BSI |
BS EN 129201 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: wirewound inductors with ceramic or ferrite core. Assessment level E |
|
BSI |
BS EN 129202 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: wirebound inductors with ceramic or ferrite core. Assessment level P |
|
BSI |
BS EN 129101 |
Harmonized system of quality assessment for electronic components. Blank detail specification: wirewound surface mounting inductors of assessed quality. Assessment level E |
|
BSI |
BS EN 129102 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: wirewound surface mounting inductors of assessed quality. Assessment level P |
|
BSI |
BS EN 129200 |
Harmonized system of quality assessment for electronic components. Sectional specification: fixed inductors with ceramic or ferrite core wound with copper wire for RF circuits |
|
BSI |
BS EN 140103 |
Harmonized system of quality assessment for electronic components. Blank detail specification. Fixed low power non-wirewound resistors (Assessment level P) |
|
BSI |
BS EN 140102 |
Harmonized system of quality assessment for electronic components. Blank detail specification: fixed low power non-wirewound resistors (assessment level M) |
|
BSI |
BS 9940-01.01 |
Harmonized system of quality assessment for electronic components. Fixed resistors for use in electronic equipment. Blank detail specification: fixed low power non-wirewound resistors. Assessment level E |
|
BSI |
BS QC 400102 |
Specification for harmonized system of quality assessment for electronic components. Fixed resistors for use in electronic equipment. Blank detail specification. Fixed low-power non-wirewound resistors. Assessment level F |
|
BSI |
BS EN 140104 |
Harmonized system of quality assessment for electronic components. Blank detail specification: fixed low power non-wirewound resistors (Assessment levels SB and SC) |
|
BSI |
BS EN 140201 |
Harmonized system of quality assessment for electronic components. Blank detail specification: fixed power resistors (Assessment level S) |
|
BSI |
BS EN 140203 |
Harmonized system of quality assessment for electronic components. Blank detail specification: fixed power resistors (Assessment level H) |
|
BSI |
BS EN 125401 |
Harmonized system of quality assessment for electronic components. Blank detail specification. Adjusters used with magnetic oxide (ferrite) cores for use in inductors and tuned transformers |
|
BSI |
BS EN 140202 |
Harmonized system of quality assessment for electronic components. Blank detail specification: fixed power resistors (Assessment level M) |
|
BSI |
BS CECC 40302 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: fixed precision resistors (Assessment level F) |
|
BSI |
BS CECC 41201 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: power potentiometers (assessment level S) |
|
BSI |
BS CECC 41202 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: power potentiometers (assessment level M) |
|
BSI |
BS CECC 41101 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: preset potentiometers (assessment level S) |
|
BSI |
BS QC 301901 |
Specification for harmonized system of quality assessment for electronic components. Fixed capacitors for use in electronic equipment. Blank detail specification. Fixed multilayer ceramic chip capacitors. Assessment level E |
|
BSI |
BS QC 400201 |
Specification for harmonized system of quality assessment for electronic components. Fixed resistors for use in electronic equipment. Blank detail specification: fixed power resistors. Assessment level E |
|
BSI |
BS CECC 41102 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: preset potentiometers (assessment level M) |
|
BSI |
BS EN 113001 |
Harmonized system of quality assessment for electronic components. Blank detail specification: camera tubes |
|
BSI |
BS 9940-03.01 |
Harmonized system of quality assessment for electronic components. Fixed resistors for use in electronic equipment. Blank detail specification: fixed precision resistors. Assessment level E |
|
BSI |
BS EN 129100 |
Harmonized system of quality assessment for electronic components. Sectional specification: wirewound surface mounting inductors |
|
BSI |
BS QC 400202 |
Specification for harmonized system of quality assessment for electronic components. Fixed resistors for use in electronic equipment. Blank detail specification. Fixed power resistors. Assessment level F |
|
BSI |
BS EN 196403 |
Harmonized systems of quality assessment for electronic components. Blank detail specification: push button switches. Assessment level Y |
|
BSI |
BS CECC 46001 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: cold cathode indicator tubes |
|
BSI |
BS CECC 96200 |
Harmonized system of quality assessment for electronic components. Sectional specification including blank detail specification: lever switches |
|
BSI |
BS EN 129000 |
Harmonized system of quality assessment for electronic components. Generic specification. Fixed RF wound inductors |
|
BSI |
BS CECC 90302 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: integrated voltage comparators |
|
BSI |
BS QC 400302 |
Specification for harmonized system of quality assessment for electronic components. Fixed resistors for use in electronic equipment. Blank detail specification. Fixed precision resistors. Assessment level F |
|
BSI |
BS EN 150011 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: case-rated thyristors |
|
BSI |
BS EN 180101 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: fixed fibre optic attenuators |
|
BSI |
BS EN 150010 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: ambient rated thyristors |
|
BSI |
BS CECC 40301 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Fixed precision resistors |
|
BSI |
BS EN 147101 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: relay sockets of assessed quality |
|
BSI |
BS CECC 42201 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Surge suppression varistors |
|
BSI |
BS EN 167101 |
Harmonized System of Quality Assessment for Electronic Components. Blank Detail Specif |
|
BSI |
BS EN 130301 |
Harmonized System of Quality Assessment for Electronic Components, Blank Detail Specif |
|
BSI |
BS EN 138101 |
Harmonized System of Quality Assessment for Electronic Components. Blank Detail Specif |
|
BSI |
BS EN 169201 |
Harmonized System of Quality Assessment for Electronic Components. Blank Detail Specif |
|
BSI |
BS EN 133221 |
Harmonized System of Quality Assessment for Electronic Components. Blank Detail Specif |
|
BSI |
BS 166101 |
Harmonized System of Quality Assessment for Electronic Components. Blank Detail Specif |
|
BSI |
BS EN 150001 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: general purpose semiconductor diodes |
|
BSI |
BS CECC 90202 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: integrated operational amplifiers |
|
BSI |
BS CECC 90201 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: integrated voltage regulators |
|
BSI |
BS EN 111001 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: cathode ray tubes |
|
BSI |
BS EN 196103 |
Harmonized System of Quality Assessment for Electronic Components - Blank Detail Speci |
|
BSI |
BS EN 140402 |
Harmonized system of quality assessment for electronic components. Blank detail specification: fixed low power wire wound surface mounting (SMD) resistors |
|
BSI |
BS EN 111101 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Display storage tubes |
|
BSI |
BS QC 300203 |
Specification for harmonized system of quality assessment for electronic components. Fixed capacitors for use in electronic equipment. Blank detail specification: fixed tantalum capacitors with non-solid electrolyte and foil electrode. Assessment level E |
|
BSI |
BS EN 122002 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: radio frequency coaxial connectors |
|
BSI |
BS QC 410402 |
Specification for harmonized system of quality assessment for electronic components. Potentiometers for use in electronic equipment. Blank detail specification: rotary precision potentiometers. Assessment level E |
|
BSI |
BS QC 300201 |
Specification for harmonized system of quality assessment for electronic components. Fixed capacitors for use in electronic equipment. Blank detail specification: fixed tantalum capacitors with solid electrolyte and porous anode. Assessment level E |
|
BSI |
BS CECC 45004 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: disc seal power tubes |
|
BSI |
BS CECC 90114 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: programmable logic arrays (PLA) |
|
BSI |
BS CECC 63101 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: film and hybrid integrated circuits |
|
BSI |
BS EN 150013 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: current regulator and current reference diodes |
|
BSI |
BS QC 420101 |
SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS. VARISTORS FOR USE IN ELECTRONIC EQUIPMENT BLANK DETAIL SPECIFICATION SILICON CARBIDE SURGE SUPPRESSION VARISTORS ASSESSMENT LEVEL E |
|
BSI |
BS EN 150012 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: single gate field-effect transistors |
|
BSI |
BS CECC 41401 |
Specification for harmonized system of quality assessment for electronic conponents. Blank detail specification: rotary precision potentiometers (assessment level S) |
|
BSI |
BS EN 150009 |
Harmonized system of quality assessment for electronic components. Blank detail specification: case-rated rectifier diodes |
|
BSI |
BS CECC 50009 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: case-rated rectifier diodes |
|
BSI |
BS EN 114001 |
Harmonized system of quality assessment for electronic components. Blank detail specification: photomultiplier tubes |
|
BSI |
BS 9925-03.01 |
Harmonized system of quality assessment for electronic components. Inductor and transformer cores for telecommunications. Blank detail specification: magnetic oxide cores for transformers and chokes for power applications. Assessment level A |
|
BSI |
BS CECC 30801 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 31701 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 64201 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 64101 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 31101 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 30901 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 30701 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 14001 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 13001 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 12001 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS QC 300301 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 40201 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 30302 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 35001 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS EN 144001 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS EN 144002 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS EN 144003 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS EN 144004 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 31401 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 31201 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 40203 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 40202 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 31301 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 30501 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 30601 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 18001 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 32201 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 31501 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 31801 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 25401 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 40104 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 40103 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 40102 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 40101 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 30301 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 30202 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS EN 132401 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 30201 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 30101 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS QC 300202 |
Specification for harmonized system of quality assessment for electronic components. Fixed capacitors for use in electronic equipment. Blank detail specification: fixed tantalum capacitors with non-solid electrolyte and porous anode. Assessment level E |
|
BSI |
BS CECC 96100 |
Harmonized system of quality assessment for electronic components. Sectional specification including blank detail specification: rotary switches |
|
BSI |
BS CECC 50008 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: ambient-rated rectifier diodes |
|
BSI |
BS EN 168201 |
Harmonized system of quality assessment for electronic components. Blank detail specification. Quartz crystal units. (Qualification approval) |
|
BSI |
BS EN 150008 |
Harmonized system of quality assessment for electronic components. Blank detail specification: ambient-rated rectifier diodes |
|
BSI |
BS EN 120002 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: infrared emitting diodes, infrared emitting diode arrays |
|
BSI |
BS QC 960201 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: electromechanical switches for use in electronic equipment. Blank detail specification for lever (toggle) switches |
|
BSI |
BS CECC 96300 |
Harmonized system of quality assessment for electronic components. Sectional specification including blank detail specification: sensitive switches |
|
BSI |
BS EN 112001 |
Harmonized system of quality assessment for electronic components. Blank detail specification: image converter and image intensifier tubes |
|
BSI |
BS QC 790110 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits.Blank detail specification. Microprocessor integrated circuits |
|
BSI |
BS EN 150004 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: bipolar transistors for switching applications |
|
BSI |
BS QC 720104 |
Harmonized system of quality assessment for electronic components. Semiconductor devices. Optoelectronic devices. Blank detail specification for pin-FET modules with/without pigtail, for fibre optic systems or subsystems |
|
BSI |
BS CECC 23300-003-91 |
Specification for Harmonized System of Quality Assessment for Electronic Components. C |
|
BSI |
BS QC 301201 |
Specification for Harmonized System of Quality Assessment for Electronic Components. F |
|
BSI |
BS CECC 31601 |
Specification for Harmonized System of Quality Assessment for Electronic Components. F |
|
BSI |
BS EN 123300-800 |
Specification for Harmonized System of Quality Assessment for Electronic Components. C |
|
BSI |
BS QC 300401 |
Specification for Harmonized System of Quality Assessment for Electronic Components. F |
|
BSI |
BS CECC 90115 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: digital gate array integrated circuits |
|
BSI |
BS CECC 90301 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: integrated line transmitters and receivers |
|
BSI |
BS EN 130501 |
Harmonized system of quality assessment for electronic components. Blank detail specification: fixed metallized polycarbonate film dielectric capacitors for direct current. Assessment level E |
|
BSI |
BS QC 790111 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification: integrated circuit static read/write memories |
|
BSI |
BS CECC 41301 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: low power single turn rotary potentiometers (assessment level S) |
|
BSI |
BS EN 120004 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Ambient rated photocouplers with phototransistor output |
|
BSI |
BS CECC 96400 |
Harmonized system of quality assessment for electronic components. Sectional specification including blank detail specification: push-button switches |
|
BSI |
BS CECC 90203 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: integrated analogue switching circuits |
|
BSI |
BS CECC 00012 |
Harmonized System of Quality Assessment for Electronic Components: Basic Specification |
|
BSI |
BS CECC 00017 |
Harmonized System of Quality Assessment for Electronic Components. Basic Specification |
|
BSI |
BS CECC 00013 |
Harmonized System of Quality Assessment for Electronic Components: Basic Specification |
|
BSI |
BS EN 150006 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Variable capacitance diode(s) |
|
BSI |
BS CECC 41302 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: low power single turn rotary potentiometers (assessment level M) |
|
BSI |
BS QC 720105 |
Harmonized system of quality assessment for electronic components. Semiconductor devices. Optoelectronic devices. Blank detail specification for pin-photodiodes with/without pigtail, for fibre optic systems or subsystems |
|
BSI |
BS EN 140211 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: fixed power resistors. Capability approval |
|
BSI |
BS EN 120003 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Phototransistors, photodarlington transistors, phototransistor arrays |
|
BSI |
BS CECC 42101 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: low voltage varistors primarily for telephony applications (assessment level P) |
|
BSI |
BS EN 122001 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: radio frequency connectors (Type MIL-C-39012) |
|
BSI |
BS CECC 22121 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: radio frequency coaxial connectors, series BNC |
|
BSI |
BS QC 410203 |
Specification for harmonized system of quality assessment for electronic components. Potentiometers for use in electronic equipment. Blank detail specification: single-turn rotary power potentiometers. Assessment level E |
|
BSI |
BS EN 120008 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: light emitting diodes and infrared emitting diodes for fibre optic system or sub-system |
|
BSI |
BS EN 136002 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: CW magnetrons for RF heating or cooking applications |
|
BSI |
BS EN 134104 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: compression type trimmer capacitors (qualification approval) |
|
BSI |
BS EN 131802 |
Harmonized system of quality assessment for electronic components. Blank detail specification: fixed polypropylene film dielectric metal foil d.c. capacitors. Assessment level EZ |
|
BSI |
BS EN 167100 |
Harmonized System of Quality Assessment for Electronic Components. Section Specificati |
|
BSI |
BS QC 790202 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Monolithic integrated operational amplifiers |
|
BSI |
BS QC 300901 |
Harmonized system of quality assessment for electronic components. Fixed capacitors for use in electronic equipment. Blank detail specification. Fixed polystyrene film dielectric metal foil d.c. capacitors. Assessment level E |
|
BSI |
BS EN 186001 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Connectors for optical fibres and cables. Environmental category I |
|
BSI |
BS EN 131701 |
Harmonized system of quality assessment for electronic components. Blank detail specification: fixed capacitors for direct current with electrodes of thin metal foils and a polycarbonate film dielectric. Assessment level E |
|
BSI |
BS QC 301701 |
Harmonized system of quality assessment for electronic components. Fixed capacitors for use in electronic equipment. Blank detail specification. Fixed polycarbonate film dielectric metal foil d.c. capacitors. Assessment level E |
|
BSI |
BS QC 300501 |
Specification for harmonized system of quality assessment for electronic components. Fixed capacitors for use in electronic equipment. Blank detail specification: fixed metallized polycarbonate film dielectric d.c. capacitors. Assessment level E |
|
BSI |
BS CECC 90112 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. MOS read/write dynamic memories silicon monolithic circuits |
|
BSI |
BS EN 120006 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: pin-photodiodes for fibre optic applications |
|
BSI |
BS EN 125000 |
Harmonized system of quality assessment for electronic components. Generic specification: cores made of ferrite materials |
|
BSI |
BS QC 960101 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: electromechanical switches for use in electronic equipment. Blank detail specification for rotary switches |
|
BSI |
BS EN 134102 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: multi turn concentric capacitors (qualification approval) |
|
BSI |
BS EN 134103 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: vane type air dielectric capacitors (qualification approval) |
|
BSI |
BS EN 190110 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: digital microprocessor integrated circuits |
|
BSI |
BS EN 130502 |
Harmonized system of quality assessment for electronic components. Blank detail specification: fixed metallized polycarbonate film dielectric capacitors for direct current. Assessment level EZ |
|
BSI |
BS CECC 68101 |
HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS. BLANK DETAIL SPECIFICATION: QUARTZ CRYSTAL UNITS (CAPABILITY APPROVAL) |
|
BSI |
BS EN 168101 |
Harmonized system of quality assessment for electronic components. Blank detail specification: quartz crystal units (capability approval) |
|
BSI |
BS QC 410204 |
Specification for harmonized system of quality assessment for electronic components. Potentiometers for use in electronic equipment. Blank detail specification: single-turn rotary power potentiometers. Assessment level F |
|
BSI |
BS QC 410301 |
Specification for harmonized system of quality assessment for electronic components. Potentiometers for use in electronic equipment. Blank detail specification: single-turn rotary low-power potentiometers. Assessment level E |
|
BSI |
BS CECC 30702 |
Specification for Harmonized System for Quality Assessment for Electronic Components. |
|
BSI |
BS QC 790107 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Digital integrated circuits. Blank detail specification. Integrated circuit dynamic read/write memories |
|
BSI |
BS QC 960301 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: electromechanical switches for use in electronic equipment. Blank detail specification for sensitive switches |
|
BSI |
BS EN 116501 |
Harmonized system of quality assessment for electronic components. Blank detail specification. Electromechanical all-or-nothing TELECOM relays of assessed quality |
|
BSI |
BS EN 131702 |
Harmonized system of quality assessment for electronic components. Blank detail specification: fixed capacitors for direct current with electrodes of thin metal foils and a polycarbonate film dielectric. Assessment level EZ |
|
BSI |
BS QC 750104 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Bipolar transistors for switching applications |
|
BSI |
BS QC 720100 |
Harmonized system of quality assessment for electronic components. Semiconductor devices. Sectional specification for optoelectronic devices |
|
BSI |
BS QC 960401 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: electromechanical switches for use in electronic equipment. Blank detail specification for pushbutton switches |
|
BSI |
BS QC 960501 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: electromechanical switches for use in electronic equipment. Blank detail specification for in-line package switches |
|
BSI |
BS EN 141101 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Lead-screw actuated and rotary preset potentiometers |
|
BSI |
BS CECC 90111 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. MOS read/write static memories silicon monolithic circuits |
|
BSI |
BS EN 100012 |
Harmonized system of quality assessment for electronic components. Basic specification. X-ray inspection of electronic components |
|
BSI |
BS QC 410302 |
Specification for harmonized system of quality assessment for electronic components. Potentiometers for use in electronic equipment. Blank detail specification: single-turn rotary low-power potentiometers. Assessment level F |
|
BSI |
BS EN 130201 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: fixed tantalum capacitors with solid electrolyte, porous anode (sub-family 3) |
|
BSI |
BS QC 410102 |
Specification for harmonized system of quality assessment for electronic components. Potentiometers for use in electronic equipment. Blank detail specification: lead-screw actuated and rotary preset potentiometers. Assessment level F |
|
BSI |
BS EN 187102 |
Harmonized System of Quality Assessment for Electronic Components. Family Specificatio |
|
BSI |
BS EN 187104 |
Harmonized System of Quality Assessment for Electronic Components, Family Specificatio |
|
BSI |
BS EN 134101 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: single turn disc trimmer capacitors (qualification approval) |
|
BSI |
BS EN 186004 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Connector for optical fibres and cables. Environmental category IV |
|
BSI |
BS EN 186002 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Connector for optical fibres and cables. Environmental category II |
|
BSI |
BS 9940-04.01 |
Harmonized system of quality assessment for electronic components. Fixed resistors for use in electronic equipment. Blank detail specification: fixed resistor networks with individually measurable resistors all of equal value and equal dissipation. Assessment level E |
|
BSI |
BS EN 169101 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: quartz crystal controlled oscillators (capability approval) |
|
BSI |
BS EN 186003 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Connector for optical fibres and cables. Environmental category III |
|
BSI |
BS CECC 50000 |
Harmonized system of quality assessment for electronic components. Generic specification: discrete semiconductor devices |
|
BSI |
BS EN 125100 |
Harmonized system of quality assessment for electronic components: sectional specification: magnetic oxide cores for inductor applications |
|
BSI |
BS 9940-01.0 |
Harmonized system of quality assessment for electronic components. Fixed resistors for use in electronic equipment. Sectional specification: fixed low power non-wirewound resistors |
|
BSI |
BS EN 150014 |
Harmonized system of quality assessment for electronic components. Blank detail specification: Thyristor diodes, transient overvoltage suppressors |
|
BSI |
BS EN 186005 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Connector for optical fibres and cables. Environmental category V |
|
BSI |
BS EN 170101 |
Harmonized system of quality assessment for electronic components. Blank detail specification. Waveguide type dielectric resonators. Capability approval |
|
BSI |
BS EN 150003 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: case-rated bipolar transistors for low frequency amplification |
|
BSI |
BS 9940-05.01 |
Harmonized system of quality assessment for electronic components. Fixed resistors for use in electronic equipment. Blank detail specification: fixed resistor networks in which not all resistors are individually measurable. Assessment level E |
|
BSI |
BS EN 116203 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Electromechanical all-or-nothing relays for enhanced industrial application |
|
BSI |
BS 9925-0 |
Harmonized system of quality assessment for electronic components. Inductor and transformer cores for telecommunications. Generic specification |
|
BSI |
BS EN 130202 |
Harmonized system of quality assessment for electronic components. Blank detail specification: fixed tantalum capacitors with non-solid electrolyte, porous anode (sub-family 2) |
|
BSI |
BS EN 160201 |
Harmonized system of quality assessment for electronic components. Blank detail specification. Microwave modular electronic units of assessed quality. Capability approval |
|
BSI |
BS QC 720106 |
Harmonized system of quality assessment for electronic components. Semiconductor devices. Optoelectronic devices. Blank detail specification for avalanche photodiodes (APDs) with/without pigtail, for fibre optic systems or subsystems |
|
BSI |
BS EN 175200 |
Harmonized system of quality assessment for electronic components. Sectional specification: circular connectors |
|
BSI |
BS EN 120007 |
Harmonized system of quality assessment for electronic components. Blank detail specification. Liquid crystal displays. Monochrome LCDs without electronic circuit |
|
BSI |
BS CECC 75201 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Interim example. Detail specification/blank detail specification. Circular connectors for frequencies below 3 MHz |
|
BSI |
BS QC 750001 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Signal diodes, switching diodes and controlled avalanche diodes |
|
BSI |
BS EN 122003 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification for the preparation of customer detail specifications (CDS) and detail specifications for standard production items with capability approval |
|
BSI |
BS CECC 17001 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Mercury wetted make contact units for general application |
|
BSI |
BS CECC 63201 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: film and hybrid integrated circuits (capability approval) |
|
BSI |
BS EN 116502 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: electromechanical all-or-nothing TELECOM relays of assessed quality, dual-in-line, with 20mm x 10mm base |
|
BSI |
BS EN 116503 |
Harmonized system of quality assessment for electronic components. Blank detail specification: electromechanical all-or-nothing TELECOM relays of assessed quality, dual-in-line, with 14mm x 9mm base |
|
BSI |
BS CECC 22111 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: radio frequency coaxial connections, series SMA |
|
BSI |
BS EN 150007 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: case-rated bipolar transistors for high frequency amplification |
|
BSI |
BS CECC 40000 |
Harmonized system of quality assessment for electronic components. Generic specification: fixed resistors |
|
BSI |
BS EN 140000 |
Harmonized system of quality assessment for electronic components. Generic specification: fixed resistors |
|
BSI |
BS EN 120001 |
Harmonized system of quality assessment for electronic components. Blank detail specification. Light emitting diodes, light emitting diode arrays, light emitting diode displays without internal logic and resistor |
|
BSI |
BS EN 136001 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: pulsed magnetrons (excluding frequency agile magnetrons) |
|
BSI |
BS EN 166101 |
Harmonized system of quality assessment for electronic components. Blank detail specification: surface acoustic wave (SAW) filters. Capability approval |
|
BSI |
BS CECC 64200 |
Harmonized System of Quality Assessment for Electronic Components: Sectional Specifica |
|
BSI |
BS CECC 31400 |
Harmonized System of Quality Assessment for Electronic Components: Sectional Specifica |
|
BSI |
BS EN 186210 |
Harmonized System of Quality Assessment for Electronic Components. Sectional Specifica |
|
BSI |
BS CECC 30600 |
Harmonized System of Quality Assessment for Electronic Components: Sectional Specifica |
|
BSI |
BS CECC 30500 |
Harmonized System of Quality Assessment for Electronic Components. Sectional Specifica |
|
BSI |
BS CECC 31200 |
Harmonized System of Quality Assessment for Electronic Components: Sectional Specifica |
|
BSI |
BS CECC 31300 |
Harmonized System of Quality Assessment for Electronic Components: Sectional Specifica |
|
BSI |
BS CECC 40400 |
Harmonized System of Quality Assessment for Electronic Components: Sectional Specifica |
|
BSI |
BS CECC 30300 |
Harmonized System of Quality Assessment for Electronic Components. Sectional Specifica |
|
BSI |
BS CECC 30100 |
Harmonized System of Quality Assessment for Electronic Components. Sectional Specifica |
|
BSI |
BS EN 130800 |
Harmonized System of Quality Assessment for Electronic Components. Sectional Specifica |
|
BSI |
BS CECC 40200 |
Harmonized System of Quality Assessment for Electronic Components: Sectional Specifica |
|
BSI |
BS EN 133200 |
Harmonized System of Quality Assessment for Electronic Components. Sectional Specifica |
|
BSI |
BS EN 187200 |
Harmonized System of Quality Assessment for Electronic Components. Sectional Specifica |
|
BSI |
BS EN 132400 |
Harmonized System of Quality Assessment for Electronic Components. Sectional Specifica |
|
BSI |
BS CECC 30200 |
Harmonized System of Quality Assessment for Electronic Components. Sectional Specifica |
|
BSI |
BS CECC 40100 |
Harmonized System of Quality Assessment for Electronic Components: Sectional Specifica |
|
BSI |
BS CECC 30700 |
Harmonized System of Quality Assessment for Electronic Components. Sectional Specifica |
|
BSI |
BS EN 186100 |
Harmonized System of Quality Assessment for Electronic Components. Sectional Specifica |
|
BSI |
BS CECC 30900 |
Harmonized System of Quality Assessment for Electronic Components. Sectional Specifica |
|
BSI |
BS CECC 30800 |
Harmonized System of Quality Assessment for Electronic Components. Sectional Specifica |
|
BSI |
BS EN 186180 |
Harmonized System of Quality Assessment for Electronic Components. Sectional Specifica |
|
BSI |
BS EN 196500 |
Harmonized System of Quality Assessment for Electronic Components. Sectional Specifica |
|
BSI |
BS EN 169200 |
Harmonized System of Quality Assessment for Electronic Components. Sectional Specifica |
|
BSI |
BS EN 186170 |
Harmonized System of Quality Assessment for Electronic Components, Sectional Specifica |
|
BSI |
BS CECC 64100 |
Harmonized System of Quality Assessment for Electronic Components: Sectional Specifica |
|
BSI |
BS CECC 31100 |
Harmonized System of Quality Assessment for Electronic Components: Sectional Specifica |
|
BSI |
BS EN 138100 |
Harmonized System of Quality Assessment for Electronic Components, Sectional Specifica |
|
BSI |
BS EN 120005 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Photodiodes, photodiode-arrays (not intended for fibre optic applications) |
|
BSI |
BS CECC 75101 |
Specification for harmonized system of quality assessment for electronic components. Example detail specification/blank detail specification. Two-part and edge socket connectors for printed board application |
|
BSI |
BS CECC 75301 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Interim Example. Detail specification/blank detail specification: rectangular connectors for frequencies below 3 MHz |
|
BSI |
BS EN 143003 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: directly heated negative temperature coefficient thermistors (disc type) |
|
BSI |
BS QC 790130 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. HCMOS digital integrated circuits (series 54/74 HC, 54/74 HCT, 54/74 HCU) |
|
BSI |
BS CECC 23300-801 |
Harmonized system of quality assessment for electronic components. Capability detail specification: multi-layer printed boards |
|
IEC |
IEC 61253-2-1 |
Piezoelectric ceramic resonators - A specification in the IEC quality assessment system for electronic components (IECQ) - Part 2: Sectional specification - Qualification approval - Section 1: Blank detail specification - Assessment level E |
|
BSI |
BS EN 143004 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: directly heated negative temperature coefficient thermistors (rod type) |
|
BSI |
BS EN 131200 |
Harmonized System of Quality Assessment for Electronic Components - Sectional Specific |
|
BSI |
BS CECC 18000 |
Harmonized System of Quality Assessment for Electronic Components: Generic Specificati |
|
BSI |
BS CECC 42000 |
Harmonized System of Quality Assessment for Electronic Components: Generic Specificati |
|
BSI |
BS EN 167000 |
Harmonized System of Quality Assessment for Electronic Components. Generic Specificati |
|
BSI |
BS EN 144000 |
Harmonized System of Quality Assessment for Electronic Components. Generic Specificati |
|
BSI |
BS CECC 19000 |
Harmonized System of Quality Assessment for Electronic Components: Generic Specificati |
|
BSI |
BS EN 143000 |
Harmonized System of Quality Assessment for Electronic Components: Generic Specificati |
|
BSI |
BS EN 196000 |
Harmonized System of Quality Assessment for Electronic Components. Generic Specificati |
|
BSI |
BS CECC 52000 |
Harmonized System of Quality Assessment for Electronic Components. Generic Specificati |
|
BSI |
BS CECC 30000 |
Harmonized System of Quality Assessment for Electronic Components. Generic Specificati |
|
BSI |
BS EN 171000 |
Harmonized System of Quality Assessment for Electronic Components. Generic Specificati |
|
BSI |
BS EN 168000 |
Harmonized System of Quality Assessment for Electronic Components. Generic Specificati |
|
BSI |
BS CECC 41000 |
Harmonized System of Quality Assessment for Electronic Components: Generic Specificati |
|
BSI |
BS EN 119000 |
Harmonized System of Quality Assessment for Electronic Components. Generic Specificati |
|
BSI |
BS QC 700000 |
Harmonized System of Quality Assessment for Electric Components. Generic Specification |
|
BSI |
BS CECC 51000 |
Harmonized System of Quality Assessment for Electronic Components. Generic Specificati |
|
BSI |
BS EN 116000-2 |
Harmonized System of Quality Assessment for Electronic Components. Generic Specificati |
|
BSI |
BS CECC 12000 |
Harmonized System of Quality Assessment for Electronic Components. Generic Specificati |
|
BSI |
BS EN 138000 |
Harmonized System of Quality Assessment for Electronic Components. Generic Specificati |
|
BSI |
BS EN 133000 |
Harmonized System of Quality Assessment for Electronic Components, Generic Specificati |
|
BSI |
BS CECC 64000 |
Harmonized System of Quality Assessment for Electronic Components: Generic Specificati |
|
BSI |
BS EN 130000 |
Harmonized System of Quality Assessment for Electronic Components. Generic Specificati |
|
BSI |
BS EN 143002 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: directly heated negative temperature coefficient thermistors (beads in envelopes) |
|
BSI |
BS CECC 16101 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Electromechanical all-or-nothing relays. Test schedule 3 |
|
BSI |
BS EN 125400 |
Harmonized system of quality assessment for electronic components: sectional specification: adjusters used with magnetic oxide cores for use in inductors and tuned transformers |
|
BSI |
BS EN 180000 |
Harmonized system of quality assessment for electronic components. Generic specification: Fibre optic attenuators |
|
BSI |
BS CECC 23300-003 |
Harmonized system of quality assessment for electronic components. Capability detail specification: multilayer printed boards |
|
BSI |
BS EN 120000 |
Harmonized system of quality assessment for electronic components. General specification: semiconductor optoelectronic and liquid crystal devices |
|
BSI |
BS QC 300600 |
Harmonized system of quality assessment for electronic components. Fixed capacitors for use in electronic equipment. Sectional specification for fixed capacitors of ceramic dielectric, class 1 |
|
BSI |
BS QC 300700 |
Harmonized system of quality assessment for electronic components. Fixed capacitors for use in electronic equipment. Sectional specification for fixed capacitors of ceramic dielectric, class 2 |
|
BSI |
BS EN 135001 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: CW power amplifier travelling wave tubes up to 500 watts |
|
BSI |
BS EN 132100 |
Harmonized system of quality assessment for electronic components. Sectional specification: fixed mulitlayer ceramic surface mounting capacitors. Assessment levels EZ and DZ |
|
BSI |
BS QC 790303 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Linear digital-to-analogue converters (DAC) |
|
BSI |
BS QC 790304 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Linear analogue-to-digital converters (ADC) |
|
BSI |
BS QC 750103 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Case-rated bipolar transistors for low-frequency amplification |
|
BSI |
BS QC 750112 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Semiconductor devices. Discrete devices. Field-effect transistors. Blank detail specification for single-gate field-effect transistors, up to 5 W and 1 GHz |
|
BSI |
BS EN 136000 |
Harmonized system of quality assessment for electronic components: generic specification: magnetrons |
|
BSI |
BS EN 113000 |
Harmonized system of quality assessment for electronic components. Generic specification: camera tubes |
|
BSI |
BS EN 150015 |
Harmonized system of quality assessment for electronic components. Blank detail specification: unidirectional transient overvoltage suppressor diodes |
|
BSI |
BS EN 116204 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Electromechanical all-or-nothing sealed relays for aggressive industrial application |
|
BSI |
BS EN 186006-1 |
Harmonized system of quality assessment for electronic components. Blank detail specification. Connectors for optical fibres and cables for military use. Environmental category VI |
|
BSI |
BS QC 750114 |
Harmonized system of quality assessment for electronic components. Semiconductor devices. Discrete devices. Field-effect transistors. Blank detail specification for case-rated field-effect transistors for switching applications |
|