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ASTM E2465-24

Current Revision

Standard Test Method for Analysis of Ni-Base Alloys by Wavelength Dispersive X-Ray Fluorescence Spectrometry

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1.1 This test method covers the analysis of Ni-base alloys by wavelength dispersive X-ray Fluorescence Spectrometry for the determination of the following elements:

Element

Composition Range

Manganese

0.06 % to 1.6 %

Phosphorus

0.008 % to 0.015 %

Silicon

0.08 % to 0.6 %

Chromium

1.6 % to 22 %

Nickel

23 % to 77 %

Aluminum

0.20 % to 1.3 %

Molybdenum

0.03 % to 10 %

Copper

0.007 % to 2.5 %

Titanium

0.11 % to 3.0 %

Niobium

0.55 % to 5.3 %

Iron

0.17 % to 46 %

Tungsten

0.06 % to 0.50 %

Cobalt

0.04 % to 0.35 %

Note 1: Unless exceptions are noted, ranges can be extended by the use 2 of suitable reference materials. Once these element ranges are extended they must be verified by some experimental means. This could include but not limited to Gage Repeatability and Reproducibility studies, Interlaboratory Round Robin studies, or both. Once these studies are completed, they will satisfy the ISO/IEC 17025 requirements for capability.

1.2 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.

1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use.

1.4 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.


5.1 This procedure is suitable for manufacturing control and for verifying that the product meets specifications. It provides rapid, multi-element determinations with sufficient accuracy to assure product quality. The analytical performance data included may be used as a benchmark to determine if similar X-ray spectrometers provide equivalent precision and accuracy, or if the performance of a particular spectrometer has changed.

SDO ASTM: ASTM International
Document Number E2465
Publication Date Nov. 15, 2024
Language en - English
Page Count 11
Revision Level 24
Supercedes
Committee E01.08
Publish Date Document Id Type View
Nov. 15, 2024 E2465-24 Revision
Nov. 1, 2023 E2465-23 Revision
Oct. 1, 2019 E2465-19 Revision
June 1, 2013 E2465-13 Revision
May 1, 2011 E2465-11E01 Revision
May 1, 2011 E2465-11 Revision
May 15, 2006 E2465-06 Revision