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ASTM E1523-97

Historical Revision

Standard Guide to Charge Control and Charge Referencing Techniques in X-Ray Photoelectron Spectroscopy (Withdrawn 2024)

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1.1 This guide covers the acquainting of the XPS user with the various charge control and charge shift referencing techniques that are and have been used in the acquisition and interpretation of X-ray photoelectron spectroscopy (XPS) data from surfaces of insulating specimens.

1.2 This guide is intended to apply to charge control and charge referencing techniques in XPS and is not necessarily applicable to electron-excited systems.

1.3 SI units are standard unless otherwise noted.

1.4 This standard does not purport to address all of the safety problems, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.


SDO ASTM: ASTM International
Document Number E1523
Publication Date Sept. 10, 1997
Language en - English
Page Count 4
Revision Level 97
Supercedes
Committee E42.03
Publish Date Document Id Type View
Oct. 1, 2024 E1523-24 Revision
June 1, 2015 E1523-15 Revision
May 1, 2009 E1523-09 Revision
May 10, 2003 E1523-03 Revision
Sept. 10, 1997 E1523-97 Revision