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ASTM E1855-05

Historical Revision

Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors

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1.1 This test method covers the use of 2N2222A silicon bipolar transistors as dosimetry sensors in the determination of neutron energy spectra, and as silicon 1-MeV equivalent displacement damage fluence monitors.

1.2 The neutron displacement damage is especially valuable as a spectrum sensor in the range 0.1 to 2.0 MeV when fission foils are not available. It has been applied in the fluence range between 2 10 12 n/cm2 and 1 1014 n/cm2 and should be useful up to 1015 n/cm2. This test method details the steps for the acquisition and use of silicon 1-MeV equivalent fluence information (in a manner similar to the use of activation foil data) for the determination of neutron spectra.

1.3 In addition, this sensor can provide important confirmation of neutron spectra determined with other sensors, and yields a direct measurement of the silicon 1-MeV fluence by the transfer technique.

1.4 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory requirements prior to use.


SDO ASTM: ASTM International
Document Number E1855
Publication Date July 1, 2005
Language en - English
Page Count 10
Revision Level 05
Supercedes
Committee E10.07
Publish Date Document Id Type View
Feb. 1, 2020 E1855-20 Revision
Oct. 1, 2015 E1855-15 Revision
Oct. 1, 2010 E1855-10 Revision
July 1, 2005 E1855-05E01 Revision
July 1, 2005 E1855-05 Revision
June 1, 2004 E1855-04E01 Revision
June 1, 2004 E1855-04 Revision
Dec. 10, 1996 E1855-96 Revision