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ASTM F143-73(1978)

Current Revision

Method of Test for Thickness of Epitaxial Layers of Silicon by Measurement of Stacking Fault Dimension (Withdrawn 1985)


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SDO ASTM: ASTM International
Document Number F143
Publication Date Not Available
Language en - English
Page Count
Revision Level 73(1978)
Supercedes
Committee .
Publish Date Document Id Type View
Not Available F0143-73R78 Revision