BSI |
BS CECC 90105 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: fusible link programmable bipolar read only memories, silicon monolithic integrated circuits |
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BSI |
BS QC 790105 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Integrated circuit fusible-link programmable bipolar read-only memories |
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BSI |
BS CECC 90113 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. MOS ultra-violet light erasable electrically programmable read only memories silicon monolithic circuits |
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BSI |
BS CECC 90111 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. MOS read/write static memories silicon monolithic circuits |
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BSI |
BS CECC 90112 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. MOS read/write dynamic memories silicon monolithic circuits |
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BSI |
BS QC 790106 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Digital integrated circuits. Blank detail specification. MOS ultraviolet light erasable electrically programmable read-only memories |
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BSI |
BS QC 790111 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification: integrated circuit static read/write memories |
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BSI |
BS QC 790107 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Digital integrated circuits. Blank detail specification. Integrated circuit dynamic read/write memories |
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BSI |
BS QC 790202 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Monolithic integrated operational amplifiers |
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BSI |
BS CECC 63101 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: film and hybrid integrated circuits |
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BSI |
BS EN 190110 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: digital microprocessor integrated circuits |
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BSI |
BS EN 190000 |
Harmonized system of quality assessment for electronic components. Generic specification: monolithic integrated circuits |
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BSI |
BS CECC 90000 |
Harmonized system of quality assessment for electronic components. Generic specification: monolithic integrated circuits |
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BSI |
BS QC 790110 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits.Blank detail specification. Microprocessor integrated circuits |
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BSI |
BS CECC 90115 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: digital gate array integrated circuits |
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BSI |
BS CECC 90203 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: integrated analogue switching circuits |
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BSI |
BS CECC 90114 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: programmable logic arrays (PLA) |
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BSI |
BS EN 190100 |
Harmonized system of quality assessment for electronic components: sectional specification: digital monolithic integrated circuits |
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BSI |
BS CECC 90300 |
Harmonized system of quality assessment for electronic components. Sectional specification: interface monolithic integrated circuits |
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BSI |
BS QC 790132 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Bipolar monolithic digital integrated circuit gates (excluding uncommitted logic arrays) |
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BSI |
BS CECC 90200 |
Harmonized system of quality assessment for electronic components: sectional specification: analogue monolithic integrated circuits |
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BSI |
BS CECC 63201 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: film and hybrid integrated circuits (capability approval) |
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BSI |
BS CECC 90201 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: integrated voltage regulators |
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BSI |
BS CECC 90301 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: integrated line transmitters and receivers |
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BSI |
BS CECC 90302 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: integrated voltage comparators |
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BSI |
BS CECC 90202 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: integrated operational amplifiers |
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BSI |
BS QC 790130 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. HCMOS digital integrated circuits (series 54/74 HC, 54/74 HCT, 54/74 HCU) |
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BSI |
BS EN 190116 |
Harmonized system of quality assessment for electronic components. Family specification: AC MOS digital integrated circuits |
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BSI |
BS QC 790131 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Complementary MOS digital integrated circuits (series 4000 B and 4000 UB) |
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BSI |
BS QC 790304 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Linear analogue-to-digital converters (ADC) |
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BSI |
BS QC 790303 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Linear digital-to-analogue converters (DAC) |
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BSI |
BS EN 190109 |
Specification for harmonized system of quality assessment for electronic components. Family specification: digital integrated HC MOS circuits series HC/HCT/HCU |
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BSI |
BS CECC 90109 |
Specification for harmonized system of quality assessment for electronic components. Family specification. Digital integrated HC MOS circuits series HC/HCT/HCU |
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BSI |
BS CECC 50009 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: case-rated rectifier diodes |
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BSI |
BS EN 150009 |
Harmonized system of quality assessment for electronic components. Blank detail specification: case-rated rectifier diodes |
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BSI |
BS EN 150008 |
Harmonized system of quality assessment for electronic components. Blank detail specification: ambient-rated rectifier diodes |
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BSI |
BS CECC 50008 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: ambient-rated rectifier diodes |
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BSI |
BS QC 760101 |
Harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification for film integrated circuits and hybrid film integrated circuits on the basis of qualification approval procedures |
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BSI |
BS CECC 90104 |
Specification for harmonized system of quality assessment for electronic components. Family specification: C. MOS digital integrated circuits series 4000 B and 4000 UB |
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BSI |
BS EN 147101 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: relay sockets of assessed quality |
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BSI |
BS EN 160101 |
Harmonized system of quality assessment for electronic components. Blank detail specification: printed board assembly modular electronic units of assessed quality. Capability approval |
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BSI |
BS EN 150011 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: case-rated thyristors |
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BSI |
BS QC 760201 |
Harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification for film integrated circuits and hybrid film integrated circuits on the basis of the capability approval procedures |
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BSI |
BS CECC 75201 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Interim example. Detail specification/blank detail specification. Circular connectors for frequencies below 3 MHz |
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BSI |
BS EN 113001 |
Harmonized system of quality assessment for electronic components. Blank detail specification: camera tubes |
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BSI |
BS CECC 40301 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Fixed precision resistors |
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BSI |
BS EN 150010 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: ambient rated thyristors |
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BSI |
BS EN 111001 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: cathode ray tubes |
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BSI |
BS EN 150003 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: case-rated bipolar transistors for low frequency amplification |
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BSI |
BS CECC 63100 |
Harmonized system of quality assessment for electronic components: sectional specification: film and hybrid integrated circuits |
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BSI |
BS EN 150004 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: bipolar transistors for switching applications |
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BSI |
BS EN 190107 |
Specification for harmonized system of quality assessment for electronic components. Family specification. TTL FAST digital integrated circuits series 54 F, 74 F |
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BSI |
BS CECC 63000 |
Harmonized system of quality assessment for electronic components. Generic specification: film and hybrid integrated circuits |
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BSI |
BS QC 760000 |
Harmonized system of quality assessment for electronic components. Film and hybrid film integrated circuits. Generic specification |
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BSI |
BS CECC 46001 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: cold cathode indicator tubes |
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BSI |
BS EN 140202 |
Harmonized system of quality assessment for electronic components. Blank detail specification: fixed power resistors (Assessment level M) |
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BSI |
BS CECC 40302 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: fixed precision resistors (Assessment level F) |
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BSI |
BS EN 190101 |
Specification for harmonized system of quality assessment for electronic components. Family specification: digital integrated TTL circuits series 54, 64, 74, 84 |
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BSI |
BS CECC 90101 |
Specification for harmonized system of quality assessment for electronic components. Family specification: digital integrated TTL circuits, series 54, 64, 74, 84 |
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IEC |
IEC 60748-2-7 |
Semiconductor devices. Integrated circuits - Part 2: Digital integrated circuits - Section seven: Blank detail specification for integrated circuit fusible-link programmable bipolar read-only memories |
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BSI |
BS EN 150007 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: case-rated bipolar transistors for high frequency amplification |
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