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ASTM F1996-14

Current Revision

Standard Test Method for Silver Migration for Membrane Switch Circuitry (Withdrawn 2023)

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1.1 This test method is used to determine the susceptibility of a membrane switch to the migration of the silver between circuit traces under dc voltage potential.

1.2 Silver migration will occur when special conditions of moisture and electrical energy are present.


4.1 The effects of silver migration are short circuiting or reduction in insulation resistance. It is evidenced by staining or dicoloration between the cathode and anode conductive traces.

4.2 Accelerated testing may be accomplished by increasing the voltage over the specified voltages. (A typical starting point would be 5Vdc 50mA).

SDO ASTM: ASTM International
Document Number F1996
Publication Date Oct. 1, 2014
Language en - English
Page Count 3
Revision Level 14
Supercedes
Committee F01.18
Publish Date Document Id Type View
Oct. 1, 2014 F1996-14 Revision
July 1, 2006 F1996-06 Revision
June 10, 2001 F1996-01 Revision
June 10, 2001 F1996-00 Revision