BSI |
BS CECC 20000 |
Harmonized system of quality assessment for electronic components: generic specification: semiconductor optoelectronic and liquid crystal devices |
|
BSI |
BS EN 120000 |
Harmonized system of quality assessment for electronic components. General specification: semiconductor optoelectronic and liquid crystal devices |
|
BSI |
BS QC 720100 |
Harmonized system of quality assessment for electronic components. Semiconductor devices. Sectional specification for optoelectronic devices |
|
BSI |
BS CECC 50000 |
Harmonized system of quality assessment for electronic components. Generic specification: discrete semiconductor devices |
|
BSI |
BS EN 181000 |
Harmonized system of quality assessment for electronic components. Generic specification. Fibre optic branching devices |
|
BSI |
BS EN 153000 |
Harmonized system of quality assessment for electronic components. Generic specification: discrete pressure contact power semiconductor devices (qualification approval) |
|
BSI |
BS QC 790100 |
Harmonized System of Quality Assessment for Electric Components. Semiconductor Devices |
|
BSI |
BS EN 150001 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: general purpose semiconductor diodes |
|
BSI |
BS CECC 64000 |
Harmonized System of Quality Assessment for Electronic Components: Generic Specificati |
|
BSI |
BS EN 171000 |
Harmonized System of Quality Assessment for Electronic Components. Generic Specificati |
|
BSI |
BS EN 143000 |
Harmonized System of Quality Assessment for Electronic Components: Generic Specificati |
|
BSI |
BS EN 196000 |
Harmonized System of Quality Assessment for Electronic Components. Generic Specificati |
|
BSI |
BS CECC 51000 |
Harmonized System of Quality Assessment for Electronic Components. Generic Specificati |
|
BSI |
BS EN 167000 |
Harmonized System of Quality Assessment for Electronic Components. Generic Specificati |
|
BSI |
BS CECC 52000 |
Harmonized System of Quality Assessment for Electronic Components. Generic Specificati |
|
BSI |
BS CECC 12000 |
Harmonized System of Quality Assessment for Electronic Components. Generic Specificati |
|
BSI |
BS CECC 30000 |
Harmonized System of Quality Assessment for Electronic Components. Generic Specificati |
|
BSI |
BS EN 119000 |
Harmonized System of Quality Assessment for Electronic Components. Generic Specificati |
|
BSI |
BS EN 168000 |
Harmonized System of Quality Assessment for Electronic Components. Generic Specificati |
|
BSI |
BS EN 116000-2 |
Harmonized System of Quality Assessment for Electronic Components. Generic Specificati |
|
BSI |
BS CECC 19000 |
Harmonized System of Quality Assessment for Electronic Components: Generic Specificati |
|
BSI |
BS CECC 18000 |
Harmonized System of Quality Assessment for Electronic Components: Generic Specificati |
|
BSI |
BS CECC 41000 |
Harmonized System of Quality Assessment for Electronic Components: Generic Specificati |
|
BSI |
BS EN 138000 |
Harmonized System of Quality Assessment for Electronic Components. Generic Specificati |
|
BSI |
BS QC 700000 |
Harmonized System of Quality Assessment for Electric Components. Generic Specification |
|
BSI |
BS EN 130000 |
Harmonized System of Quality Assessment for Electronic Components. Generic Specificati |
|
BSI |
BS EN 133000 |
Harmonized System of Quality Assessment for Electronic Components, Generic Specificati |
|
BSI |
BS CECC 42000 |
Harmonized System of Quality Assessment for Electronic Components: Generic Specificati |
|
BSI |
BS EN 144000 |
Harmonized System of Quality Assessment for Electronic Components. Generic Specificati |
|
BSI |
BS EN 169000 |
Harmonized system of quality assessment for electronic components. Generic specification. Quartz crystal controlled oscillators |
|
BSI |
BS EN 129000 |
Harmonized system of quality assessment for electronic components. Generic specification. Fixed RF wound inductors |
|
BSI |
BS EN 136000 |
Harmonized system of quality assessment for electronic components: generic specification: magnetrons |
|
BSI |
BS EN 113000 |
Harmonized system of quality assessment for electronic components. Generic specification: camera tubes |
|
BSI |
BS EN 140000 |
Harmonized system of quality assessment for electronic components. Generic specification: fixed resistors |
|
BSI |
BS CECC 40000 |
Harmonized system of quality assessment for electronic components. Generic specification: fixed resistors |
|
BSI |
BS 9925-0 |
Harmonized system of quality assessment for electronic components. Inductor and transformer cores for telecommunications. Generic specification |
|
BSI |
BS CECC 96000 |
Harmonized system of quality assessment for electronic components. Generic specification: electromechanical switches |
|
BSI |
BS EN 180000 |
Harmonized system of quality assessment for electronic components. Generic specification: Fibre optic attenuators |
|
BSI |
BS QC 300401 |
Specification for Harmonized System of Quality Assessment for Electronic Components. F |
|
BSI |
BS EN 123300-800 |
Specification for Harmonized System of Quality Assessment for Electronic Components. C |
|
BSI |
BS CECC 31601 |
Specification for Harmonized System of Quality Assessment for Electronic Components. F |
|
BSI |
BS QC 301201 |
Specification for Harmonized System of Quality Assessment for Electronic Components. F |
|
BSI |
BS CECC 23300-003-91 |
Specification for Harmonized System of Quality Assessment for Electronic Components. C |
|
BSI |
BS EN 170000 |
Harmonized System of Quality Assessment for Eletronic Components - Generic Specificati |
|
BSI |
BS EN 167100 |
Harmonized System of Quality Assessment for Electronic Components. Section Specificati |
|
BSI |
BS EN 160000 |
Harmonized system of quality assessment for electronic components. Generic specification: modular electronic units |
|
BSI |
BS EN 111000 |
Harmonized system of quality assessment for electronic components. Generic specification: cathode ray tubes |
|
BSI |
BS CECC 18001 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 35001 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 32201 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 31801 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 31101 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 30901 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 30801 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 30701 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 40202 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 40203 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 30301 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 30202 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 30201 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 30101 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 12001 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 13001 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 14001 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 25401 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 31701 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 40101 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 64201 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 40104 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 64101 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 40102 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 40103 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 31501 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 31201 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 30501 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 30302 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 40201 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 30601 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS EN 132401 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 31401 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 31301 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS EN 144004 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS QC 300301 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS EN 144003 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS EN 144002 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS EN 144001 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS EN 123000 |
Harmonized system of quality assessment for electronic components. Generic specification: printed boards |
|
BSI |
BS CECC 46000 |
Harmonized system of quality assessment for electronic components: generic specification: cold cathode indicator tubes |
|
BSI |
BS CECC 45000 |
Specification for harmonized system of quality assessment for electronic components: generic specification: space-charge controlled tubes |
|
BSI |
BS CECC 00013 |
Harmonized System of Quality Assessment for Electronic Components: Basic Specification |
|
BSI |
BS CECC 00017 |
Harmonized System of Quality Assessment for Electronic Components. Basic Specification |
|
BSI |
BS CECC 00012 |
Harmonized System of Quality Assessment for Electronic Components: Basic Specification |
|
BSI |
BS CECC 30702 |
Specification for Harmonized System for Quality Assessment for Electronic Components. |
|
BSI |
BS QC 790110 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits.Blank detail specification. Microprocessor integrated circuits |
|
BSI |
BS EN 100015-1 |
Basic specification. Protection of electrostatic sensitive devices. Harmonized system of quality assessment for electronic components. Basic specification: protection of electrostatic sensitive devices. General requirements |
|
BSI |
BS EN 112000 |
Harmonized system of quality assessment for electronic components. Generic specification: image converter and image intensifier tubes |
|
BSI |
BS CECC 40400 |
Harmonized System of Quality Assessment for Electronic Components: Sectional Specifica |
|
BSI |
BS CECC 30300 |
Harmonized System of Quality Assessment for Electronic Components. Sectional Specifica |
|
BSI |
BS CECC 30900 |
Harmonized System of Quality Assessment for Electronic Components. Sectional Specifica |
|
BSI |
BS EN 186210 |
Harmonized System of Quality Assessment for Electronic Components. Sectional Specifica |
|
BSI |
BS CECC 30800 |
Harmonized System of Quality Assessment for Electronic Components. Sectional Specifica |
|
BSI |
BS CECC 64200 |
Harmonized System of Quality Assessment for Electronic Components: Sectional Specifica |
|
BSI |
BS CECC 31100 |
Harmonized System of Quality Assessment for Electronic Components: Sectional Specifica |
|
BSI |
BS CECC 30200 |
Harmonized System of Quality Assessment for Electronic Components. Sectional Specifica |
|
BSI |
BS CECC 30700 |
Harmonized System of Quality Assessment for Electronic Components. Sectional Specifica |
|
BSI |
BS CECC 30100 |
Harmonized System of Quality Assessment for Electronic Components. Sectional Specifica |
|
BSI |
BS EN 187200 |
Harmonized System of Quality Assessment for Electronic Components. Sectional Specifica |
|
BSI |
BS EN 132400 |
Harmonized System of Quality Assessment for Electronic Components. Sectional Specifica |
|
BSI |
BS CECC 64100 |
Harmonized System of Quality Assessment for Electronic Components: Sectional Specifica |
|
BSI |
BS CECC 40100 |
Harmonized System of Quality Assessment for Electronic Components: Sectional Specifica |
|
BSI |
BS CECC 40200 |
Harmonized System of Quality Assessment for Electronic Components: Sectional Specifica |
|
BSI |
BS EN 133200 |
Harmonized System of Quality Assessment for Electronic Components. Sectional Specifica |
|
BSI |
BS EN 130800 |
Harmonized System of Quality Assessment for Electronic Components. Sectional Specifica |
|
BSI |
BS EN 138100 |
Harmonized System of Quality Assessment for Electronic Components, Sectional Specifica |
|
BSI |
BS EN 169200 |
Harmonized System of Quality Assessment for Electronic Components. Sectional Specifica |
|
BSI |
BS EN 186100 |
Harmonized System of Quality Assessment for Electronic Components. Sectional Specifica |
|
BSI |
BS EN 186170 |
Harmonized System of Quality Assessment for Electronic Components, Sectional Specifica |
|
BSI |
BS EN 186180 |
Harmonized System of Quality Assessment for Electronic Components. Sectional Specifica |
|
BSI |
BS EN 196500 |
Harmonized System of Quality Assessment for Electronic Components. Sectional Specifica |
|
BSI |
BS CECC 30500 |
Harmonized System of Quality Assessment for Electronic Components. Sectional Specifica |
|
BSI |
BS CECC 30600 |
Harmonized System of Quality Assessment for Electronic Components: Sectional Specifica |
|
BSI |
BS CECC 31200 |
Harmonized System of Quality Assessment for Electronic Components: Sectional Specifica |
|
BSI |
BS CECC 31300 |
Harmonized System of Quality Assessment for Electronic Components: Sectional Specifica |
|
BSI |
BS CECC 31400 |
Harmonized System of Quality Assessment for Electronic Components: Sectional Specifica |
|
BSI |
BS CECC 63000 |
Harmonized system of quality assessment for electronic components. Generic specification: film and hybrid integrated circuits |
|
BSI |
BS QC 760000 |
Harmonized system of quality assessment for electronic components. Film and hybrid film integrated circuits. Generic specification |
|
BSI |
BS EN 114000 |
Harmonized system of quality assessment for electronic components: generic specification: photomultiplier tubes |
|
BSI |
BS QC 790109 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits.Family specification for HCMOS digital integrated circuits series 54/74 HC, 54/74 HCT, 54/74 HCU |
|
BSI |
BS EN 131200 |
Harmonized System of Quality Assessment for Electronic Components - Sectional Specific |
|
BSI |
BS QC 720104 |
Harmonized system of quality assessment for electronic components. Semiconductor devices. Optoelectronic devices. Blank detail specification for pin-FET modules with/without pigtail, for fibre optic systems or subsystems |
|
BSI |
BS QC 720105 |
Harmonized system of quality assessment for electronic components. Semiconductor devices. Optoelectronic devices. Blank detail specification for pin-photodiodes with/without pigtail, for fibre optic systems or subsystems |
|
BSI |
BS QC 790104 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Family specification. Complementary MOS digital integrated circuits, series 4000 B and 4000 UB |
|
BSI |
BS EN 125000 |
Harmonized system of quality assessment for electronic components. Generic specification: cores made of ferrite materials |
|
BSI |
BS EN 175200 |
Harmonized system of quality assessment for electronic components. Sectional specification: circular connectors |
|
BSI |
BS EN 168200 |
Harmonized system of quality assessment for electronic components. Sectional specification: quartz crystal units (qualification approval) |
|
BSI |
BS EN 186270 |
Harmonized system of quality assessment for electronic components. Sectional specification: connector sets for optical fibres and cables. Type LSH |
|
BSI |
BS EN 186220 |
Harmonized system of quality assessment for electronic components. Sectional specification: Connector sets for optical fibres and cables. Type LSC |
|
BSI |
BS EN 186230 |
Harmonized system of quality assessment for electronic components. Sectional specification: connector sets for optical fibres and cables. Type LSF |
|
BSI |
BS EN 186130 |
Harmonized system of quality assessment for electronic components. Sectional specification. Connector sets for optical fibres and cables. Type LSA |
|
BSI |
BS EN 134000 |
Harmonized system of quality assessment for electronic components. Generic specification: variable capacitors. (Qualification approval and capability approval) |
|
BSI |
BS QC 750001 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Signal diodes, switching diodes and controlled avalanche diodes |
|
BSI |
BS EN 186110 |
Harmonized system of quality assessment for electronic components. Sectional specification: connector sets for optical fibres and cables. Type FC |
|
BSI |
BS EN 186260 |
Harmonized system of quality assessment for electronic components. Sectional specification: connector sets for optical fibres and cables. Type SC |
|
BSI |
BS QC 790101 |
Harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Sectional specification for semiconductor integrated circuits excluding hybrid circuits. Internal visual examination for semiconductor integrated circuits excluding hybrid circuits |
|
BSI |
BS CECC 22000 |
Harmonized system of quality assessment for electronic components. Generic specification. Radio frequency coaxial connectors (Parts I, II and III) |
|
BSI |
BS EN 187104 |
Harmonized System of Quality Assessment for Electronic Components, Family Specificatio |
|
BSI |
BS EN 187102 |
Harmonized System of Quality Assessment for Electronic Components. Family Specificatio |
|
BSI |
BS EN 186240 |
Harmonized system of quality assessment for electronic components. Sectional specification: connector sets for optical fibres and cables. Type MT |
|
BSI |
BS EN 186310 |
Harmonized system of quality assessment for electronic components. Sectional specification: connector sets for optical fibres and cables. Type MF |
|
BSI |
BS EN 147000 |
Harmonized system of quality assessment for electronic components. Generic specification. Sockets for use with electrical relays of assessed quality |
|
BSI |
BS QC 790131 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Complementary MOS digital integrated circuits (series 4000 B and 4000 UB) |
|
BSI |
BS QC 790202 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Monolithic integrated operational amplifiers |
|
BSI |
BS QC 790130 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. HCMOS digital integrated circuits (series 54/74 HC, 54/74 HCT, 54/74 HCU) |
|
BSI |
BS EN 186300 |
Harmonized system of quality assessment for electronic components. Sectional specification: connector sets for optical fibres and cables type MSC |
|
BSI |
BS CECC 31500 |
Harmonized System of Quality Assessment of Electronic Components. Sectional Specificat |
|
BSI |
BS CECC 90000 |
Harmonized system of quality assessment for electronic components. Generic specification: monolithic integrated circuits |
|
BSI |
BS EN 190000 |
Harmonized system of quality assessment for electronic components. Generic specification: monolithic integrated circuits |
|
BSI |
BS EN 135000 |
Harmonized system of quality assessment for electronic components. Generic specification: travelling wave amplifier tubes |
|
BSI |
BS CECC 16000 |
Harmonized system of quality assessment for electronic components. Generic specification: electromechanical all-or-nothing relays |
|
BSI |
BS EN 111100 |
Harmonized system of quality assessment for electronic components: sectional specification: display storage tubes |
|
BSI |
BS QC 760100 |
Harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Sectional specification for film integrated circuits and hybrid film integrated circuits on the basis of the qualification approval procedures |
|
BSI |
BS QC 790111 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification: integrated circuit static read/write memories |
|
BSI |
BS EN 147100 |
Harmonized system of quality assessment for electronic components. Sectional specification: relay sockets of assessed quality |
|
BSI |
BS EN 168201 |
Harmonized system of quality assessment for electronic components. Blank detail specification. Quartz crystal units. (Qualification approval) |
|
BSI |
BS QC 790303 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Linear digital-to-analogue converters (DAC) |
|
BSI |
BS QC 790304 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Linear analogue-to-digital converters (ADC) |
|
BSI |
BS CECC 68100 |
Harmonized system of quality assessment for electronic components. Sectional specification: quartz crystal units (capability approval) |
|
BSI |
BS EN 168100 |
Harmonized system of quality assessment for electronic components. Sectional specification: quartz crystal units (capability approval) |
|
BSI |
BS EN 116000-1 |
Harmonized system of quality assessment for electronic components. Generic specification: electromechanical all-or-nothing relays. General |
|
BSI |
BS CECC 16000-1 |
Harmonized system of quality assessment for electronic components. Generic specification: electromechanical all-or-nothing relays. General |
|
BSI |
BS EN 125100 |
Harmonized system of quality assessment for electronic components: sectional specification: magnetic oxide cores for inductor applications |
|
BSI |
BS QC 720106 |
Harmonized system of quality assessment for electronic components. Semiconductor devices. Optoelectronic devices. Blank detail specification for avalanche photodiodes (APDs) with/without pigtail, for fibre optic systems or subsystems |
|
BSI |
BS EN 100012 |
Harmonized system of quality assessment for electronic components. Basic specification. X-ray inspection of electronic components |
|
BSI |
BS EN 166000 |
Harmonized system of quality assessment for electronic components. Generic specification. Surface acoustic wave (SAW) filters |
|
BSI |
BS QC 750104 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Bipolar transistors for switching applications |
|
BSI |
BS EN 113001 |
Harmonized system of quality assessment for electronic components. Blank detail specification: camera tubes |
|
BSI |
BS QC 790107 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Digital integrated circuits. Blank detail specification. Integrated circuit dynamic read/write memories |
|
BSI |
BS EN 140200 |
Harmonized system of quality assessment for electronic components. Sectional specification: fixed power resistors |
|
BSI |
BS EN 188100 |
Harmonized system of quality assessment for electronic components. Sectional specification: single-mode (SM) optical fibre |
|
BSI |
BS QC 760200 |
Harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Sectional specification for film integrated circuits and hybrid film integrated circuits on the basis of the capability approval procedures |
|
BSI |
BS QC 760101 |
Harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification for film integrated circuits and hybrid film integrated circuits on the basis of qualification approval procedures |
|
BSI |
BS EN 129100 |
Harmonized system of quality assessment for electronic components. Sectional specification: wirewound surface mounting inductors |
|
BSI |
BS QC 390000 |
Harmonized system of quality assessment for electronic components. Fixed film resistor networks for use in electronic equipment. Generic specification |
|
BSI |
BS QC 750112 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Semiconductor devices. Discrete devices. Field-effect transistors. Blank detail specification for single-gate field-effect transistors, up to 5 W and 1 GHz |
|
BSI |
BS CECC 40300 |
Harmonized system of quality assessment for electronic components: sectional specification: fixed precision resistors |
|
BSI |
BS CECC 45004 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: disc seal power tubes |
|
BSI |
BS EN 186005 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Connector for optical fibres and cables. Environmental category V |
|
BSI |
BS CECC 63100 |
Harmonized system of quality assessment for electronic components: sectional specification: film and hybrid integrated circuits |
|
BSI |
BS EN 168101 |
Harmonized system of quality assessment for electronic components. Blank detail specification: quartz crystal units (capability approval) |
|
BSI |
BS CECC 68101 |
HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS. BLANK DETAIL SPECIFICATION: QUARTZ CRYSTAL UNITS (CAPABILITY APPROVAL) |
|
BSI |
BS EN 186000-1 |
Harmonized system of quality assessment for electronic components. Generic specification. Connector sets for optical fibres and cables. Requirements, test methods and qualification approval procedures |
|
BSI |
BS CECC 42200 |
Harmonized system of quality assessment for electronic components. Sectional specification: surge suppression varistors |
|
BSI |
BS EN 186004 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Connector for optical fibres and cables. Environmental category IV |
|
BSI |
BS EN 186002 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Connector for optical fibres and cables. Environmental category II |
|
BSI |
BS EN 117000 |
Harmonized system of quality assessment for electronic components. Generic specification. Solid state all-or-nothing relays. Generic data and methods of test |
|
BSI |
BS CECC 17000 |
Harmonized System of Quality Assessment for Electronic Components - Generic Specification: Solid State All-or-Nothing Relays. Generic Data and Methods of Test |
|
BSI |
BS EN 170100 |
Harmonized system of quality assessment for electronic components. Sectional specification: Waveguide type dielectric resonators |
|
BSI |
BS EN 120007 |
Harmonized system of quality assessment for electronic components. Blank detail specification. Liquid crystal displays. Monochrome LCDs without electronic circuit |
|
BSI |
BS EN 147101 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: relay sockets of assessed quality |
|
BSI |
BS EN 111001 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: cathode ray tubes |
|
BSI |
BS EN 186003 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Connector for optical fibres and cables. Environmental category III |
|
BSI |
BS EN 186001 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Connectors for optical fibres and cables. Environmental category I |
|
BSI |
BS EN 169100 |
Harmonized system of quality assessment for electronic components. Sectional specification: quartz crystal controlled oscillators (capability approval) |
|
BSI |
BS QC 160000-2 |
Harmonized system of quality assessment for electronic components. Electrical relays. Generic specification: electromechanical all-or-nothing relays. Quality assessment procedures |
|
BSI |
BS QC 760001 |
Harmonized system of quality assessment for electronic components. Film and hybrid integrated circuits. Generic specification. Requirements for internal visual inspection |
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BSI |
BS QC 750102 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Ambient-rated bipolar transistors for low and high-frequency amplification |
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BSI |
BS EN 111101 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Display storage tubes |
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BSI |
BS EN 180101 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: fixed fibre optic attenuators |
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BSI |
BS CECC 22110 |
Harmonized system of quality assessment for electronic components: sectional specification: radio frequency coaxial connectors, series SMA |
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BSI |
BS EN 122140 |
Harmonized system of quality assessment for electronic components. Sectional specification: radio frequency coaxial connectors. Series SMC |
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BSI |
BS EN 122110 |
Harmonized system of quality assessment for electronic components. Sectional specification: radio frequency coaxial connectors. Series SMA |
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BSI |
BS EN 122130 |
Harmonized system of quality assessment for electronic components. Sectional specification: radio frequency coaxial connectors. Series SMB |
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BSI |
BS EN 122170 |
Harmonized system of quality assessment for electronic components. Sectional specification: radio frequency coaxial connectors. Series SSMB |
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BSI |
BS EN 122180 |
Harmonized system of quality assessment for electronic components. Sectional specification. Radio frequency coaxial connectors. Series SSMC |
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BSI |
BS EN 122160 |
Harmonized system of quality assessment for electronic components. Sectional specification: radio frequency coaxial connectors. Series SSMA |
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BSI |
BS QC 760201 |
Harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification for film integrated circuits and hybrid film integrated circuits on the basis of the capability approval procedures |
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BSI |
BS EN 150013 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: current regulator and current reference diodes |
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BSI |
BS EN 122200 |
Harmonized system of quality assessment for electronic components. Sectional specification. Radio frequency coaxial connectors. Series TNC |
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BSI |
BS EN 122120 |
Harmonized system of quality assessment for electronic components. Sectional specification: radio frequency coaxial connectors. Series BNC |
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BSI |
BS QC 750103 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Case-rated bipolar transistors for low-frequency amplification |
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BSI |
BS CECC 46001 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: cold cathode indicator tubes |
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BSI |
BS EN 122340 |
Harmonized system of quality assessment for electronic components. Sectional specification. Radio frequency coaxial connectors. Series MMCX |
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BSI |
BS EN 122190 |
Harmonized system of quality assessment for electronic components. Sectional specification: radio frequency coaxial connectors. Series 7-16 |
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BSI |
BS 166101 |
Harmonized System of Quality Assessment for Electronic Components. Blank Detail Specif |
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BSI |
BS EN 130301 |
Harmonized System of Quality Assessment for Electronic Components, Blank Detail Specif |
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BSI |
BS EN 133221 |
Harmonized System of Quality Assessment for Electronic Components. Blank Detail Specif |
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BSI |
BS EN 169201 |
Harmonized System of Quality Assessment for Electronic Components. Blank Detail Specif |
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BSI |
BS EN 138101 |
Harmonized System of Quality Assessment for Electronic Components. Blank Detail Specif |
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BSI |
BS EN 167101 |
Harmonized System of Quality Assessment for Electronic Components. Blank Detail Specif |
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BSI |
BS EN 150011 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: case-rated thyristors |
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BSI |
BS EN 134100 |
Harmonized system of quality assessment for electronic components. Sectional specification: variable capacitors (Qualification approval) |
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BSI |
BS EN 187103 |
Harmonized system of quality assessment for electronic components. Family specification. Optical fibre cables for indoor applications |
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BSI |
BS EN 122002 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: radio frequency coaxial connectors |
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BSI |
BS EN 112001 |
Harmonized system of quality assessment for electronic components. Blank detail specification: image converter and image intensifier tubes |
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BSI |
BS CECC 31600 |
Harmonized system of quality assessment for electronic components: sectional specification. Fixed capacitors with paper and paper/plastics dielectrics |
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BSI |
BS CECC 22121 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: radio frequency coaxial connectors, series BNC |
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BSI |
BS EN 120008 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: light emitting diodes and infrared emitting diodes for fibre optic system or sub-system |
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BSI |
BS EN 123300 |
Specification for harmonized system of quality assessment for electronic components. Sectional specification. Multilayer printed boards |
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BSI |
BS EN 150010 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: ambient rated thyristors |
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BSI |
BS CECC 40301 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Fixed precision resistors |
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BSI |
BS CECC 96200 |
Harmonized system of quality assessment for electronic components. Sectional specification including blank detail specification: lever switches |
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BSI |
BS CECC 63101 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: film and hybrid integrated circuits |
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BSI |
BS EN 131801 |
Harmonized System of Quality Assessment for Electronic Components |
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BSI |
BS EN 130900 |
Harmonized System of Quality Assessment for Electronic Components. |
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BSI |
BS EN 130901 |
Harmonized System of Quality Assessment for Electronic Components |
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BSI |
BS EN 130902 |
Harmonized System of Quality Assessment for Electronic Components. |
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BSI |
BS EN 130100 |
Harmonized System of Quality Assessment for Electronic Components. |
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BSI |
BS EN 130101 |
Harmonized System of Quality Assessment for Electronic Components |
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BSI |
BS EN 130102 |
Harmonized System of Quality Assessment for Electronic Components |
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BSI |
BS EN 169101 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: quartz crystal controlled oscillators (capability approval) |
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BSI |
BS EN 196103 |
Harmonized System of Quality Assessment for Electronic Components - Blank Detail Speci |
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BSI |
BS QC 750114 |
Harmonized system of quality assessment for electronic components. Semiconductor devices. Discrete devices. Field-effect transistors. Blank detail specification for case-rated field-effect transistors for switching applications |
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BSI |
BS CECC 41400 |
Harmonized system of quality assessment for electronic components: sectional specification: rotary precision potentiometers |
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BSI |
BS EN 114001 |
Harmonized system of quality assessment for electronic components. Blank detail specification: photomultiplier tubes |
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BSI |
BS QC 160100 |
Harmonized system of quality assessment for electronic components. Electrical relays. Sectional specification: electromechanical all-or-nothing relays |
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BSI |
BS EN 150009 |
Harmonized system of quality assessment for electronic components. Blank detail specification: case-rated rectifier diodes |
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BSI |
BS CECC 42201 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Surge suppression varistors |
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BSI |
BS CECC 50009 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: case-rated rectifier diodes |
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BSI |
BS EN 190100 |
Harmonized system of quality assessment for electronic components: sectional specification: digital monolithic integrated circuits |
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BSI |
BS 9925-01.01 |
Harmonized system of quality assessment for electronic components. Inductor and transformer cores for telecommunications. Sectional specification: magnetic oxide cores for inductor applications |
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BSI |
BS 9925-01.0 |
Harmonized system of quality assessment for electronic components. Inductor and transformer cores for telecommunications. Sectional specification: magnetic oxide cores for inductor applications |
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BSI |
BS EN 116000-3 |
Harmonized system of quality assessment for electronic components. Generic specification: electromechanical all-or-nothing relays. Test and measurement procedures |
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BSI |
BS QC 750107 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Case-rated bipolar transistors for high-frequency amplifications |
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BSI |
BS QC 750110 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Reverse blocking triode thyristors, ambient and case-rated, up to 100 A |
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BSI |
BS CECC 00806 |
Harmonized System of Quality Assessment for Electronic Components. Guide To Total Qual |
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BSI |
BS CECC 16100 |
Harmonized system of quality assessment for electronic components. Sectional specification: electromechanical all-or-nothing relays |
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BSI |
BS CECC 16200 |
HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - SECTIONAL SPECIFICATION: ELECTROMECHANICAL ALL-OR-NOTHING RELAYS |
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BSI |
BS CECC 25300 |
Harmonized system of quality assessment for electronic components: sectional specification: magnetic oxide cores for power applications |
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BSI |
BS CECC 50008 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: ambient-rated rectifier diodes |
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BSI |
BS EN 150008 |
Harmonized system of quality assessment for electronic components. Blank detail specification: ambient-rated rectifier diodes |
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BSI |
BS CECC 90202 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: integrated operational amplifiers |
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BSI |
BS QC 400200 |
Harmonized system of quality assessment for electronic components. Fixed resistors for use in electronic equipment. Sectional specification: fixed power resistors |
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BSI |
BS EN 125200 |
Harmonized system of quality assessment for electronic components: sectional specification: magnetic oxide cores for linear transformers |
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BSI |
BS CECC 00808 |
Harmonized system of quality assessment for electronic components. Guidance document: use and application of plastic encapsulated devices |
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BSI |
BS EN 122150 |
Harmonized system of quality assessment for electronic components. Sectional specification: radio frequency coaxial connectors. Series EIA Flange |
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BSI |
BS QC 160000-1 |
Harmonized system of quality assessment for electronic components. Electrical relays. Generic specification: electromechanical all-or-nothing relays. Test and measurement procedures |
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BSI |
BS QC 750106 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Field-effect transistors for case-rated power amplifier applications |
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BSI |
BS QC 750108 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Rectifier diodes (including avalanche rectifier diodes), ambient and case-rated, up to 100 A |
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BSI |
BS EN 186290 |
Harmonized system of quality assessment for electronic components. Connector sets for optical fibres and cables. Type MPO |
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BSI |
BS CECC 41201 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: power potentiometers (assessment level S) |
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BSI |
BS EN 190116 |
Harmonized system of quality assessment for electronic components. Family specification: AC MOS digital integrated circuits |
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BSI |
BS EN 140203 |
Harmonized system of quality assessment for electronic components. Blank detail specification: fixed power resistors (Assessment level H) |
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BSI |
BS 9940-03.0 |
Harmonized system of quality assessment for electronic components. Fixed resistors for use in electronic equipment. Sectional specification: fixed precision resistors |
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BSI |
BS EN 140201 |
Harmonized system of quality assessment for electronic components. Blank detail specification: fixed power resistors (Assessment level S) |
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BSI |
BS EN 188201 |
Harmonized system of quality assessment for electronic components. Family specification: A1a graded index multimode optical fibres |
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BSI |
BS EN 188202 |
Harmonized system of quality assessment for electronic components. Family specification: A1b graded index multimode optical fibres |
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BSI |
BS CECC 17001 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Mercury wetted make contact units for general application |
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BSI |
BS CECC 90104 |
Specification for harmonized system of quality assessment for electronic components. Family specification: C. MOS digital integrated circuits series 4000 B and 4000 UB |
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BSI |
BS QC 790105 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Integrated circuit fusible-link programmable bipolar read-only memories |
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