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ASTM E2444-11(2018)

Current Reaffirmation

Terminology Relating to Measurements Taken on Thin, Reflecting Films

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1.1 This standard consists of terms and definitions pertaining to measurements taken on thin, reflecting films, such as found in microelectromechanical systems (MEMS) materials. In particular, the terms are related to the standards in Section 2, which were generated by Committee E08 on Fatigue and Fracture. Terminology E1823 Relating to Fatigue and Fracture Testing is applicable to this standard.

1.2 The terms are listed in alphabetical order.

1.3 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.


SDO ASTM: ASTM International
Document Number E2444
Publication Date May 1, 2018
Language en - English
Page Count 2
Revision Level 11(2018)
Supercedes
Committee E08.02
Publish Date Document Id Type View
Oct. 15, 2011 E2444-11E01 Revision
Oct. 15, 2011 E2444-11 Revision
May 1, 2005 E2444-05E01 Revision
May 1, 2005 E2444-05 Revision
May 1, 2018 E2444-11R18 Reaffirmation