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ASTM F632-90

Current Revision

Test Method for Measuring Small-Signal Comon Emitter Current Gain of Transistors at High Frequencies (Withdrawn 1995)

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SDO ASTM: ASTM International
Document Number F632
Publication Date Not Available
Language en - English
Page Count 6
Revision Level 90
Supercedes
Committee F01.11
Publish Date Document Id Type View
Not Available F0632-90 Revision