BSI |
BS EN 122003 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification for the preparation of customer detail specifications (CDS) and detail specifications for standard production items with capability approval |
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BSI |
BS CECC 68101 |
HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS. BLANK DETAIL SPECIFICATION: QUARTZ CRYSTAL UNITS (CAPABILITY APPROVAL) |
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BSI |
BS EN 168101 |
Harmonized system of quality assessment for electronic components. Blank detail specification: quartz crystal units (capability approval) |
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BSI |
BS EN 140211 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: fixed power resistors. Capability approval |
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BSI |
BS CECC 63201 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: film and hybrid integrated circuits (capability approval) |
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BSI |
BS EN 160101 |
Harmonized system of quality assessment for electronic components. Blank detail specification: printed board assembly modular electronic units of assessed quality. Capability approval |
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BSI |
BS EN 160201 |
Harmonized system of quality assessment for electronic components. Blank detail specification. Microwave modular electronic units of assessed quality. Capability approval |
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BSI |
BS EN 134104 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: compression type trimmer capacitors (qualification approval) |
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BSI |
BS EN 166101 |
Harmonized system of quality assessment for electronic components. Blank detail specification: surface acoustic wave (SAW) filters. Capability approval |
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BSI |
BS EN 168201 |
Harmonized system of quality assessment for electronic components. Blank detail specification. Quartz crystal units. (Qualification approval) |
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BSI |
BS EN 169101 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: quartz crystal controlled oscillators (capability approval) |
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BSI |
BS EN 123500-800 |
Harmonized system of quality assessment for electronic components. Capability detail specification: flexible printed boards with through-connections |
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BSI |
BS CECC 123500-003 |
Specification for harmonized system of quality assessment for electronic components. Capability detail specification: flexible printed boards with through-connections |
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BSI |
BS EN 170101 |
Harmonized system of quality assessment for electronic components. Blank detail specification. Waveguide type dielectric resonators. Capability approval |
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BSI |
BS EN 134101 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: single turn disc trimmer capacitors (qualification approval) |
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BSI |
BS EN 113001 |
Harmonized system of quality assessment for electronic components. Blank detail specification: camera tubes |
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BSI |
BS EN 134102 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: multi turn concentric capacitors (qualification approval) |
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BSI |
BS EN 134103 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: vane type air dielectric capacitors (qualification approval) |
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BSI |
BS QC 760201 |
Harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification for film integrated circuits and hybrid film integrated circuits on the basis of the capability approval procedures |
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BSI |
BS EN 123400-800 |
Harmonized system of quality assessment for electronic components. Capability detail specification: flexible printed boards without through-connections |
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BSI |
BS CECC 123400-003 |
Specification for harmonized system of quality assessment for electronic components. Capability detail specification: flexible printed boards without through-connections |
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BSI |
BS EN 150011 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: case-rated thyristors |
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BSI |
BS CECC 23300-003 |
Harmonized system of quality assessment for electronic components. Capability detail specification: multilayer printed boards |
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BSI |
BS CECC 23800-801 |
Harmonized system of quality assessment for electronic components. Capability detail specification: flexible multilayer printed boards with through connections |
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BSI |
BS CECC 23300-801 |
Harmonized system of quality assessment for electronic components. Capability detail specification: multi-layer printed boards |
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BSI |
BS CECC 23100-801 |
Harmonized system of quality assessment for electronic components. Capability detail specification: single and double-sided printed boards with plain holes |
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BSI |
BS CECC 23100-003 |
Harmonized system of quality assessment for electronic components. Capability detail specification: single and double sided printed boards with plain holes |
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BSI |
BS CECC 23600-801 |
Harmonized system of quality assessment for electronic components. Capability detail specification: flex-rigid multilayer printed boards with through connections |
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BSI |
BS CECC 45004 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: disc seal power tubes |
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BSI |
BS CECC 23200-801 |
Harmonized system of quality assessment for electronic components. Capability detail specification: single and double-sided printed boards with plated through holes |
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BSI |
BS CECC 23200-003 |
Harmonized system of quality assessment for electronic components. Capability detail specification: single and double sided printed boards with plated through holes |
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BSI |
BS CECC 68100 |
Harmonized system of quality assessment for electronic components. Sectional specification: quartz crystal units (capability approval) |
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BSI |
BS EN 150010 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: ambient rated thyristors |
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BSI |
BS CECC 40301 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Fixed precision resistors |
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BSI |
BS EN 168100 |
Harmonized system of quality assessment for electronic components. Sectional specification: quartz crystal units (capability approval) |
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BSI |
BS CECC 23700-801 |
Harmonized system of quality assessment for electronic components. Capability detail specification: flex-rigid double-sided printed boards with through connections |
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BSI |
BS EN 140210 |
Harmonized system of quality assessment for electronic components. Sectional specification: fixed power resistors. Capability approval |
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BSI |
BS EN 111001 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: cathode ray tubes |
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BSI |
BS EN 137101 |
Harmonized system of quality assessment for electronic components. Blank detail specification. Fixed aluminium electrolytic a.c. capacitors with non-solid electrolyte for motor starter applications (Qualification approval) |
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BSI |
BS CECC 50009 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: case-rated rectifier diodes |
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BSI |
BS EN 114001 |
Harmonized system of quality assessment for electronic components. Blank detail specification: photomultiplier tubes |
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BSI |
BS EN 150009 |
Harmonized system of quality assessment for electronic components. Blank detail specification: case-rated rectifier diodes |
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IEC |
IEC 61178-2-1 |
Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 2: Sectional specification - Capability approval - Section 1: Blank detail specification |
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BSI |
BS EN 111101 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Display storage tubes |
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BSI |
BS EN 147101 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: relay sockets of assessed quality |
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BSI |
BS CECC 46001 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: cold cathode indicator tubes |
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BSI |
BS CECC 42201 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Surge suppression varistors |
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BSI |
BS CECC 90302 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: integrated voltage comparators |
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BSI |
BS CECC 63200 |
Harmonized system of quality assessment for electronic components: sectional specification: film and hybrid integrated circuits (capability approval) |
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BSI |
BS EN 150008 |
Harmonized system of quality assessment for electronic components. Blank detail specification: ambient-rated rectifier diodes |
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BSI |
BS CECC 50008 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: ambient-rated rectifier diodes |
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BSI |
BS EN 150006 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Variable capacitance diode(s) |
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BSI |
BS CECC 41101 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: preset potentiometers (assessment level S) |
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BSI |
BS EN 134000 |
Harmonized system of quality assessment for electronic components. Generic specification: variable capacitors. (Qualification approval and capability approval) |
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BSI |
BS EN 112001 |
Harmonized system of quality assessment for electronic components. Blank detail specification: image converter and image intensifier tubes |
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BSI |
BS EN 150004 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: bipolar transistors for switching applications |
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BSI |
BS QC 760101 |
Harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification for film integrated circuits and hybrid film integrated circuits on the basis of qualification approval procedures |
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BSI |
BS CECC 41201 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: power potentiometers (assessment level S) |
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BSI |
BS CECC 41102 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: preset potentiometers (assessment level M) |
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BSI |
BS CECC 96200 |
Harmonized system of quality assessment for electronic components. Sectional specification including blank detail specification: lever switches |
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BSI |
BS CECC 63101 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: film and hybrid integrated circuits |
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BSI |
BS EN 129202 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: wirebound inductors with ceramic or ferrite core. Assessment level P |
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BSI |
BS EN 167101 |
Harmonized System of Quality Assessment for Electronic Components. Blank Detail Specif |
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BSI |
BS EN 133221 |
Harmonized System of Quality Assessment for Electronic Components. Blank Detail Specif |
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BSI |
BS EN 169201 |
Harmonized System of Quality Assessment for Electronic Components. Blank Detail Specif |
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BSI |
BS EN 130301 |
Harmonized System of Quality Assessment for Electronic Components, Blank Detail Specif |
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BSI |
BS 166101 |
Harmonized System of Quality Assessment for Electronic Components. Blank Detail Specif |
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BSI |
BS EN 138101 |
Harmonized System of Quality Assessment for Electronic Components. Blank Detail Specif |
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BSI |
BS CECC 41202 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: power potentiometers (assessment level M) |
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BSI |
BS CECC 40302 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: fixed precision resistors (Assessment level F) |
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BSI |
BS EN 120006 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: pin-photodiodes for fibre optic applications |
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BSI |
BS CECC 90202 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: integrated operational amplifiers |
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BSI |
BS EN 129201 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: wirewound inductors with ceramic or ferrite core. Assessment level E |
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BSI |
BS EN 140201 |
Harmonized system of quality assessment for electronic components. Blank detail specification: fixed power resistors (Assessment level S) |
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BSI |
BS EN 140203 |
Harmonized system of quality assessment for electronic components. Blank detail specification: fixed power resistors (Assessment level H) |
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BSI |
BS CECC 90114 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: programmable logic arrays (PLA) |
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BSI |
BS EN 196403 |
Harmonized systems of quality assessment for electronic components. Blank detail specification: push button switches. Assessment level Y |
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BSI |
BS EN 136002 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: CW magnetrons for RF heating or cooking applications |
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BSI |
BS EN 150013 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: current regulator and current reference diodes |
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BSI |
BS EN 196103 |
Harmonized System of Quality Assessment for Electronic Components - Blank Detail Speci |
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BSI |
BS EN 160100 |
Harmonized system of quality assessment for electronic components. Sectional specification: capability approval of manufacturers of printed board assemblies of assessed quality |
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BSI |
BS EN 140202 |
Harmonized system of quality assessment for electronic components. Blank detail specification: fixed power resistors (Assessment level M) |
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BSI |
BS CECC 96100 |
Harmonized system of quality assessment for electronic components. Sectional specification including blank detail specification: rotary switches |
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BSI |
BS CECC 96400 |
Harmonized system of quality assessment for electronic components. Sectional specification including blank detail specification: push-button switches |
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BSI |
BS QC 760200 |
Harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Sectional specification for film integrated circuits and hybrid film integrated circuits on the basis of the capability approval procedures |
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BSI |
BS CECC 96300 |
Harmonized system of quality assessment for electronic components. Sectional specification including blank detail specification: sensitive switches |
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BSI |
BS CECC 75101 |
Specification for harmonized system of quality assessment for electronic components. Example detail specification/blank detail specification. Two-part and edge socket connectors for printed board application |
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BSI |
BS CECC 90301 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: integrated line transmitters and receivers |
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BSI |
BS EN 160200-1 |
Harmonized system of quality assessment for electronic components. Sectional specification. Microwave modular electronic units of assessed quality. Capability approval procedure |
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BSI |
BS EN 120004 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Ambient rated photocouplers with phototransistor output |
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BSI |
BS EN 150001 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: general purpose semiconductor diodes |
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BSI |
BS EN 169100 |
Harmonized system of quality assessment for electronic components. Sectional specification: quartz crystal controlled oscillators (capability approval) |
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BSI |
BS CECC 90203 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: integrated analogue switching circuits |
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BSI |
BS QC 030000 |
Harmonized system of quality assessment for electronic components. Rectangular connectors for frequencies below 3 MHz. Generic specification. General requirements and guide for the preparation of detail specifications for connectors with assessed quality |
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BSI |
BS EN 134100 |
Harmonized system of quality assessment for electronic components. Sectional specification: variable capacitors (Qualification approval) |
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BSI |
BS EN 180101 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: fixed fibre optic attenuators |
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BSI |
BS CECC 90201 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: integrated voltage regulators |
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BSI |
BS EN 120003 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Phototransistors, photodarlington transistors, phototransistor arrays |
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BSI |
BS EN 129102 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: wirewound surface mounting inductors of assessed quality. Assessment level P |
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BSI |
BS EN 120007 |
Harmonized system of quality assessment for electronic components. Blank detail specification. Liquid crystal displays. Monochrome LCDs without electronic circuit |
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BSI |
BS EN 168200 |
Harmonized system of quality assessment for electronic components. Sectional specification: quartz crystal units (qualification approval) |
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BSI |
BS CECC 90115 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: digital gate array integrated circuits |
|
IEC |
IEC 61178-3-1 |
Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 3: Sectional specification - Qualification approval - Section 1: Blank detail specification |
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BSI |
BS QC 300203 |
Specification for harmonized system of quality assessment for electronic components. Fixed capacitors for use in electronic equipment. Blank detail specification: fixed tantalum capacitors with non-solid electrolyte and foil electrode. Assessment level E |
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BSI |
BS EN 125401 |
Harmonized system of quality assessment for electronic components. Blank detail specification. Adjusters used with magnetic oxide (ferrite) cores for use in inductors and tuned transformers |
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