1.1 This test method covers the analysis of Ni-base alloys by wavelength dispersive X-ray Fluorescence Spectrometry for the determination of the following elements:
This procedure is suitable for manufacturing control and for verifying that the product meets specifications. It provides rapid, multi-element determinations with sufficient accuracy to assure product quality. The analytical performance data included may be used as a benchmark to determine if similar X-ray spectrometers provide equivalent precision and accuracy, or if the performance of a particular spectrometer has changed.
SDO | ASTM: ASTM International |
Document Number | E2465 |
Publication Date | May 1, 2011 |
Language | en - English |
Page Count | 11 |
Revision Level | 11e1 |
Supercedes | |
Committee | E01.08 |