resistors |
|
BSI |
BS EN 114001 |
Harmonized system of quality assessment for electronic components. Blank detail specification: photomultiplier tubes |
|
BSI |
BS CECC 41202 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: power potentiometers (assessment level M) |
|
BSI |
BS EN 111101 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Display storage tubes |
|
BSI |
BS EN 150011 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: case-rated thyristors |
|
BSI |
BS QC 300301 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 13001 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 18001 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 12001 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 14001 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 40202 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 40203 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 40104 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 40103 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 40102 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 40101 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 31701 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 64201 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 64101 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 31101 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 30901 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 30801 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 30701 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 30501 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 30302 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 30202 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 30301 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 31201 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 31501 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS EN 144001 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS EN 144002 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS EN 144003 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS EN 144004 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 31401 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS EN 132401 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 40201 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 30601 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 25401 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 35001 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 32201 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 31301 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 31801 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 30101 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 30201 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS EN 150010 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: ambient rated thyristors |
|
BSI |
BS CECC 41201 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: power potentiometers (assessment level S) |
|
BSI |
BS CECC 41102 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: preset potentiometers (assessment level M) |
|
BSI |
BS CECC 90114 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: programmable logic arrays (PLA) |
|
BSI |
BS EN 150007 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: case-rated bipolar transistors for high frequency amplification |
|
BSI |
BS EN 150003 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: case-rated bipolar transistors for low frequency amplification |
|
BSI |
BS EN 150009 |
Harmonized system of quality assessment for electronic components. Blank detail specification: case-rated rectifier diodes |
|
BSI |
BS CECC 46001 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: cold cathode indicator tubes |
|
BSI |
BS CECC 50009 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: case-rated rectifier diodes |
|
BSI |
BS CECC 42201 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Surge suppression varistors |
|
BSI |
BS EN 140202 |
Harmonized system of quality assessment for electronic components. Blank detail specification: fixed power resistors (Assessment level M) |
|
BSI |
BS CECC 31601 |
Specification for Harmonized System of Quality Assessment for Electronic Components. F |
|
BSI |
BS QC 300401 |
Specification for Harmonized System of Quality Assessment for Electronic Components. F |
|
BSI |
BS EN 123300-800 |
Specification for Harmonized System of Quality Assessment for Electronic Components. C |
|
BSI |
BS CECC 23300-003-91 |
Specification for Harmonized System of Quality Assessment for Electronic Components. C |
|
BSI |
BS QC 301201 |
Specification for Harmonized System of Quality Assessment for Electronic Components. F |
|
BSI |
BS EN 120006 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: pin-photodiodes for fibre optic applications |
|
BSI |
BS CECC 50008 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: ambient-rated rectifier diodes |
|
BSI |
BS EN 150008 |
Harmonized system of quality assessment for electronic components. Blank detail specification: ambient-rated rectifier diodes |
|
BSI |
BS EN 180101 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: fixed fibre optic attenuators |
|
BSI |
BS EN 168201 |
Harmonized system of quality assessment for electronic components. Blank detail specification. Quartz crystal units. (Qualification approval) |
|
BSI |
BS CECC 41101 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: preset potentiometers (assessment level S) |
|
BSI |
BS EN 150006 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Variable capacitance diode(s) |
|
BSI |
BS EN 120002 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: infrared emitting diodes, infrared emitting diode arrays |
|
BSI |
BS EN 150004 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: bipolar transistors for switching applications |
|
BSI |
BS EN 140203 |
Harmonized system of quality assessment for electronic components. Blank detail specification: fixed power resistors (Assessment level H) |
|
BSI |
BS CECC 00013 |
Harmonized System of Quality Assessment for Electronic Components: Basic Specification |
|
BSI |
BS EN 196403 |
Harmonized systems of quality assessment for electronic components. Blank detail specification: push button switches. Assessment level Y |
|
BSI |
BS CECC 00012 |
Harmonized System of Quality Assessment for Electronic Components: Basic Specification |
|
BSI |
BS CECC 00017 |
Harmonized System of Quality Assessment for Electronic Components. Basic Specification |
|
BSI |
BS EN 140201 |
Harmonized system of quality assessment for electronic components. Blank detail specification: fixed power resistors (Assessment level S) |
|
BSI |
BS CECC 90302 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: integrated voltage comparators |
|
BSI |
BS CECC 40302 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: fixed precision resistors (Assessment level F) |
|
BSI |
BS 9032 |
Rules for the preparation of detail specifications for pulsed magnetrons (excluding frequency-agile magnetrons) of assessed quality. Basic assessment level |
|
BSI |
BS EN 116501 |
Harmonized system of quality assessment for electronic components. Blank detail specification. Electromechanical all-or-nothing TELECOM relays of assessed quality |
|
BSI |
BS CECC 75201 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Interim example. Detail specification/blank detail specification. Circular connectors for frequencies below 3 MHz |
|
BSI |
BS CECC 90202 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: integrated operational amplifiers |
|
BSI |
BS EN 167100 |
Harmonized System of Quality Assessment for Electronic Components. Section Specificati |
|
BSI |
BS EN 150013 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: current regulator and current reference diodes |
|
BSI |
BS EN 150012 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: single gate field-effect transistors |
|
BSI |
BS CECC 30702 |
Specification for Harmonized System for Quality Assessment for Electronic Components. |
|
BSI |
BS CECC 90203 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: integrated analogue switching circuits |
|
BSI |
BS EN 150001 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: general purpose semiconductor diodes |
|
BSI |
BS CECC 75301 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Interim Example. Detail specification/blank detail specification: rectangular connectors for frequencies below 3 MHz |
|
BSI |
BS EN 168101 |
Harmonized system of quality assessment for electronic components. Blank detail specification: quartz crystal units (capability approval) |
|
BSI |
BS CECC 68101 |
HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS. BLANK DETAIL SPECIFICATION: QUARTZ CRYSTAL UNITS (CAPABILITY APPROVAL) |
|
BSI |
BS CECC 90201 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: integrated voltage regulators |
|
BSI |
BS EN 112001 |
Harmonized system of quality assessment for electronic components. Blank detail specification: image converter and image intensifier tubes |
|
BSI |
BS EN 120003 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Phototransistors, photodarlington transistors, phototransistor arrays |
|
BSI |
BS CECC 63101 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: film and hybrid integrated circuits |
|
BSI |
BS EN 129102 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: wirewound surface mounting inductors of assessed quality. Assessment level P |
|
BSI |
BS CECC 51001 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: mercury wetted change-over contact units, magnetically biased |
|
BSI |
BS QC 960401 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: electromechanical switches for use in electronic equipment. Blank detail specification for pushbutton switches |
|
BSI |
BS EN 129101 |
Harmonized system of quality assessment for electronic components. Blank detail specification: wirewound surface mounting inductors of assessed quality. Assessment level E |
|
BSI |
BS EN 140211 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: fixed power resistors. Capability approval |
|
BSI |
BS EN 160201 |
Harmonized system of quality assessment for electronic components. Blank detail specification. Microwave modular electronic units of assessed quality. Capability approval |
|
BSI |
BS CECC 90115 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: digital gate array integrated circuits |
|
BSI |
BS EN 187102 |
Harmonized System of Quality Assessment for Electronic Components. Family Specificatio |
|
BSI |
BS EN 187104 |
Harmonized System of Quality Assessment for Electronic Components, Family Specificatio |
|
BSI |
BS QC 960101 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: electromechanical switches for use in electronic equipment. Blank detail specification for rotary switches |
|
BSI |
BS EN 190110 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: digital microprocessor integrated circuits |
|
BSI |
BS EN 134102 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: multi turn concentric capacitors (qualification approval) |
|
BSI |
BS CECC 25300 |
Harmonized system of quality assessment for electronic components: sectional specification: magnetic oxide cores for power applications |
|
BSI |
BS QC 400202 |
Specification for harmonized system of quality assessment for electronic components. Fixed resistors for use in electronic equipment. Blank detail specification. Fixed power resistors. Assessment level F |
|
BSI |
BS QC 400201 |
Specification for harmonized system of quality assessment for electronic components. Fixed resistors for use in electronic equipment. Blank detail specification: fixed power resistors. Assessment level E |
|
BSI |
BS CECC 23300-003 |
Harmonized system of quality assessment for electronic components. Capability detail specification: multilayer printed boards |
|
BSI |
BS CECC 16101 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Electromechanical all-or-nothing relays. Test schedule 3 |
|
BSI |
BS CECC 41302 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: low power single turn rotary potentiometers (assessment level M) |
|
BSI |
BS 9940-03.01 |
Harmonized system of quality assessment for electronic components. Fixed resistors for use in electronic equipment. Blank detail specification: fixed precision resistors. Assessment level E |
|
BSI |
BS QC 400302 |
Specification for harmonized system of quality assessment for electronic components. Fixed resistors for use in electronic equipment. Blank detail specification. Fixed precision resistors. Assessment level F |
|
BSI |
BS EN 134101 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: single turn disc trimmer capacitors (qualification approval) |
|
BSI |
BS CECC 23300-801 |
Harmonized system of quality assessment for electronic components. Capability detail specification: multi-layer printed boards |
|
BSI |
BS EN 134104 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: compression type trimmer capacitors (qualification approval) |
|
BSI |
BS QC 960301 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: electromechanical switches for use in electronic equipment. Blank detail specification for sensitive switches |
|
BSI |
BS EN 169200 |
Harmonized System of Quality Assessment for Electronic Components. Sectional Specifica |
|
BSI |
BS EN 133200 |
Harmonized System of Quality Assessment for Electronic Components. Sectional Specifica |
|
BSI |
BS EN 187200 |
Harmonized System of Quality Assessment for Electronic Components. Sectional Specifica |
|
BSI |
BS EN 186210 |
Harmonized System of Quality Assessment for Electronic Components. Sectional Specifica |
|
BSI |
BS EN 138100 |
Harmonized System of Quality Assessment for Electronic Components, Sectional Specifica |
|
BSI |
BS CECC 30100 |
Harmonized System of Quality Assessment for Electronic Components. Sectional Specifica |
|
BSI |
BS EN 196500 |
Harmonized System of Quality Assessment for Electronic Components. Sectional Specifica |
|
BSI |
BS CECC 64200 |
Harmonized System of Quality Assessment for Electronic Components: Sectional Specifica |
|
BSI |
BS CECC 30200 |
Harmonized System of Quality Assessment for Electronic Components. Sectional Specifica |
|
BSI |
BS CECC 30300 |
Harmonized System of Quality Assessment for Electronic Components. Sectional Specifica |
|
BSI |
BS CECC 31200 |
Harmonized System of Quality Assessment for Electronic Components: Sectional Specifica |
|
BSI |
BS CECC 31300 |
Harmonized System of Quality Assessment for Electronic Components: Sectional Specifica |
|
BSI |
BS CECC 31400 |
Harmonized System of Quality Assessment for Electronic Components: Sectional Specifica |
|
BSI |
BS CECC 40400 |
Harmonized System of Quality Assessment for Electronic Components: Sectional Specifica |
|
BSI |
BS CECC 30900 |
Harmonized System of Quality Assessment for Electronic Components. Sectional Specifica |
|
BSI |
BS EN 130800 |
Harmonized System of Quality Assessment for Electronic Components. Sectional Specifica |
|
BSI |
BS EN 132400 |
Harmonized System of Quality Assessment for Electronic Components. Sectional Specifica |
|
BSI |
BS EN 186100 |
Harmonized System of Quality Assessment for Electronic Components. Sectional Specifica |
|
BSI |
BS EN 186170 |
Harmonized System of Quality Assessment for Electronic Components, Sectional Specifica |
|
BSI |
BS EN 186180 |
Harmonized System of Quality Assessment for Electronic Components. Sectional Specifica |
|
BSI |
BS CECC 30500 |
Harmonized System of Quality Assessment for Electronic Components. Sectional Specifica |
|
BSI |
BS CECC 30600 |
Harmonized System of Quality Assessment for Electronic Components: Sectional Specifica |
|
BSI |
BS CECC 30700 |
Harmonized System of Quality Assessment for Electronic Components. Sectional Specifica |
|
BSI |
BS CECC 30800 |
Harmonized System of Quality Assessment for Electronic Components. Sectional Specifica |
|
BSI |
BS CECC 31100 |
Harmonized System of Quality Assessment for Electronic Components: Sectional Specifica |
|
BSI |
BS CECC 64100 |
Harmonized System of Quality Assessment for Electronic Components: Sectional Specifica |
|
BSI |
BS CECC 40100 |
Harmonized System of Quality Assessment for Electronic Components: Sectional Specifica |
|
BSI |
BS CECC 40200 |
Harmonized System of Quality Assessment for Electronic Components: Sectional Specifica |
|
BSI |
BS CECC 17001 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Mercury wetted make contact units for general application |
|
BSI |
BS CECC 41301 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: low power single turn rotary potentiometers (assessment level S) |
|
BSI |
BS EN 134103 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: vane type air dielectric capacitors (qualification approval) |
|
BSI |
BS EN 100012 |
Harmonized system of quality assessment for electronic components. Basic specification. X-ray inspection of electronic components |
|
BSI |
BS EN 131200 |
Harmonized System of Quality Assessment for Electronic Components - Sectional Specific |
|
BSI |
BS QC 960501 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: electromechanical switches for use in electronic equipment. Blank detail specification for in-line package switches |
|
BSI |
BS QC 960201 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: electromechanical switches for use in electronic equipment. Blank detail specification for lever (toggle) switches |
|
BSI |
BS EN 171000 |
Harmonized System of Quality Assessment for Electronic Components. Generic Specificati |
|
BSI |
BS EN 119000 |
Harmonized System of Quality Assessment for Electronic Components. Generic Specificati |
|
BSI |
BS CECC 30000 |
Harmonized System of Quality Assessment for Electronic Components. Generic Specificati |
|
BSI |
BS EN 144000 |
Harmonized System of Quality Assessment for Electronic Components. Generic Specificati |
|
BSI |
BS EN 116000-2 |
Harmonized System of Quality Assessment for Electronic Components. Generic Specificati |
|
BSI |
BS EN 167000 |
Harmonized System of Quality Assessment for Electronic Components. Generic Specificati |
|
BSI |
BS CECC 52000 |
Harmonized System of Quality Assessment for Electronic Components. Generic Specificati |
|
BSI |
BS EN 196000 |
Harmonized System of Quality Assessment for Electronic Components. Generic Specificati |
|
BSI |
BS CECC 51000 |
Harmonized System of Quality Assessment for Electronic Components. Generic Specificati |
|
BSI |
BS CECC 41000 |
Harmonized System of Quality Assessment for Electronic Components: Generic Specificati |
|
BSI |
BS EN 130000 |
Harmonized System of Quality Assessment for Electronic Components. Generic Specificati |
|
BSI |
BS CECC 42000 |
Harmonized System of Quality Assessment for Electronic Components: Generic Specificati |
|
BSI |
BS EN 133000 |
Harmonized System of Quality Assessment for Electronic Components, Generic Specificati |
|
BSI |
BS CECC 64000 |
Harmonized System of Quality Assessment for Electronic Components: Generic Specificati |
|
BSI |
BS EN 168000 |
Harmonized System of Quality Assessment for Electronic Components. Generic Specificati |
|
BSI |
BS CECC 18000 |
Harmonized System of Quality Assessment for Electronic Components: Generic Specificati |
|
BSI |
BS EN 138000 |
Harmonized System of Quality Assessment for Electronic Components. Generic Specificati |
|
BSI |
BS CECC 12000 |
Harmonized System of Quality Assessment for Electronic Components. Generic Specificati |
|
BSI |
BS EN 143000 |
Harmonized System of Quality Assessment for Electronic Components: Generic Specificati |
|
BSI |
BS CECC 19000 |
Harmonized System of Quality Assessment for Electronic Components: Generic Specificati |
|
BSI |
BS QC 700000 |
Harmonized System of Quality Assessment for Electric Components. Generic Specification |
|
BSI |
BS EN 160101 |
Harmonized system of quality assessment for electronic components. Blank detail specification: printed board assembly modular electronic units of assessed quality. Capability approval |
|
BSI |
BS EN 140102 |
Harmonized system of quality assessment for electronic components. Blank detail specification: fixed low power non-wirewound resistors (assessment level M) |
|
BSI |
BS EN 120008 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: light emitting diodes and infrared emitting diodes for fibre optic system or sub-system |
|
BSI |
BS EN 120005 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Photodiodes, photodiode-arrays (not intended for fibre optic applications) |
|
BSI |
BS EN 135001 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: CW power amplifier travelling wave tubes up to 500 watts |
|
BSI |
BS EN 122120 |
Harmonized system of quality assessment for electronic components. Sectional specification: radio frequency coaxial connectors. Series BNC |
|
BSI |
BS CECC 41401 |
Specification for harmonized system of quality assessment for electronic conponents. Blank detail specification: rotary precision potentiometers (assessment level S) |
|
BSI |
BS CECC 90301 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: integrated line transmitters and receivers |
|
BSI |
BS EN 125100 |
Harmonized system of quality assessment for electronic components: sectional specification: magnetic oxide cores for inductor applications |
|
BSI |
BS EN 123000 |
Harmonized system of quality assessment for electronic components. Generic specification: printed boards |
|
BSI |
BS EN 122340 |
Harmonized system of quality assessment for electronic components. Sectional specification. Radio frequency coaxial connectors. Series MMCX |
|
BSI |
BS EN 140103 |
Harmonized system of quality assessment for electronic components. Blank detail specification. Fixed low power non-wirewound resistors (Assessment level P) |
|
BSI |
BS QC 410402 |
Specification for harmonized system of quality assessment for electronic components. Potentiometers for use in electronic equipment. Blank detail specification: rotary precision potentiometers. Assessment level E |
|
BSI |
BS EN 147100 |
Harmonized system of quality assessment for electronic components. Sectional specification: relay sockets of assessed quality |
|
BSI |
BS EN 122140 |
Harmonized system of quality assessment for electronic components. Sectional specification: radio frequency coaxial connectors. Series SMC |
|
BSI |
BS CECC 22110 |
Harmonized system of quality assessment for electronic components: sectional specification: radio frequency coaxial connectors, series SMA |
|
BSI |
BS EN 122110 |
Harmonized system of quality assessment for electronic components. Sectional specification: radio frequency coaxial connectors. Series SMA |
|
BSI |
BS EN 122130 |
Harmonized system of quality assessment for electronic components. Sectional specification: radio frequency coaxial connectors. Series SMB |
|
BSI |
BS EN 122160 |
Harmonized system of quality assessment for electronic components. Sectional specification: radio frequency coaxial connectors. Series SSMA |
|
BSI |
BS EN 122170 |
Harmonized system of quality assessment for electronic components. Sectional specification: radio frequency coaxial connectors. Series SSMB |
|
BSI |
BS EN 122180 |
Harmonized system of quality assessment for electronic components. Sectional specification. Radio frequency coaxial connectors. Series SSMC |
|
BSI |
BS EN 140402 |
Harmonized system of quality assessment for electronic components. Blank detail specification: fixed low power wire wound surface mounting (SMD) resistors |
|
BSI |
BS QC 750107 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Case-rated bipolar transistors for high-frequency amplifications |
|
BSI |
BS EN 122200 |
Harmonized system of quality assessment for electronic components. Sectional specification. Radio frequency coaxial connectors. Series TNC |
|
BSI |
BS EN 160000 |
Harmonized system of quality assessment for electronic components. Generic specification: modular electronic units |
|
BSI |
BS EN 169101 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: quartz crystal controlled oscillators (capability approval) |
|
BSI |
BS EN 120004 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Ambient rated photocouplers with phototransistor output |
|
BSI |
BS EN 122190 |
Harmonized system of quality assessment for electronic components. Sectional specification: radio frequency coaxial connectors. Series 7-16 |
|
BSI |
BS EN 150014 |
Harmonized system of quality assessment for electronic components. Blank detail specification: Thyristor diodes, transient overvoltage suppressors |
|
BSI |
BS EN 186005 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Connector for optical fibres and cables. Environmental category V |
|
BSI |
BS QC 790110 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits.Blank detail specification. Microprocessor integrated circuits |
|
BSI |
BS CECC 90111 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. MOS read/write static memories silicon monolithic circuits |
|
BSI |
BS EN 141101 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Lead-screw actuated and rotary preset potentiometers |
|
BSI |
BS CECC 31500 |
Harmonized System of Quality Assessment of Electronic Components. Sectional Specificat |
|
BSI |
BS EN 116203 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Electromechanical all-or-nothing relays for enhanced industrial application |
|
BSI |
BS EN 170000 |
Harmonized System of Quality Assessment for Eletronic Components - Generic Specificati |
|
BSI |
BS CECC 42101 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: low voltage varistors primarily for telephony applications (assessment level P) |
|
BSI |
BS QC 410204 |
Specification for harmonized system of quality assessment for electronic components. Potentiometers for use in electronic equipment. Blank detail specification: single-turn rotary power potentiometers. Assessment level F |
|
BSI |
BS QC 410203 |
Specification for harmonized system of quality assessment for electronic components. Potentiometers for use in electronic equipment. Blank detail specification: single-turn rotary power potentiometers. Assessment level E |
|
BSI |
BS EN 122150 |
Harmonized system of quality assessment for electronic components. Sectional specification: radio frequency coaxial connectors. Series EIA Flange |
|
BSI |
BS EN 113000 |
Harmonized system of quality assessment for electronic components. Generic specification: camera tubes |
|
BSI |
BS EN 186004 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Connector for optical fibres and cables. Environmental category IV |
|
BSI |
BS EN 186002 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Connector for optical fibres and cables. Environmental category II |
|
BSI |
BS EN 166101 |
Harmonized system of quality assessment for electronic components. Blank detail specification: surface acoustic wave (SAW) filters. Capability approval |
|
BSI |
BS CECC 75101 |
Specification for harmonized system of quality assessment for electronic components. Example detail specification/blank detail specification. Two-part and edge socket connectors for printed board application |
|
BSI |
BS EN 181000 |
Harmonized system of quality assessment for electronic components. Generic specification. Fibre optic branching devices |
|
BSI |
BS EN 123100-800 |
Harmonized System of Quality Assessment for Electronic Components. Capability Detail S |
|
BSI |
BS CESS 23100-801 |
Harmonized System of Quality Assessment for Electronic Components, Capability Detail S |
|
BSI |
BS EN 123200-800 |
Harmonized System of Quality Assessment for Electronic Components: Capability Detail S |
|
BSI |
BS QC 750103 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Case-rated bipolar transistors for low-frequency amplification |
|
BSI |
BS CECC 22000 |
Harmonized system of quality assessment for electronic components. Generic specification. Radio frequency coaxial connectors (Parts I, II and III) |
|
BSI |
BS EN 186003 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Connector for optical fibres and cables. Environmental category III |
|
BSI |
BS EN 186001 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Connectors for optical fibres and cables. Environmental category I |
|
BSI |
BS EN 150015 |
Harmonized system of quality assessment for electronic components. Blank detail specification: unidirectional transient overvoltage suppressor diodes |
|
BSI |
BS CECC 63201 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: film and hybrid integrated circuits (capability approval) |
|
BSI |
BS EN 129202 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: wirebound inductors with ceramic or ferrite core. Assessment level P |
|
BSI |
BS CECC 90112 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. MOS read/write dynamic memories silicon monolithic circuits |
|
BSI |
BS EN 188100 |
Harmonized system of quality assessment for electronic components. Sectional specification: single-mode (SM) optical fibre |
|
BSI |
BS 9925-03.01 |
Harmonized system of quality assessment for electronic components. Inductor and transformer cores for telecommunications. Blank detail specification: magnetic oxide cores for transformers and chokes for power applications. Assessment level A |
|
BSI |
BS EN 123500-800 |
Harmonized system of quality assessment for electronic components. Capability detail specification: flexible printed boards with through-connections |
|
BSI |
BS CECC 123500-003 |
Specification for harmonized system of quality assessment for electronic components. Capability detail specification: flexible printed boards with through-connections |
|
BSI |
BS EN 170101 |
Harmonized system of quality assessment for electronic components. Blank detail specification. Waveguide type dielectric resonators. Capability approval |
|
BSI |
BS EN 140104 |
Harmonized system of quality assessment for electronic components. Blank detail specification: fixed low power non-wirewound resistors (Assessment levels SB and SC) |
|
BSI |
BS EN 140000 |
Harmonized system of quality assessment for electronic components. Generic specification: fixed resistors |
|
BSI |
BS CECC 40000 |
Harmonized system of quality assessment for electronic components. Generic specification: fixed resistors |
|
BSI |
BS QC 410301 |
Specification for harmonized system of quality assessment for electronic components. Potentiometers for use in electronic equipment. Blank detail specification: single-turn rotary low-power potentiometers. Assessment level E |
|
BSI |
BS QC 410302 |
Specification for harmonized system of quality assessment for electronic components. Potentiometers for use in electronic equipment. Blank detail specification: single-turn rotary low-power potentiometers. Assessment level F |
|
BSI |
BS EN 175300 |
Harmonized system of quality assessment for electronic components. Sectional specification:rectangular connectors for frequencies below 3 MHz |
|
BSI |
BS EN 129201 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: wirewound inductors with ceramic or ferrite core. Assessment level E |
|
BSI |
BS EN 120007 |
Harmonized system of quality assessment for electronic components. Blank detail specification. Liquid crystal displays. Monochrome LCDs without electronic circuit |
|
BSI |
BS EN 131802 |
Harmonized system of quality assessment for electronic components. Blank detail specification: fixed polypropylene film dielectric metal foil d.c. capacitors. Assessment level EZ |
|
BSI |
BS QC 160101 |
Specification for harmonized system of quality assessment for electronic components. Electrical relays. Blank detail specification. Electromechanical all-or-nothing relays. Test schedules 1, 2 and 3 |
|
BSI |
BS EN 175200 |
Harmonized system of quality assessment for electronic components. Sectional specification: circular connectors |
|
BSI |
BS EN 123300 |
Specification for harmonized system of quality assessment for electronic components. Sectional specification. Multilayer printed boards |
|
BSI |
BS EN 116204 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Electromechanical all-or-nothing sealed relays for aggressive industrial application |
|
BSI |
BS QC 750104 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Bipolar transistors for switching applications |
|
BSI |
BS EN 125401 |
Harmonized system of quality assessment for electronic components. Blank detail specification. Adjusters used with magnetic oxide (ferrite) cores for use in inductors and tuned transformers |
|
BSI |
BS EN 111000 |
Harmonized system of quality assessment for electronic components. Generic specification: cathode ray tubes |
|
BSI |
BS EN 140200 |
Harmonized system of quality assessment for electronic components. Sectional specification: fixed power resistors |
|
BSI |
BS EN 123400-800 |
Harmonized system of quality assessment for electronic components. Capability detail specification: flexible printed boards without through-connections |
|
BSI |
BS CECC 123400-003 |
Specification for harmonized system of quality assessment for electronic components. Capability detail specification: flexible printed boards without through-connections |
|
BSI |
BS QC 301901 |
Specification for harmonized system of quality assessment for electronic components. Fixed capacitors for use in electronic equipment. Blank detail specification. Fixed multilayer ceramic chip capacitors. Assessment level E |
|
BSI |
BS CECC 96000 |
Harmonized system of quality assessment for electronic components. Generic specification: electromechanical switches |
|
BSI |
BS EN 111100 |
Harmonized system of quality assessment for electronic components: sectional specification: display storage tubes |
|
BSI |
BS CECC 40300 |
Harmonized system of quality assessment for electronic components: sectional specification: fixed precision resistors |
|
BSI |
BS EN 125000 |
Harmonized system of quality assessment for electronic components. Generic specification: cores made of ferrite materials |
|
BSI |
BS QC 720100 |
Harmonized system of quality assessment for electronic components. Semiconductor devices. Sectional specification for optoelectronic devices |
|
BSI |
BS EN 125200 |
Harmonized system of quality assessment for electronic components: sectional specification: magnetic oxide cores for linear transformers |
|
BSI |
BS 9940-01.01 |
Harmonized system of quality assessment for electronic components. Fixed resistors for use in electronic equipment. Blank detail specification: fixed low power non-wirewound resistors. Assessment level E |
|
BSI |
BS QC 400102 |
Specification for harmonized system of quality assessment for electronic components. Fixed resistors for use in electronic equipment. Blank detail specification. Fixed low-power non-wirewound resistors. Assessment level F |
|
BSI |
BS QC 750109 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Rectifier diodes (including avalanche rectifier diodes), ambient and case-rated, for currents greater than 100 A |
|
BSI |
BS QC 750102 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Ambient-rated bipolar transistors for low and high-frequency amplification |
|