BSI |
BS 9925-03.01 |
Harmonized system of quality assessment for electronic components. Inductor and transformer cores for telecommunications. Blank detail specification: magnetic oxide cores for transformers and chokes for power applications. Assessment level A |
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BSI |
BS 9925-03.0 |
Harmonized system of quality assessment for electronic components. Inductor and transformer cores for telecommunications. Sectional specification: Magnetic oxide cores for transformers and chokes for power applications |
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BSI |
BS 9925-01.01 |
Harmonized system of quality assessment for electronic components. Inductor and transformer cores for telecommunications. Sectional specification: magnetic oxide cores for inductor applications |
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BSI |
BS 9925-01.0 |
Harmonized system of quality assessment for electronic components. Inductor and transformer cores for telecommunications. Sectional specification: magnetic oxide cores for inductor applications |
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BSI |
BS 9925-02.0 |
Harmonized system of quality assessment for electronic components. Inductor and transformer cores for telecommunications. Sectional specification: magnetic oxide cores for broad-band transformers |
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BSI |
BS EN 125401 |
Harmonized system of quality assessment for electronic components. Blank detail specification. Adjusters used with magnetic oxide (ferrite) cores for use in inductors and tuned transformers |
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BSI |
BS 9925-0 |
Harmonized system of quality assessment for electronic components. Inductor and transformer cores for telecommunications. Generic specification |
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BSI |
BS EN 125100 |
Harmonized system of quality assessment for electronic components: sectional specification: magnetic oxide cores for inductor applications |
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BSI |
BS CECC 25300 |
Harmonized system of quality assessment for electronic components: sectional specification: magnetic oxide cores for power applications |
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BSI |
BS EN 125500 |
Harmonized system of quality assessment for electronic components. Sectional specification: magnetic oxide ring cores for interference suppression and low level signal transformer applications |
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BSI |
BS EN 125400 |
Harmonized system of quality assessment for electronic components: sectional specification: adjusters used with magnetic oxide cores for use in inductors and tuned transformers |
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BSI |
BS EN 125200 |
Harmonized system of quality assessment for electronic components: sectional specification: magnetic oxide cores for linear transformers |
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BSI |
BS CECC 41202 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: power potentiometers (assessment level M) |
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BSI |
BS EN 140202 |
Harmonized system of quality assessment for electronic components. Blank detail specification: fixed power resistors (Assessment level M) |
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BSI |
BS CECC 41201 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: power potentiometers (assessment level S) |
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BSI |
BS EN 140201 |
Harmonized system of quality assessment for electronic components. Blank detail specification: fixed power resistors (Assessment level S) |
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BSI |
BS EN 140203 |
Harmonized system of quality assessment for electronic components. Blank detail specification: fixed power resistors (Assessment level H) |
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BSI |
BS QC 400202 |
Specification for harmonized system of quality assessment for electronic components. Fixed resistors for use in electronic equipment. Blank detail specification. Fixed power resistors. Assessment level F |
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BSI |
BS QC 400201 |
Specification for harmonized system of quality assessment for electronic components. Fixed resistors for use in electronic equipment. Blank detail specification: fixed power resistors. Assessment level E |
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BSI |
BS CECC 41102 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: preset potentiometers (assessment level M) |
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BSI |
BS EN 136002 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: CW magnetrons for RF heating or cooking applications |
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BSI |
BS EN 129102 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: wirewound surface mounting inductors of assessed quality. Assessment level P |
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BSI |
BS EN 129202 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: wirebound inductors with ceramic or ferrite core. Assessment level P |
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BSI |
BS CECC 41101 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: preset potentiometers (assessment level S) |
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BSI |
BS EN 129101 |
Harmonized system of quality assessment for electronic components. Blank detail specification: wirewound surface mounting inductors of assessed quality. Assessment level E |
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BSI |
BS EN 150004 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: bipolar transistors for switching applications |
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BSI |
BS EN 140102 |
Harmonized system of quality assessment for electronic components. Blank detail specification: fixed low power non-wirewound resistors (assessment level M) |
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BSI |
BS EN 129201 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: wirewound inductors with ceramic or ferrite core. Assessment level E |
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BSI |
BS CECC 45004 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: disc seal power tubes |
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BSI |
BS EN 140103 |
Harmonized system of quality assessment for electronic components. Blank detail specification. Fixed low power non-wirewound resistors (Assessment level P) |
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BSI |
BS CECC 42101 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: low voltage varistors primarily for telephony applications (assessment level P) |
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BSI |
BS CECC 40302 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: fixed precision resistors (Assessment level F) |
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BSI |
BS CECC 41302 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: low power single turn rotary potentiometers (assessment level M) |
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BSI |
BS EN 140104 |
Harmonized system of quality assessment for electronic components. Blank detail specification: fixed low power non-wirewound resistors (Assessment levels SB and SC) |
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BSI |
BS CECC 46001 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: cold cathode indicator tubes |
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BSI |
BS CECC 90301 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: integrated line transmitters and receivers |
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BSI |
BS CECC 41301 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: low power single turn rotary potentiometers (assessment level S) |
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BSI |
BS EN 120006 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: pin-photodiodes for fibre optic applications |
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BSI |
BS QC 750106 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Field-effect transistors for case-rated power amplifier applications |
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BSI |
BS EN 113001 |
Harmonized system of quality assessment for electronic components. Blank detail specification: camera tubes |
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BSI |
BS EN 140211 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: fixed power resistors. Capability approval |
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BSI |
BS QC 400102 |
Specification for harmonized system of quality assessment for electronic components. Fixed resistors for use in electronic equipment. Blank detail specification. Fixed low-power non-wirewound resistors. Assessment level F |
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BSI |
BS 9940-01.01 |
Harmonized system of quality assessment for electronic components. Fixed resistors for use in electronic equipment. Blank detail specification: fixed low power non-wirewound resistors. Assessment level E |
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BSI |
BS QC 750104 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Bipolar transistors for switching applications |
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BSI |
BS EN 112001 |
Harmonized system of quality assessment for electronic components. Blank detail specification: image converter and image intensifier tubes |
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BSI |
BS QC 410204 |
Specification for harmonized system of quality assessment for electronic components. Potentiometers for use in electronic equipment. Blank detail specification: single-turn rotary power potentiometers. Assessment level F |
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BSI |
BS QC 410203 |
Specification for harmonized system of quality assessment for electronic components. Potentiometers for use in electronic equipment. Blank detail specification: single-turn rotary power potentiometers. Assessment level E |
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BSI |
BS 9940-03.01 |
Harmonized system of quality assessment for electronic components. Fixed resistors for use in electronic equipment. Blank detail specification: fixed precision resistors. Assessment level E |
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BSI |
BS QC 400302 |
Specification for harmonized system of quality assessment for electronic components. Fixed resistors for use in electronic equipment. Blank detail specification. Fixed precision resistors. Assessment level F |
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BSI |
BS EN 196403 |
Harmonized systems of quality assessment for electronic components. Blank detail specification: push button switches. Assessment level Y |
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BSI |
BS CECC 96200 |
Harmonized system of quality assessment for electronic components. Sectional specification including blank detail specification: lever switches |
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BSI |
BS EN 111001 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: cathode ray tubes |
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BSI |
BS EN 114001 |
Harmonized system of quality assessment for electronic components. Blank detail specification: photomultiplier tubes |
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BSI |
BS QC 410301 |
Specification for harmonized system of quality assessment for electronic components. Potentiometers for use in electronic equipment. Blank detail specification: single-turn rotary low-power potentiometers. Assessment level E |
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BSI |
BS QC 410302 |
Specification for harmonized system of quality assessment for electronic components. Potentiometers for use in electronic equipment. Blank detail specification: single-turn rotary low-power potentiometers. Assessment level F |
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BSI |
BS EN 120005 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Photodiodes, photodiode-arrays (not intended for fibre optic applications) |
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BSI |
BS CECC 40301 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Fixed precision resistors |
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BSI |
BS EN 134104 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: compression type trimmer capacitors (qualification approval) |
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BSI |
BS QC 410402 |
Specification for harmonized system of quality assessment for electronic components. Potentiometers for use in electronic equipment. Blank detail specification: rotary precision potentiometers. Assessment level E |
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BSI |
BS EN 111101 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Display storage tubes |
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BSI |
BS EN 150011 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: case-rated thyristors |
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BSI |
BS CECC 90202 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: integrated operational amplifiers |
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BSI |
BS EN 181104 |
Harmonized system of quality assessment for electronic components. Blank detail specification: fibre optic branching devices. Type: wavelength selective transmissive star for telecommunication application |
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BSI |
BS EN 120003 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Phototransistors, photodarlington transistors, phototransistor arrays |
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BSI |
BS EN 136001 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: pulsed magnetrons (excluding frequency agile magnetrons) |
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BSI |
BS EN 135001 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: CW power amplifier travelling wave tubes up to 500 watts |
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BSI |
BS EN 150010 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: ambient rated thyristors |
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BSI |
BS EN 150012 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: single gate field-effect transistors |
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BSI |
BS CECC 41401 |
Specification for harmonized system of quality assessment for electronic conponents. Blank detail specification: rotary precision potentiometers (assessment level S) |
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BSI |
BS EN 147101 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: relay sockets of assessed quality |
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BSI |
BS CECC 42201 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Surge suppression varistors |
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BSI |
BS CECC 90302 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: integrated voltage comparators |
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BSI |
BS EN 150001 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: general purpose semiconductor diodes |
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BSI |
BS QC 420101 |
SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS. VARISTORS FOR USE IN ELECTRONIC EQUIPMENT BLANK DETAIL SPECIFICATION SILICON CARBIDE SURGE SUPPRESSION VARISTORS ASSESSMENT LEVEL E |
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BSI |
BS EN 181103 |
Harmonized system of quality assessment for electronic components. Blank detail specification: fibre optic branching devices. Type: non wavelength selective transmissive star for telecommunication application |
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BSI |
BS EN 168201 |
Harmonized system of quality assessment for electronic components. Blank detail specification. Quartz crystal units. (Qualification approval) |
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BSI |
BS EN 180101 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: fixed fibre optic attenuators |
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BSI |
BS CECC 75101 |
Specification for harmonized system of quality assessment for electronic components. Example detail specification/blank detail specification. Two-part and edge socket connectors for printed board application |
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BSI |
BS EN 150013 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: current regulator and current reference diodes |
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BSI |
BS CECC 63101 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: film and hybrid integrated circuits |
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BSI |
BS CECC 17001 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Mercury wetted make contact units for general application |
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BSI |
BS EN 186001 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Connectors for optical fibres and cables. Environmental category I |
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BSI |
BS CECC 51001 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: mercury wetted change-over contact units, magnetically biased |
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BSI |
BS QC 750114 |
Harmonized system of quality assessment for electronic components. Semiconductor devices. Discrete devices. Field-effect transistors. Blank detail specification for case-rated field-effect transistors for switching applications |
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BSI |
BS EN 150009 |
Harmonized system of quality assessment for electronic components. Blank detail specification: case-rated rectifier diodes |
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BSI |
BS CECC 50009 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: case-rated rectifier diodes |
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BSI |
BS EN 150014 |
Harmonized system of quality assessment for electronic components. Blank detail specification: Thyristor diodes, transient overvoltage suppressors |
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BSI |
BS QC 960201 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: electromechanical switches for use in electronic equipment. Blank detail specification for lever (toggle) switches |
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BSI |
BS EN 141101 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Lead-screw actuated and rotary preset potentiometers |
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BSI |
BS EN 140402 |
Harmonized system of quality assessment for electronic components. Blank detail specification: fixed low power wire wound surface mounting (SMD) resistors |
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BSI |
BS QC 301901 |
Specification for harmonized system of quality assessment for electronic components. Fixed capacitors for use in electronic equipment. Blank detail specification. Fixed multilayer ceramic chip capacitors. Assessment level E |
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BSI |
BS QC 410102 |
Specification for harmonized system of quality assessment for electronic components. Potentiometers for use in electronic equipment. Blank detail specification: lead-screw actuated and rotary preset potentiometers. Assessment level F |
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BSI |
BS EN 138101 |
Harmonized System of Quality Assessment for Electronic Components. Blank Detail Specif |
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BSI |
BS EN 130301 |
Harmonized System of Quality Assessment for Electronic Components, Blank Detail Specif |
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BSI |
BS EN 167101 |
Harmonized System of Quality Assessment for Electronic Components. Blank Detail Specif |
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BSI |
BS EN 169201 |
Harmonized System of Quality Assessment for Electronic Components. Blank Detail Specif |
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BSI |
BS 166101 |
Harmonized System of Quality Assessment for Electronic Components. Blank Detail Specif |
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BSI |
BS EN 133221 |
Harmonized System of Quality Assessment for Electronic Components. Blank Detail Specif |
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BSI |
BS CECC 50008 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: ambient-rated rectifier diodes |
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BSI |
BS EN 150008 |
Harmonized system of quality assessment for electronic components. Blank detail specification: ambient-rated rectifier diodes |
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BSI |
BS CECC 90201 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: integrated voltage regulators |
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BSI |
BS EN 120002 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: infrared emitting diodes, infrared emitting diode arrays |
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BSI |
BS EN 134101 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: single turn disc trimmer capacitors (qualification approval) |
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BSI |
BS EN 186002 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Connector for optical fibres and cables. Environmental category II |
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BSI |
BS EN 186004 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Connector for optical fibres and cables. Environmental category IV |
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