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ASTM E431-96(2011)

Historical Reaffirmation

Standard Guide to Interpretation of Radiographs of Semiconductors and Related Devices

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1.1 This guide provides illustrations of radiographs of semiconductors and related devices. Low powered transistors (through the TO-11 case configuration), diodes, low-power rectifiers, power devices, and integrated circuits are illustrated with common assembly features. Particular areas of construction are featured for these devices detailing critical points of design or assembly.

1.2 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Illustrations provided in this guide are intended for use as references to aid in interpreting film or nonfilm images resulting from x-ray examinations (see Table 1) to ascertain quality of assembly and workmanship.

Required attributes of the design features or other construction details are not provided but are to be established as mutually agreed upon by manufacturers and users of these devices. Many devices share common assembly features; thus, these interpretations can be used for components not illustrated.

SDO ASTM: ASTM International
Document Number E431
Publication Date Dec. 1, 2011
Language en - English
Page Count 7
Revision Level 96(2011)
Supercedes
Committee E07.02
Publish Date Document Id Type View
Dec. 10, 1996 E0431-96 Revision
Oct. 1, 2022 E0431-96R22 Reaffirmation
June 1, 2016 E0431-96R16 Reaffirmation
Dec. 1, 2011 E0431-96R11 Reaffirmation
July 1, 2007 E0431-96R07 Reaffirmation
Dec. 10, 1996 E0431-96R02 Reaffirmation